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US4968947A
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Apparatus for the non-destructive measurement of the ohmic resistance of thin layers
Assignee: Balzers und Leybold Deutschland Holding AG
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Filing: 1989-04-27
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Granted: 1990-11-06
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Expires: 2009-04-27
Abstract
Abstract The invention concerns apparatus for the non-destructive measurement of the ohmic resistance of thin layers. The apparatus is based on a capacitative measurement process wherein the plates of a capacitor are formed by an electrode (3) with the thin layer (6) to be measured, the dielectric of the capacitor being constituted by a carrier foil (5) on which the thin layer (6) is carried, for instance by means of a vacuum-depositing process. The electrode (3) is supplied via an oscillator with high-frequency voltage (U HF ) so that a displacement current flows from the electrode (3) over the carrier foil (5) to the thin layer (6) and from there back again. This displacement current is composed of an ohmic part and a capacitive part. In order to maintain the capacitative part constant even for fluctuating capacitances, caused e.g. by changes in the thickness of the carrier foil (5), an additional capacitor is connected in a regulated manner to the capacitor that is present.
Inventors
- 👤 Gernot Thorn
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 19:06
CPC Classifications
G; G01; G01R; G01R27/00; G01R27/02
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
125 words
An apparatus for non-destructive measurement of the ohmic resistance of thin layers comprising: an electrode (3) being connected to a constant high frequency alternating voltage (U HF ); a thin layer (6) the ohmic resistance of which is to be measured, said layer having a predetermined distance to said electrode (3); an element (2) having a predetermined distance to said layer (6) and being electrically separated from said electrode (3), said element (2) being connected such that a current (I HF ) can flow from said electrode (3) via said layer (6) to said element (2); and non-ohmic resistances being controllably connected to the pathway of the current (I HF ) so as to eliminate the influence of non-ohmic resistances on a predetermined non-ohmic resistance.
Claim 2
Independent Claim
125 words
An apparatus for non-destructive measurement of the ohmic resistance of thin layers comprising: an electrode (3) being connected to a constant high frequency alternating voltage (U HF ); a thin layer (6) the ohmic resistance of which is to be measured, said layer having a predetermined distance to said electrode (3); an element (2) having a predetermined distance to said layer (6) and being electrically separated from said electrode (3), said element (2) being connected such that a current (I HF ) can flow from said electrode (3) via said layer (6) to said element (2); and non-ohmic resistances being controllably connected to the pathway of the current (I HF ) so as to eliminate the influence of non-ohmic resistances on a predetermined non-ohmic resistance.
Claim 3
Dependent Claim
20 words
Apparatus according to claim 1, characterised in that the alternating voltage (U HF ) has a frequency of 2 MHz.
Claim 4
Dependent Claim
25 words
Apparatus according to claim 1, characterised in that a carrier foil (5) is disposed between the layer (6) to be measured and the electrode (3).
Claim 5
Dependent Claim
24 words
Apparatus according to claim 1, characterised in that the sensor is built into a strip guiding roller (2) of a strip vapour coating apparatus.
Claim 6
Dependent Claim
30 words
Apparatus according to claim 4, characterised in that the output current of the sensor is picked off by slip rings (33, 34, 35) and passed to an analysing device (36).
Claim 7
Dependent Claim
35 words
Apparatus according to claim 1, characterised in that position detectors (20, 21) are provided to determine whether a thin layer (6) to be measured is in the proximity of the electrode (3) of the sensor.
Claim 8
Dependent Claim
16 words
Apparatus according to claim 6, characterised in that the position detector is a reflecting light barrier.
Claim 9
Dependent Claim
15 words
Apparatus according to claim 6, characterised in that the position detector is a proximity switch.
Claim 10
Dependent Claim
15 words
Apparatus according to claim 1, characterised in that measurement signals and zero signals are detected.
Claim 11
Dependent Claim
20 words
Apparatus according to claim 9, characterised in that the difference between the measurement signal and the zero signal is formed.
Claim 12
Dependent Claim
41 words
Apparatus according to claim 10, characterised in that several sensors are arranged over the width of the roller (2) and the signals of these sensors are evaluated to determine the cross-sectional profile of the conductivity of the layer to be measured.
Claim 13
Dependent Claim
35 words
Apparatus according to claim 11, characterised in that the mean value of the output signal of the sensors is formed and compared with a desired value and that regulation to this desired value takes place.
Claim 14
Dependent Claim
16 words
Apparatus according to claim 1, characterised in that the arrangement has a phase shift circuit (57).
Claim 15
Dependent Claim
32 words
Apparatus according to claim 13, characterised in that the phase shift circuit has a 90° phase-shifter, a preamplifier (200) a rectifier-transformer (142) a two-stage amplifier (201) and a variable capacitance diode (143).
Claim 16
Dependent Claim
39 words
Apparatus according to claim 13, characterised in that the phase shift circuit is also us for the resonance tuning of an oscillating circuit containing an inductor provided for the inductive detection of the surface resistance of a thin layer.
Claim 17
Dependent Claim
44 words
Apparatus according to claim 1, characterised in that when using several sensors each sensor has its own oscillator (51), its own initial processing electronics, its own step-wise remotely controllable amplifier (58) and its own remotely controllable calibrating device with at least one calibrating resistance.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-11-05 | 1994-05-07 | 1994-11-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-11-05 | 1998-05-07 | 1998-11-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-11-05 | 2002-05-07 | 2002-11-06 | $7700.00 | Window Closed / Lapsed |