US4962476A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor memory device having bit lines less liable to have influences of the adjacent bit lines
Assignee: Micron Memory Japan Ltd
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Filing: 1989-07-21
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Granted: 1990-10-09
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Expires: 2009-07-21
Abstract
Abstract A semiconductor memory device according to the present invention has a plurality of memory cells of the one-transistor and one-capacitor type, and a plurality of bit lines coupled to columns of the memory cells, respectively, and disposed in an insulating film over the memory cells, and a common upper electrode is shared by the storage capacitors of the memory cells and has shield portions interposed between the bit lines, so that the adjacent bit lines are less liable to be capacitively coupled by virtue of the shield portions, thereby allowing data bit signals to propagate without any undesirable influence of the adjacent bit lines.
Inventors
- 👤 Koji Kawada
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 10:33
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/41; H10W20/435; H10B; H10B12/00; H10B12/30; H10B12/31; H10B12/37; H10B12/377; H10W20/423
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
223 words
A semiconductor memory device formed on a semiconductor substrate and comprising a plurality of memory cells and a plurality of word lines, each of said memory cells comprising (a) a field effect transistor having source and drain regions formed in a surface portion of said semiconductor substrate and spaced apart from one another, and a gate electrode formed by one of said word lines and located over that area between the source and drain regions, and (b) a storage capacitor having a lower electrode coupled to one of said source and drain regions, a thin dielectric film formed on the lower electrode, and an upper electrode formed on the dielectric film and coupled to a constant voltage source, in which said semiconductor memory device further comprises an inter-level insulating film covering said field effect transistor and said storage capacitor, a plurality of bit lines formed on said inter-level insulating film in a spacing relationship from one another, an upper level insulating film covering said bit lines, and shield plates each formed in said upper level insulating film and provided between two of said bit lines, one of said bit lines passing through a contact window formed in said inter-level insulating film for contacting the other of said source and drain regions, and in which said shield plates is coupled to said upper electrode.
Claim 2
Dependent Claim
223 words
A semiconductor memory device formed on a semiconductor substrate and comprising a plurality of memory cells and a plurality of word lines, each of said memory cells comprising (a) a field effect transistor having source and drain regions formed in a surface portion of said semiconductor substrate and spaced apart from one another, and a gate electrode formed by one of said word lines and located over that area between the source and drain regions, and (b) a storage capacitor having a lower electrode coupled to one of said source and drain regions, a thin dielectric film formed on the lower electrode, and an upper electrode formed on the dielectric film and coupled to a constant voltage source, in which said semiconductor memory device further comprises an inter-level insulating film covering said field effect transistor and said storage capacitor, a plurality of bit lines formed on said inter-level insulating film in a spacing relationship from one another, an upper level insulating film covering said bit lines, and shield plates each formed in said upper level insulating film and provided between two of said bit lines, one of said bit lines passing through a contact window formed in said inter-level insulating film for contacting the other of said source and drain regions, and in which said shield plates is coupled to said upper electrode.
Claim 3
Dependent Claim
24 words
A semiconductor memory device as set forth in claim 1, in which said shield plates extend in substantially parallel to said bit lines, respectively.
Claim 4
Dependent Claim
74 words
A semiconductor memory device as set forth in claim 2, in which said field effect transistor is covered with a lower level insulating film, and in which said lower electrode is formed on said lower level insulating film and projects into a contact window formed in the lower level insulating film so as to come into contact with the surface of said one of said source and drain regions of said field effect transistor.
Claim 5
Dependent Claim
28 words
A semiconductor memory device as set forth in claim 3, in which said upper electrode is formed on said dielectric film and on said lower level insulating film.
Claim 6
Dependent Claim
70 words
A semiconductor memory device as set forth in claim 4, in which said upper electrode is covered with said inter-level insulating film, and in which said a contact hole is formed in said inter-level insulating film and in said lower level insulating film, wherein aforesaid one of said bit lines pass said contact hole so as to come into contact with said the other of said source and drain regions.
Claim 7
Dependent Claim
20 words
A semiconductor memory device as set forth in claim 2, in which said storage capacitor is of the trench capacitor.
Claim 8
Dependent Claim
24 words
A semiconductor memory device as set forth in claim 6, in which said field effect transistor is covered with a lower level insulating film.
Claim 9
Dependent Claim
91 words
A semiconductor memory device as set forth in claim 7, in which said storage capacitor comprises a thin insulating film covering a wall portion defining a trench formed in said semiconductor substrate, said lower electrode formed on said thin insulating film and defining a first vertical cavity in said trench, said dielectric film covering the lower electrode and defining a secondary vertical cavity in the first vertical cavity, and said upper electrode filling said secondary vertical cavity, and in which said lower electrode is partially disposed on said lower insulating film.
References Cited (Backward Citations)
US4914628A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-10-08 | 1994-04-09 | 1994-10-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-10-08 | 1998-04-09 | 1998-10-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-10-08 | 2002-04-09 | 2002-10-09 | $7700.00 | Window Closed / Lapsed |