← Back to Patent Explorer
US4952872A Expired / Lapsed US ⏱️ 0.0 years remaining

Apparatus for electrically testing printed circuit boards having contact pads in an extremely fine grid

Assignee: MANIA TECHNOLOGIE AG
•
Filing: 1989-05-19
•
Granted: 1990-08-28
•
Expires: 2009-05-19
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A circuit board testing device with a plurality of contact points (4) arranged in the plane of the contact field (2) of the device, which are connected to an electronic drive and measuring device and can be connected via test pins (6), which are rigid in the longitudinal direction, to the contact points of the wiring carriers/circuit boards (8) to be tested, the contact points being elastically supported in the circuit board testing device and are pressed against the contact pressure to be applied, the contact points (4) being constructed as electrically conductive compression springs (28) which are arranged in holes (25) of a spring contact field body (26) of electrically insulating material and against which the rigid test pins (6) are directly pressed. The invention provides that the spring contact field body (26) is constructed of segments which can be joined together in a row and that areas of different density of connection of contact points (4) exist in the contact field plane (2), the areas being mutually interchangeable depending on the requirements of the circuit board (8) to be tested. <IMAGE>

Inventors

  • 👤 Hubert Driller
  • 👤 Paul Mang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 09:35
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/06711; G01R1/06716; G01R1/06727; G01R1/073; G01R1/07307; G01R1/07314; G01R1/07328; G01R1/07364; G01R1/07378; H; H01; H01R; H01R11/00; H01R11/11; H01R11/18; H01R12/00; H01R12/70; H01R12/71; H01R12/712; H01R12/714; H05; H05K; H05K13/00; H05K13/08; H05K13/082

Claims Analysis

Total Claims: 28
Claim 1
Independent Claim 200 words
A contact element assembly for use in a printed circuit board testing apparatus to provide electric connection between electronic control and test means of the testing apparatus and, through longitudinal test pins, contact positions of a connection carrier or circuit board to be tested, said assembly comprising: a spring contact array body formed substantially of an electrically insulating material and having therethrough a plurality of bores; a plurality of electrically conductive compression springs, each said spring being located in a respective said bore, each said spring having at a first end thereof means for achieving electrical contact with a longitudinal test pin of the testing apparatus and for centering and guiding the respective longitudinal test pin, at a second end thereof means for achieving electrical connection with the electronic control and test means of the testing apparatus, and between said first and second ends thereof a resiliently yieldable portion; a driver card supporting electronic control components and having contact areas; and said means at said second end of each said compression spring including a resilient contact tongue extending longitudinally from said compression spring and directly engaging with a said contact area of said driver card supporting said electronic control components.
Claim 2
Dependent Claim 200 words
A contact element assembly for use in a printed circuit board testing apparatus to provide electric connection between electronic control and test means of the testing apparatus and, through longitudinal test pins, contact positions of a connection carrier or circuit board to be tested, said assembly comprising: a spring contact array body formed substantially of an electrically insulating material and having therethrough a plurality of bores; a plurality of electrically conductive compression springs, each said spring being located in a respective said bore, each said spring having at a first end thereof means for achieving electrical contact with a longitudinal test pin of the testing apparatus and for centering and guiding the respective longitudinal test pin, at a second end thereof means for achieving electrical connection with the electronic control and test means of the testing apparatus, and between said first and second ends thereof a resiliently yieldable portion; a driver card supporting electronic control components and having contact areas; and said means at said second end of each said compression spring including a resilient contact tongue extending longitudinally from said compression spring and directly engaging with a said contact area of said driver card supporting said electronic control components.
Claim 3
Dependent Claim 22 words
An assembly as claimed in claim 1, wherein said spring contact array body is made of a ceramic or a plastic material.
Claim 4
Dependent Claim 24 words
An assembly as claimed in claim 1, wherein said spring contact array body is formed of a plurality of segments assembled in array form.
Claim 5
Dependent Claim 32 words
An assembly as claimed in claim 1, further comprising a plurality of longitudinally rigid test pins extending into respective said bores and electrically connected to first ends of respective said springs therein.
Claim 6
Dependent Claim 22 words
An assembly as claimed in claim 4, wherein said test pins are seated directly on said first ends of said respective springs.
Claim 7
Dependent Claim 35 words
An assembly as claimed in claim 1, wherein said means at said first end of said compression spring is formed by continguous turns of incrementally and/or gradually reduced coil diameter to form a pin-like shape.
Claim 8
Dependent Claim 35 words
An assembly as claimed in claim 1, wherein said means at said first end of said compression spring is formed by contiguous turns of incrementally and/or gradually reduced coil diameter to form a tapered shape.
Claim 9
Dependent Claim 45 words
An assembly as claimed in claim 1, wherein said means at said first end of said compression spring is formed by contiguous turns of first decreasing and then increasing diameter to define a portion internally tapered for directly receiving an end of a test pin.
Claim 10
Dependent Claim 40 words
An assembly as claimed in claim 1, wherein each said compression spring has at least one end portion thereof formed by contiguous turns having maximum diameter for stable guidance inside the respective said bore in said spring contact array body.
Claim 11
Dependent Claim 27 words
An assembly as claimed in claim 1, wherein each said compression spring includes contiguous turns interconnected mechanically by means such as a coating of metal plated thereon.
Claim 12
Dependent Claim 24 words
An assembly as claimed in claim 1, wherein end portions of said compression springs are coated with a contact material for improved electrical contact.
Claim 13
Dependent Claim 35 words
An assembly as claimed in claim 1, further comprising a contact array plug at one end of said driver card, and wherein said resilient contact tongues extend through respective bores in said contact array plug.
Claim 14
Dependent Claim 58 words
An assembly as claimed in claim 1, wherein the relative dimensions of each said bore and the respective said spring are such that, upon application to said spring by the respective longitudinal test pin of a testing contact pressure, said resiliently yieldable portion of said spring engages the surface of said spring contact array body defining said bore.
Claim 15
Dependent Claim 171 words
A contact array comprising: a plurality of contact element assemblies for use in a printed circuit board testing apparatus to provide electric connection between electronic control and test means of the testing apparatus and, through longitudinal test pins, contact positions of a connection carrier or circuit board to be tested, each said assembly comprising: a spring contact array body formed substantially of an electrically insulating material and having therethrough a plurality of bores; and a plurality of electrically conductive compression springs, each said spring being located in a respective said bore, each said spring having at a first end thereof means for achieving electrical contact with a longitudinal test pin of the testing apparatus and for centering and guiding the respective longitudinal test pin, at a second end thereof means for achieving electrical connection with the electronic control and test means of the testing apparatus, and between said first and second ends thereof a resiliently yieldable portion; said spring contact array bodies of said plurality of assemblies having different contact densities.
Claim 16
Dependent Claim 171 words
A contact array comprising: a plurality of contact element assemblies for use in a printed circuit board testing apparatus to provide electric connection between electronic control and test means of the testing apparatus and, through longitudinal test pins, contact positions of a connection carrier or circuit board to be tested, each said assembly comprising: a spring contact array body formed substantially of an electrically insulating material and having therethrough a plurality of bores; and a plurality of electrically conductive compression springs, each said spring being located in a respective said bore, each said spring having at a first end thereof means for achieving electrical contact with a longitudinal test pin of the testing apparatus and for centering and guiding the respective longitudinal test pin, at a second end thereof means for achieving electrical connection with the electronic control and test means of the testing apparatus, and between said first and second ends thereof a resiliently yieldable portion; said spring contact array bodies of said plurality of assemblies having different contact densities.
Claim 17
Dependent Claim 50 words
A contact array as claimed in claim 14, comprising a plurality of respective electronic control components and driver cards supporting respective contact array plugs having means for making direct electric contact with said means at said second ends of said compression springs of said plurality of spring contact array bodies.
Claim 18
Dependent Claim 66 words
A contact array as claimed in claim 14, wherein, for each said spring contact array body, the relative dimensions of each said bore and the respective said spring are such that, upon application to said spring by the respective longitudinal test pin of a testing contact pressure, said resiliently yieldable portion of said spring engages the surface of said spring contact array body defining said bore.
Claim 19
Dependent Claim 23 words
A contact array as claimed in claim 14, wherein said spring contact array bodies are made of a ceramic or a plastic material.
Claim 20
Dependent Claim 26 words
A contact array as claimed in claim 14, wherein each said spring contact array body is formed of a plurality of segments assembled in array form.
Claim 21
Dependent Claim 37 words
A contact array as claimed in claim 14, further comprising, for each said assembly, a plurality of longitudinally rigid test pins extending into respective said bores and electrically connected to first ends of respective said springs therein.
Claim 22
Dependent Claim 23 words
A contact array as claimed in claim 19, wherein said test pins are seated directly on said first ends of said respective springs.
Claim 23
Dependent Claim 42 words
A contact array as claimed in claim 14, wherein said means at at least one of said first and second ends of said compression spring is formed by contiguous turns of incrementally and/or gradually reduced coil diameter to form a pin-like shape.
Claim 24
Dependent Claim 42 words
A contact array as claimed in claim 14, wherein said means at at least one of said first and second ends of said compression spring is formed by contiguous turns of incrementally and/or gradually reduced coil diameter to form a tapered shape.
Claim 25
Dependent Claim 52 words
A contact array as claimed in claim 14, wherein said means at at least one of said first and second ends of said compression spring is formed by contiguous turns of first decreasing and then increasing diameter to define a portion internally tapered for directly achieving an end of a test pin.
Claim 26
Dependent Claim 43 words
A contact array as claimed in claim 14, wherein each said compression spring has at least one end portion thereof formed by contiguous turns having maximum diameter for stable guidance inside the respective said bore in the respective said spring contact array body.
Claim 27
Dependent Claim 28 words
A contact array as claimed in claim 14, wherein each said compression spring includes contiguous turns interconnected mechanically by means such as a coating of metal plated thereon.
Claim 28
Dependent Claim 25 words
A contact array as claimed in claim 14, wherein end portions of said compression springs are coated with a contact material for improved electrical contact.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-08-27 1994-02-26 1994-08-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-08-27 1998-02-26 1998-08-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-08-27 2002-02-26 2002-08-28 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag