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US4916499A Expired / Lapsed US ⏱️ 0.0 years remaining

Junction field effect transistor with vertical gate region

Assignee: Sony Corp
•
Filing: 1989-09-06
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Granted: 1990-04-10
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Expires: 2009-09-06
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Abstract

Abstract A junction field effect transistor having a source region, a gate region and a drain region, which are laminated to form a laminated layer, and a channel region formed on one side surface across the laminated layer, and also having a cavity which separates high impurity concentration regions of the source, gate and drain regions is disclosed. A method for manufacturing the above junction field effect transistor is also disclosed which has the steps of laminating semiconductor layers which become a source region, a gate region and a drain region, respectively, removing portions of the semiconductor layers other than portions which become an active region portion, and forming a channel region on one side surface across the laminated layers of the source region, gate region and drain region by the epitaxial growth method, and also forming cavities.

Inventors

  • 👤 Hiroji Kawai

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 02:48
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/80; H10D30/83; H10D30/831

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 90 words
A junction field effect transistor comprising; a source region comprising a semiconductor layer, a gate region comprising a semiconductor layer, and a drain region comprising a semiconductor layer, said source, gate and drain regions formed in overlapping parallel layers with said gate region between said source and drain regions, to make up a laminated structure, said laminated structure having a side surface transverse to said layers, and a channel region formed by said side surface across said laminated structure, said channel region juxtaposed with the edge of said gate region.
Claim 2
Dependent Claim 90 words
A junction field effect transistor comprising; a source region comprising a semiconductor layer, a gate region comprising a semiconductor layer, and a drain region comprising a semiconductor layer, said source, gate and drain regions formed in overlapping parallel layers with said gate region between said source and drain regions, to make up a laminated structure, said laminated structure having a side surface transverse to said layers, and a channel region formed by said side surface across said laminated structure, said channel region juxtaposed with the edge of said gate region.
Claim 3
Dependent Claim 40 words
A junction field effect transistor according to claim 1, in which said source, gate and drain regions comprise regions of impurity concentrations, and further comprising a cavity which separates the impurity concentration regions of said source, gate and drain regions.

References Cited (Backward Citations)

US3823352A Cited
US4259681A Cited
US4459605A Cited
US4636823A Cited
US4620207A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-04-09 1993-10-09 1994-04-10 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-04-09 1997-10-09 1998-04-10 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-04-09 2001-10-09 2002-04-10 $7700.00 Window Closed / Lapsed

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