US4931353A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Structure and method for selectively producing a conductive region on a substrate
Assignee: Boeing Co
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Filing: 1989-11-22
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Granted: 1990-06-05
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Expires: 2009-11-22
Abstract
Abstract In a multi-chip module, a structure for selectively connecting two conductors. A switchable connector (36) is disposed between a first and second portion (30,32) of a copper conductor (28). The switchable connector comprises an amorphous silicon layer (58), which extends between two spacer pads (56) that are electrically connected to the first and second portions of the copper conductor. A barrier layer (60) is formed atop the amorphous silicon, physically separating it from a reactive metal layer (62). The reactive metal layer is coated with an antireflective coating (64). Interaction of the reactive metal layer with the amorphous silicon layer is prevented by the barrier layer until the barrier layer is heated above 500° C. A laser beam (66) is focused on opposite edges of the switchable connector, causing the barrier layer and reactive metal layer to diffuse into the amorphous silicon, forming electrically conductive silicides. Electric current can then flow between the first and second portions of the copper conductor through the silicides and the remainder of the reactive metal layer.
Inventors
- 👤 Minas H. Tanielian
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 02:00
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/49; H10W20/491; H10W20/492; H10W20/01; H10W20/031; H10W20/064; H10W20/066; Y; Y10; Y10S; Y10S148/00; Y10S148/055; Y10S148/09; Y10S148/093
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
184 words
A method for selectively providing electrical continuity between two conductors in an integrated circuit, comprising the steps of: (a) forming a layer of silicon between the two conductors; (b) forming a barrier layer of a metallic material that is chemically nonreactive with silicon and does not diffusively mix with silicon below a substantially elevated reaction temperature, on the layer of silicon so that the barrier layer is prevented from electrically connecting to the two conductors by the silicon layer; (c) forming on the barrier layer, a layer of an electrically conductive material that is chemically reactive with silicon at a temperature substantially below the reaction temperature, so the electrically conductive material is separated from the layer of silicon; and (d) selectively heating a limited area of the substrate, including at least portions of the barrier layer and of the layer of electrically conductive material, above the reaction temperature, causing the electrically conductive material and the metallic material to react with the silicon, producing conductive silicides, thereby providing electrical continuity between the two conductors through the conductive silicides and the layer of electrically conductive material.
Claim 2
Independent Claim
184 words
A method for selectively providing electrical continuity between two conductors in an integrated circuit, comprising the steps of: (a) forming a layer of silicon between the two conductors; (b) forming a barrier layer of a metallic material that is chemically nonreactive with silicon and does not diffusively mix with silicon below a substantially elevated reaction temperature, on the layer of silicon so that the barrier layer is prevented from electrically connecting to the two conductors by the silicon layer; (c) forming on the barrier layer, a layer of an electrically conductive material that is chemically reactive with silicon at a temperature substantially below the reaction temperature, so the electrically conductive material is separated from the layer of silicon; and (d) selectively heating a limited area of the substrate, including at least portions of the barrier layer and of the layer of electrically conductive material, above the reaction temperature, causing the electrically conductive material and the metallic material to react with the silicon, producing conductive silicides, thereby providing electrical continuity between the two conductors through the conductive silicides and the layer of electrically conductive material.
Claim 3
Dependent Claim
29 words
The method of claim 1, wherein the step of heating comprises the step of focusing an energy beam on portions of the barrier layer and the electrically conductive layer.
Claim 4
Dependent Claim
32 words
The method of claim 2, further comprising the step of forming an antireflective coating over the layer of electrically conductive material to absorb the focused beam of energy, preventing it being reflected.
Claim 5
Dependent Claim
15 words
The method of claim 2, wherein the focused beam of energy is a laser beam.
Claim 6
Dependent Claim
14 words
The method of claim 1, wherein the reaction temperature is substantially above 300° C.
Claim 7
Dependent Claim
29 words
The method of claim 1, wherein the electrically conductive material is selected from the group consisting of platinum, palladium, nickel, and aluminum, and a mixture of aluminum and silicon.
Claim 8
Dependent Claim
24 words
The method of claim 1, wherein the barrier layer comprises one or more selected from the group consisting of titanium, niobium, zirconium, and vanadium.
Claim 9
Dependent Claim
45 words
The method of claim 1, further comprising the step of depositing electrically conductive spacers on the substrate, each in electrical contact with one of the conductors and with the layer of silicon, said spacers providing electrical continuity between the two conductors and the conductive silicides.
Claim 10
Dependent Claim
34 words
The method of claim 1, further comprising the steps of applying an insulating coating on the layer of electrically conductive material, and curing the insulating coating at a temperature well below the reaction temperature.
Claim 11
Dependent Claim
14 words
The method of claim 9, wherein the insulating coating is transparent and comprises polyimide.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-06-04 | 1993-12-04 | 1994-06-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-06-04 | 1997-12-04 | 1998-06-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-06-04 | 2001-12-04 | 2002-06-05 | $7700.00 | Window Closed / Lapsed |