US4937826A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and apparatus for sensing defects in integrated circuit elements
Assignee: Cross-Check Technology Inc
•
Filing: 1988-09-09
•
Granted: 1990-06-26
•
Expires: 2008-09-09
Abstract
Abstract An apparatus for testing for faults in an integrated circuit is attached to sense lines which are coupled to output nodes of logic gates of a test structure within an integrated circuit, such as a "Cross-Check" test structure built into an integrate circuit apparatus. A related method provide precharging of the sense lines to a known signal level prior to using the sense lines to sense the signal level at a test point. The apparatus combined with sense amplifiers or comparators attached to the sense lines may adjust detection levels of the comparators synchronously to test for either an output "one" minimum level (VOH) or output "zero" maximum level (VOL) to test for other classes of faults. The apparatus attached to the sense lines may inject charge into an output node of a logic gate at preselected times in a test sequence to modify the signal level at that output node to test for faults. A method according to the invention includes path sensitization whereby test patterns can be reduced to Boolean expressions.
Inventors
- 👤 Tushar R. Gheewala
- 👤 Robert J. Lipp
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 11:35
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/316; G01R31/30; G01R31/317; G01R31/3181; G01R31/3185; G01R31/318516
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
139 words
A method for testing for faults in an integrated circuit, said integrated circuit including sense lines which are connected to test nodes of a test structure for logic gates within an integrated circuit, said method comprising: precharging the sense lines with a preselected electric charge; thereafter sensing final state of a signal on each sense line as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line, wherein the preselected electric charge corresponds to a voltage level having a logic value which is opposite in sense to a predicted logic value on a test node, said test node being connected to the sense line through a switch, wherein said predicted logic value is a result of correct operation of the logic gate connected to said sense line.
Claim 2
Independent Claim
139 words
A method for testing for faults in an integrated circuit, said integrated circuit including sense lines which are connected to test nodes of a test structure for logic gates within an integrated circuit, said method comprising: precharging the sense lines with a preselected electric charge; thereafter sensing final state of a signal on each sense line as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line, wherein the preselected electric charge corresponds to a voltage level having a logic value which is opposite in sense to a predicted logic value on a test node, said test node being connected to the sense line through a switch, wherein said predicted logic value is a result of correct operation of the logic gate connected to said sense line.
Claim 3
Dependent Claim
29 words
The method according to claim 1 further including the step of adjusting detection levels of comparators used for sensing said charges, said adjusting being synchronous with said precharging step.
Claim 4
Independent Claim
111 words
A method for testing for faults in an integrated circuit, said integrated circuit including sense lines which are connected to test nodes of a test structure for logic gates within an integrated circuit, said method comprising: precharging the sense lines with a preselected electric charge; thereafter sensing final state of a signal on each sense line as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line. further including the step of injecting charge into an output node of a logic gate to modify signal level at said logic gate output node for use to test noise margin faults.
Claim 5
Independent Claim
111 words
A method for testing for faults in an integrated circuit, said integrated circuit including sense lines which are connected to test nodes of a test structure for logic gates within an integrated circuit, said method comprising: precharging the sense lines with a preselected electric charge; thereafter sensing final state of a signal on each sense line as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line. further including the step of injecting charge into an output node of a logic gate to modify signal level at said logic gate output node for use to test noise margin faults.
Claim 6
Independent Claim
104 words
A method for testing for faults in an integrated circuit said integrated circuit including sense lines which are connected to test nodes of a test structure for logic gates within an integrated circuit, said method comprising: precharging the sense lines with a preselected electric charge; thereafter sensing final state of a signal on ech sense line as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line, further including the step of injecting charge into an input node of a logic gate to modify signal level at said logic gate input node.
Claim 7
Independent Claim
104 words
A method for testing for faults in an integrated circuit said integrated circuit including sense lines which are connected to test nodes of a test structure for logic gates within an integrated circuit, said method comprising: precharging the sense lines with a preselected electric charge; thereafter sensing final state of a signal on ech sense line as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line, further including the step of injecting charge into an input node of a logic gate to modify signal level at said logic gate input node.
Claim 8
Independent Claim
126 words
A method for sensitizing a path for testing for open faults in an integrated circuit, said integrated circuit including sense lines which are coupled to test nodes of a test structure for logic gates within an integrated circuit, said method comprising: (a) selecting a path for an open circuit test; (b) applying test pattern signals to a signal input node and to said selected path to preset elements between said signal input node and an output test node to a presumed state; (c) thereafter, precharging the sense lines with a preselected electric charge; and (d) sensing changes of signals on the sense lines as a result of electrically connecting the output test node to the sense lines in the presence of precharge on the sense lines.
Claim 9
Independent Claim
126 words
A method for sensitizing a path for testing for open faults in an integrated circuit, said integrated circuit including sense lines which are coupled to test nodes of a test structure for logic gates within an integrated circuit, said method comprising: (a) selecting a path for an open circuit test; (b) applying test pattern signals to a signal input node and to said selected path to preset elements between said signal input node and an output test node to a presumed state; (c) thereafter, precharging the sense lines with a preselected electric charge; and (d) sensing changes of signals on the sense lines as a result of electrically connecting the output test node to the sense lines in the presence of precharge on the sense lines.
Claim 10
Dependent Claim
32 words
The method according to claim 5 further including the step of repeating steps (a) through (d) for each possible open fault to obtain full coverage of open faults in said integrated circuit.
Claim 11
Independent Claim
174 words
A method for sensitizing a path for testing for open faults in an integrated circuit, said integrated circuit including sense lines which are coupled to test nodes of a test structure for logic gates within an integrated circuit, said method comprising the steps of: (a) selecting a sub-element and path for an open circuit test; (b) applying test pattern signals to signal input nodes of said integrated circuit so as to exercise said selected sub-element and said selected path and to preset all elements between said output test node and said signal input node and between said output test node and power supplies to an ON state and to preset alternate paths between said signal input node and between said output test node and power supplies to an OPEN state; (c) thereafter, precharging the sense lines with a preselected electric charge; and (d) sensing changes of signals on the sense lines as a result of electrically connecting the output test node to the sense lines in the presence of precharge on the sense lines.
Claim 12
Independent Claim
174 words
A method for sensitizing a path for testing for open faults in an integrated circuit, said integrated circuit including sense lines which are coupled to test nodes of a test structure for logic gates within an integrated circuit, said method comprising the steps of: (a) selecting a sub-element and path for an open circuit test; (b) applying test pattern signals to signal input nodes of said integrated circuit so as to exercise said selected sub-element and said selected path and to preset all elements between said output test node and said signal input node and between said output test node and power supplies to an ON state and to preset alternate paths between said signal input node and between said output test node and power supplies to an OPEN state; (c) thereafter, precharging the sense lines with a preselected electric charge; and (d) sensing changes of signals on the sense lines as a result of electrically connecting the output test node to the sense lines in the presence of precharge on the sense lines.
Claim 13
Dependent Claim
42 words
The method according to claim 7 further including the steps of: repeating steps (a) through (d) for each possible open fault to obtain full coverage of open faults in said integrated circuit; and reducing a description of test patterns to Boolean expressions.
Claim 14
Independent Claim
152 words
An apparatus for testing for faults in an integrated circuit, said integrated circuit including sense lines which are coupled to test nodes of a test structure for logic gates within an integrated circuit, said apparatus comprising: means coupled to the sense lines for precharging the sense lines with a preselected electric charge; and means coupled to the sense lines for sensing state of signals on the sense lines as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line, wherein said precharging means comprises a first controllable switch coupled between a power source and one of the sense lines, a second controllable switch coupled between ground and said one of the sense lines, and means for controlling switching of said first controllable switch and said second controllable switch relative to one another and relative to operation of the logic gates.
Claim 15
Independent Claim
152 words
An apparatus for testing for faults in an integrated circuit, said integrated circuit including sense lines which are coupled to test nodes of a test structure for logic gates within an integrated circuit, said apparatus comprising: means coupled to the sense lines for precharging the sense lines with a preselected electric charge; and means coupled to the sense lines for sensing state of signals on the sense lines as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line, wherein said precharging means comprises a first controllable switch coupled between a power source and one of the sense lines, a second controllable switch coupled between ground and said one of the sense lines, and means for controlling switching of said first controllable switch and said second controllable switch relative to one another and relative to operation of the logic gates.
Claim 16
Dependent Claim
17 words
The apparatus according to claim 9 wherein said sensing means comprises a sense amplifier or a comparator.
Claim 17
Independent Claim
139 words
An apparatus for testing for faults in an integrated circuit, said integrated circuit including sense lines which are coupled to test modes of a test structure for logic gates within an integrated circuit, said apparatus comprising: means coupled to the sense lines for precharging the sense lines with a preselected electric charge; and means coupled to the sense lines for sensing state of signals on the sense lines as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line, wherein said sensing means comprises a first comparator and a second comparator, said first comparator having a first noninverting input, said second comparator having a second noninverting input, said first noninverting input being coupled in common to said second noninverting and to said one of the sense lines.
Claim 18
Independent Claim
139 words
An apparatus for testing for faults in an integrated circuit, said integrated circuit including sense lines which are coupled to test modes of a test structure for logic gates within an integrated circuit, said apparatus comprising: means coupled to the sense lines for precharging the sense lines with a preselected electric charge; and means coupled to the sense lines for sensing state of signals on the sense lines as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line, wherein said sensing means comprises a first comparator and a second comparator, said first comparator having a first noninverting input, said second comparator having a second noninverting input, said first noninverting input being coupled in common to said second noninverting and to said one of the sense lines.
Claim 19
Dependent Claim
67 words
The apparatus according to claim 11 further including a two-input EXCLUSIVE-OR gate having a first input coupled to an output of said first comparator and a second input coupled to an output of said second comparator for generation of a TRUE output signal whenever voltage on said sense line is between upper and lower threshold levels of said first and second comparators indicative of an x-level fault.
Claim 20
Independent Claim
176 words
An apparatus for testing for faults in an integrated circuit, said integrated circuit including sense lines which are coupled to test nodes of a test structure for logic gates within an integrated circuit, said apparatus comprising: means coupled to the sense lines for precharging the sense lines with a preselected electric charge; and means coupled to the sense lines for sensing state of signals on the sense lines as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line, wherein said sensing means comprises a first circuit element, a second circuit element, first switch means coupled to said first circuit element for controlling voltage switching at a first voltage level in response to a voltage on said one of the sense lines, and second switch means coupled to said second circuit element for controlling voltage switching at a second voltage level in response to a voltage on said one of the sense lines of said first circuit element and of said second circuit element.
Claim 21
Independent Claim
176 words
An apparatus for testing for faults in an integrated circuit, said integrated circuit including sense lines which are coupled to test nodes of a test structure for logic gates within an integrated circuit, said apparatus comprising: means coupled to the sense lines for precharging the sense lines with a preselected electric charge; and means coupled to the sense lines for sensing state of signals on the sense lines as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line, wherein said sensing means comprises a first circuit element, a second circuit element, first switch means coupled to said first circuit element for controlling voltage switching at a first voltage level in response to a voltage on said one of the sense lines, and second switch means coupled to said second circuit element for controlling voltage switching at a second voltage level in response to a voltage on said one of the sense lines of said first circuit element and of said second circuit element.
Claim 22
Independent Claim
108 words
An apparatus for testing for faults in an integrated circuit, said integrated circuit including sense line switch are coupled to test nodes of a test structure for logic gates within an integrated circuit, said apparatus comprising: means coupled to the sense lines for precharging the sense lines with a preselected electric charge; and means coupled to the sense lines for sensing state of signal on the sense lines as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line, wherein said sensing means comprises a Schmitt trigger for generating an output signal indicative of x-level faults.
Claim 23
Independent Claim
108 words
An apparatus for testing for faults in an integrated circuit, said integrated circuit including sense line switch are coupled to test nodes of a test structure for logic gates within an integrated circuit, said apparatus comprising: means coupled to the sense lines for precharging the sense lines with a preselected electric charge; and means coupled to the sense lines for sensing state of signal on the sense lines as a result of electrically coupling a logic gate to the sense line in the presence of stored charge on the sense line, wherein said sensing means comprises a Schmitt trigger for generating an output signal indicative of x-level faults.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-06-25 | 1993-12-25 | 1994-06-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-06-25 | 1997-12-25 | 1998-06-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-06-25 | 2001-12-25 | 2002-06-26 | $7700.00 | Window Closed / Lapsed |