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US4937176A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of manufacturing a semiconductor device, in which a negative image is formed on a semiconductor substrate in a positive photolacquer

Assignee: US Philips Corp
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Filing: 1988-09-27
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Granted: 1990-06-26
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Expires: 2008-09-27
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Abstract

Abstract A method of manufacturing a semiconductor device, in which a layer of photolacquer (5) containing as a photoactive component a diazo oxide is provided on a semiconductor substrate. Of this layer, parts (9) are irradiated by a first patterned irradiation (7) and these parts are then rendered poorly developable by an intermediate treatment. Subsequently, the lacquer layer (5) is subjected to a second non-patterned irradiation (11) and is then developed. According to the invention, in the parts (9) irradiated by the first irradiation a pigment is formed, which absorbs radiation having a wavelength at which diazo oxide is photosensitive. The second irradiation is carried out with radiation of that wavelength. Thus, lacquer tracks having a rectangular profile can be obtained in a simple manner.

Inventors

  • 👤 Franciscus A. Vollenbroek
  • 👤 Wilhelmus P. M. Nijssen
  • 👤 Marcellinus J. H. J. Geomini

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 14:50
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/022; G03F7/0226; G03F7/20; G03F7/2022

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 254 words
A method of providing a semiconductor substrate with a patterned photolacquer layer having a substantially rectangular profile, said method substrate comprising: (a) Providing a semiconductor substrate with a photolacquer layer containing a photoactive diazo oxide compound capable of being converted to an indene carboxylic acid, a triazene compound capable of reacting with an acid to form a diazonium compound capable of reacting with a coupler to form an azo pigment which absorbs radiation having a wavelength range in which said diazo oxide compound is photosensitive, said triazene compound being of the formula ##STR4## in which X=H, 2-Me-5-Cl, 2-Me-4Cl or 4-Br and in which R 1 =R 2 =CH 3 , CH 2 --CH 2 --OH or in which R 1 R 2 =--CH 2 --CH 2 --CH 2 --CH 2 --CH 2 or --CH 2 --CH 2 --O--CH 2 --CH 2 --, and a photochemical acidifier which under the influence of the first patterned irradiation forms a strong acid, said acidifier being a halogen-containing triazine compound; (b) exposing said layer to a first patterned irradiation; (c) then heating said thus irradiated layer to thereby cause said azo pigment to form in the irradiated portions of said layer and cause said irradiated portions of said layer to become only poorly developable; (d) exposing said thus first-irradiated layer to a second non-patterned irradiation of a wavelength absorbed by said pigment and to which diazo oxide compound is photosensitive; and (e) developing said layer to thereby remove the portions of said layer non-irradiated during said first irradiation.
Claim 2
Independent Claim 254 words
A method of providing a semiconductor substrate with a patterned photolacquer layer having a substantially rectangular profile, said method substrate comprising: (a) Providing a semiconductor substrate with a photolacquer layer containing a photoactive diazo oxide compound capable of being converted to an indene carboxylic acid, a triazene compound capable of reacting with an acid to form a diazonium compound capable of reacting with a coupler to form an azo pigment which absorbs radiation having a wavelength range in which said diazo oxide compound is photosensitive, said triazene compound being of the formula ##STR4## in which X=H, 2-Me-5-Cl, 2-Me-4Cl or 4-Br and in which R 1 =R 2 =CH 3 , CH 2 --CH 2 --OH or in which R 1 R 2 =--CH 2 --CH 2 --CH 2 --CH 2 --CH 2 or --CH 2 --CH 2 --O--CH 2 --CH 2 --, and a photochemical acidifier which under the influence of the first patterned irradiation forms a strong acid, said acidifier being a halogen-containing triazine compound; (b) exposing said layer to a first patterned irradiation; (c) then heating said thus irradiated layer to thereby cause said azo pigment to form in the irradiated portions of said layer and cause said irradiated portions of said layer to become only poorly developable; (d) exposing said thus first-irradiated layer to a second non-patterned irradiation of a wavelength absorbed by said pigment and to which diazo oxide compound is photosensitive; and (e) developing said layer to thereby remove the portions of said layer non-irradiated during said first irradiation.
Claim 3
Dependent Claim 37 words
A method as claimed in claim 1, characterized in that the halogen-containing triazene derivative is a compound selected from the group of compounds having the chemcial formula: ##STR5## in which X=Cl or Br and in which ##STR6##
Claim 4
Dependent Claim 19 words
A method as claimed in claim 1, characterized in that an additional coupler is further added to the photolacquer.
Claim 5
Dependent Claim 27 words
A method as claimed in claim 3, characterized in that the additional coupler is a compound from the group of compounds consisting of resorcinol, β-naphthanol and N,N-dimethylaniline.
Claim 6
Dependent Claim 19 words
A method as claimed in claim 1, wherein the photolacquer layer additinally contains a novolak or a polyvinyl phenol.

References Cited (Backward Citations)

US1760780A Cited
US4055425A Cited
US4160671A Cited
US4356254A Cited
US4350753A Cited
US4458000A Cited
US4546066A Cited
US4704347A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-06-25 1993-12-25 1994-06-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-06-25 1997-12-25 1998-06-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-06-25 2001-12-25 2002-06-26 $7700.00 Window Closed / Lapsed

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