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US4948461A Expired / Lapsed US ⏱️ 0.0 years remaining

Dry-etching method and plasma

Assignee: Eastman Kodak Co
•
Filing: 1989-10-16
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Granted: 1990-08-14
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Expires: 2009-10-16
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Abstract

Abstract An etching plasma containing a reactive fluorine-containing gas and atoms or ions of a heavy metal is particularly useful in a method of removing material from a substrate by reactive ion etching.

Inventors

  • 👤 Dilip K. Chatterjee

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 19:36
CPC Classifications
H; H10; H10P; H10P50/00; C; C03; C03B; C03B11/00; C03B11/06; C03B11/08; C03B11/084; C04; C04B; C04B41/00; C04B41/009; C04B41/53; C04B41/5338; C04B41/5346; C03B2215/00; C03B2215/02; C03B2215/05; C03B2215/07; C04B2111/00; C04B2111/00474; C04B2111/00939

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 47 words
In a method of removing material from a non- metallic substrate by reactive ion etching using an etching plasma containing a reactive fluorine-containing gas, the improvement comprising incorporating into said plasma atoms or ions of a metal having an atomic weight of at least about fifty-eight (58).
Claim 2
Dependent Claim 47 words
In a method of removing material from a non- metallic substrate by reactive ion etching using an etching plasma containing a reactive fluorine-containing gas, the improvement comprising incorporating into said plasma atoms or ions of a metal having an atomic weight of at least about fifty-eight (58).
Claim 3
Dependent Claim 22 words
The method of claim 1 wherein said metal is selected from the group consisting of Ni, Cu, Pd, Ag, Pt and Au.
Claim 4
Dependent Claim 13 words
The method of claim 1 wherein said metal is Cu, Ag or Mo.
Claim 5
Dependent Claim 16 words
The method of claim 1 wherein said etching plasma comprises CF 4 and O 2 .
Claim 6
Dependent Claim 13 words
The method of claim 1 wherein said material being removed is silicon carbide.
Claim 7
Dependent Claim 46 words
In an etching plasma containing a reactive fluorine containing gas adapted for removing material from a non metallic substrate by reactive ion etching, the improvement wherein said plasma comprises atoms or ions of a metal having an atomic weight of at least about fifty eight (58).
Claim 8
Dependent Claim 46 words
In an etching plasma containing a reactive fluorine containing gas adapted for removing material from a non metallic substrate by reactive ion etching, the improvement wherein said plasma comprises atoms or ions of a metal having an atomic weight of at least about fifty eight (58).
Claim 9
Independent Claim 43 words
A method of preparing an aspherized surface from a silicon carbide substrate by etching said substrate with an etching plasma containing a reactive fluorine containing gas and atoms or ions of a metal having an atomic weight of at least about fifty-eight (58).
Claim 10
Independent Claim 43 words
A method of preparing an aspherized surface from a silicon carbide substrate by etching said substrate with an etching plasma containing a reactive fluorine containing gas and atoms or ions of a metal having an atomic weight of at least about fifty-eight (58).
Claim 11
Dependent Claim 14 words
The method of claim 7 wherein said substrate is etched through a rotating mask.
Claim 12
Dependent Claim 14 words
The method of claim 8 wherein said mask is made of Cu or Mo.

References Cited (Backward Citations)

US4375385A Cited
US4624736A Cited
US4631105A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-08-13 1994-02-12 1994-08-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-08-13 1998-02-12 1998-08-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-08-13 2002-02-12 2002-08-14 $7700.00 Window Closed / Lapsed

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