Patent US4924212A successfully refreshed from Google Patents.
← Back to Patent Explorer
US4924212A Expired / Lapsed US ⏱️ 0.0 years remaining

Temperature threshold detection circuit

Assignee: STMicroelectronics SA
•
Filing: 1988-08-23
•
Granted: 1990-05-08
•
Expires: 2008-08-23
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A threshold temperature detection is made by measuring the reverse saturation current of a transistor subjected to the temperature to be measured. It is shown that, for temperatures close to the ambient temperature, the sensitivity of this detector is very high. Furthermore, in making a circuit that measures the relative variations of the reverse saturation current, a temperature detector is made which is independent of variations in characteristics resulting from manufacturng tolerances for integrated circuits. This circuit is particularly designed to be implanted in the same substrate as a memory circuit of the type with memory cells, provided with floating gate transistors.

Inventors

  • 👤 Serge Fruhauf
  • 👤 Eric Mattera

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 23:36
CPC Classifications
G; G01; G01K; G01K3/00; G01K3/005; G01K7/00; G01K7/01

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 72 words
A temperature threshold detection circuit comprising at least one transistor, reverse biased by an electrical supply circuit, and means for measuring the reverse saturation current which flows through this transistor, wherein the measuring means comprise a second transistor in series with the first transistor and reverse biased by the supply, having a size different from that of the first transistor, and a threshold comparator connected to the mid-point of these two transistors.
Claim 2
Dependent Claim 72 words
A temperature threshold detection circuit comprising at least one transistor, reverse biased by an electrical supply circuit, and means for measuring the reverse saturation current which flows through this transistor, wherein the measuring means comprise a second transistor in series with the first transistor and reverse biased by the supply, having a size different from that of the first transistor, and a threshold comparator connected to the mid-point of these two transistors.
Claim 3
Dependent Claim 20 words
A circuit according to claim 1 integrated into the substrate of an integrated circuit to provide for its thermal monitoring.
Claim 4
Dependent Claim 14 words
A circuit according to claim 2 wherein the two channels have identical conduction channels.
Claim 5
Dependent Claim 38 words
A circuit according to claim 2 wherein one of the transistors is a P channel transistor, made in a P dope substrate and contained in a pad which is electrically connected to the source potential of this transistor.
Claim 6
Dependent Claim 14 words
A circuit according to claim 1 wherein the two channels have identical conduction channels.
Claim 7
Dependent Claim 38 words
A circuit according to claim 1 wherein one of the transistors is a P channel transistor, made in a P doped substrate and contained in a pad which is electrically connected to the source potential of this transistor.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-05-07 1993-11-06 1994-05-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-05-07 1997-11-06 1998-05-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-05-07 2001-11-06 2002-05-08 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag