US4963502A
Expired / Lapsed
US
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Method of making oxide-isolated source/drain transistor
Assignee: Texas Instruments Inc
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Filing: 1989-10-03
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Granted: 1990-10-16
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Expires: 2009-10-03
Abstract
Abstract A MOS bulk device having source/drain-contact regions 36 which are almost completely isolated by a dielectric 35. These "source/drain" regions 36 are formed by using a silicon etch to form a recess, lining the etched recess with oxide, and backfilling with polysilicon. A short isotropic oxide etch, followed by a polysilicon filament deposition, then makes contact between the oxide-isolated source/drain-contact regions 36 and the channel region 33 of the active device. Outdiffusion through the small area of this contact will form small diffusions 44 in silicon, which act as the electrically effective source/drain regions. Use of sidewall nitride filaments 30 on the gate permits the silicon etch step to be self-aligned.
Inventors
- 👤 Clarence W. Teng
- 👤 Thomas E. Tang
- 👤 Che-Chia Wei
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 19:36
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/10; H10D62/13; H10D62/149; H10D62/151; H10D62/01; H10D62/021; H10D62/102; H10D62/112; H10D62/113; H10D62/115; H10D62/116; H10D64/00; H10D64/01; H10D64/011; H10D64/0111; H10D64/0113; H10D84/00; H10D84/01; H10D84/0123; H10D84/0126; H10D84/0165; H10D84/017; H10D84/0188; H10D84/02; H10D84/03; H10D84/038; H10D84/80; H10D84/82; H10D84/83; H10D84/85; H10D84/854; H10D84/859
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
206 words
A process for fabricating integrated circuits, comprising the steps of: (a) providing a substrate having a monocrystalline upper portion: (b) providing field isolation regions in predetermined locations in monocrystalline upper portion to define active device locations therebetween: (c) forming insulated gate lines over predetermined locations including predetermined portions of said active device areas, said insulated gate lines defining transistor channels in portions of said active device areas: (d) forming sidewall filaments on said gate lines: (e) etching, to approximately a predetermined depth, areas of said monocrystalline upper portion of said silicon that are not covered by said gate lines, by said field isolation, nor by said sidewall filaments on said gate lines, to form a source/drain-contact recess: (f) forming a dielectric conformally on bottoms and sidewalls of said recess: (g) filling said source/drain-contact recesses with a conductive material: (h) etching back said conformally formed dielectric from around said source/drain-contact recesses to produce a groove surrounding the surface of said source/drain-contact recesses, and refilling said groove with a filament of conductive material; and (i) heating said substrate to cause outdiffusion of dopants from said isolated source/drain-contact regions, to create a plurality of source/drain diffusions connecting said source/drain contact regions to corresponding ones of said transistor channel regions.
Claim 2
Dependent Claim
206 words
A process for fabricating integrated circuits, comprising the steps of: (a) providing a substrate having a monocrystalline upper portion: (b) providing field isolation regions in predetermined locations in monocrystalline upper portion to define active device locations therebetween: (c) forming insulated gate lines over predetermined locations including predetermined portions of said active device areas, said insulated gate lines defining transistor channels in portions of said active device areas: (d) forming sidewall filaments on said gate lines: (e) etching, to approximately a predetermined depth, areas of said monocrystalline upper portion of said silicon that are not covered by said gate lines, by said field isolation, nor by said sidewall filaments on said gate lines, to form a source/drain-contact recess: (f) forming a dielectric conformally on bottoms and sidewalls of said recess: (g) filling said source/drain-contact recesses with a conductive material: (h) etching back said conformally formed dielectric from around said source/drain-contact recesses to produce a groove surrounding the surface of said source/drain-contact recesses, and refilling said groove with a filament of conductive material; and (i) heating said substrate to cause outdiffusion of dopants from said isolated source/drain-contact regions, to create a plurality of source/drain diffusions connecting said source/drain contact regions to corresponding ones of said transistor channel regions.
Claim 3
Dependent Claim
74 words
The process of claim 1, wherein said active device regions comprise both NMOS and PMOS active regions, and (g) wherein said step of filling said isolated source/drain-contact recesses with conductive material uses a very lightly doped conductive material; and further comprising the subsequent step of (i) introducing a p-type dopant to said source/drain-contact regions in said PMOS active device regions and an n-type dopant to said source/drain-contact regions in said NMOS active device regions.
Claim 4
Dependent Claim
29 words
The method of claim 1, wherein said step (c) of forming gate lines initially provides a conductive portion consisting predominantly of polysilicon and overlain by a protective dielectric layer.
Claim 5
Dependent Claim
32 words
The method of claim 1, wherein said step (c) of forming gate lines initially provides a conductive portion consisting predominantly of a polysilicon/silicide sandwich structure and overlain by a protective dielectric layer.
Claim 6
Dependent Claim
48 words
The process of the preceding claim, wherein said protective dielectric comprises silicon nitride, whereby said protective dielectric is not removed during said step of isotropically etching back said dielectric surrounding said isolated source/drain-contact regions, and wherein said dielectric surrounding said isolated source/drain-contact regions consists predominantly of silicon oxides.
Claim 7
Dependent Claim
18 words
The process of claim 1, wherein said step (g) of filling said source/drain-contact recesses fills them with metal.
Claim 8
Dependent Claim
25 words
The process of the preceding claim, wherein said metal is selected from the group consisting of tungsten, molybdenum, tantalum, niobium, columbium, palladium, and platinum-group metals.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1993-10-15 | 1994-04-16 | 1994-10-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-10-15 | 1998-04-16 | 1998-10-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-10-15 | 2002-04-16 | 2002-10-16 | $7700.00 | Window Closed / Lapsed |