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US4911896A Expired / Lapsed US ⏱️ 0.0 years remaining

Fused quartz member for use in semiconductor manufacture

Assignee: General Electric Co
•
Filing: 1986-07-24
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Granted: 1990-03-27
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Expires: 2006-07-24
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Abstract

Abstract A composite fused quartz material is disclosed for processing semiconductor grade silicon material in an improved manner. The modified vitreous material includes a disperse phase of fine size silicon metal particles which are distributed in preselected regions of the fused quartz matrix as a means of exercising temperature control in the various semiconductor processing operations using these fused quartz parts. Such utilization of the modified vitreous material in single crystal silicon rod growth and production of semiconductor grade silicon by diffusion doping is described. A method to produce the modified vitreous material is also disclosed.

Inventors

  • 👤 Peter P. Bihuniak
  • 👤 Gordon E. Dogunke
  • 👤 Robert D. Shelley

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 02:09
CPC Classifications
C; C03; C03B; C03B19/00; C03B19/06; C03B19/066; C03C; C03C3/00; C03C3/04; C03C3/06; C03B19/09; C03B19/095; C03C11/00; C30; C30B; C30B15/00; C30B15/10; C30B15/12; C30B35/00; C30B35/002; H; H10; H10P; H10P72/00; H10P72/04; H10P72/0431; Y; Y10; Y10S; Y10S117/00; Y10S117/90; Y10T; Y10T117/00; Y10T117/10; Y10T117/1024; Y10T117/1032; Y10T117/1068

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 142 words
A composite fused quartz member employed in the drawing of a single crystal silicon rod from a molten polysilicon mass at elevated temperatures which comprises a fused quartz matrix having occluded bubbles which contains a disperse phase of from about 25 ppm up to about 2000 ppm by weight of fine size spherically shaped silicon metal crystals uniformly distributed throughout the fused quartz matrix in at least a portion of said fused quartz member so as to reduce infrared optical transmission through said portion to a room-temperature value no greater than about 30% at a 3 mm sample thickness, said fused quartz member being further characterized by a total content of other metal impurities not exceeding 100 ppm by weight, wherein that portion of said fused quartz member which contains said disperse phase serves to control temperature distribution in the drawing process.
Claim 2
Dependent Claim 142 words
A composite fused quartz member employed in the drawing of a single crystal silicon rod from a molten polysilicon mass at elevated temperatures which comprises a fused quartz matrix having occluded bubbles which contains a disperse phase of from about 25 ppm up to about 2000 ppm by weight of fine size spherically shaped silicon metal crystals uniformly distributed throughout the fused quartz matrix in at least a portion of said fused quartz member so as to reduce infrared optical transmission through said portion to a room-temperature value no greater than about 30% at a 3 mm sample thickness, said fused quartz member being further characterized by a total content of other metal impurities not exceeding 100 ppm by weight, wherein that portion of said fused quartz member which contains said disperse phase serves to control temperature distribution in the drawing process.
Claim 3
Dependent Claim 16 words
A fused quartz member as in claim 1 having the shape of a closed-end hollow vessel.
Claim 4
Dependent Claim 26 words
A fused quartz member as in claim 2 wherein that portion which contains said disperse phase is located at the top wall portions of said vessel.
Claim 5
Dependent Claim 20 words
A fused quartz member as in claim 1 having the shape of a ;hollow cylinder serving as a thermal shield.
Claim 6
Dependent Claim 15 words
A fused quartz member as in claim 1 having the shape of a cylindrical disc.
Claim 7
Dependent Claim 166 words
A composite fused quartz member employed in the formation of a semiconductor element by doping semiconductor grade single-crystal silicon material at elevated temperatures with a gaseous atmosphere containing the doping element which comprises a closed vessel that includes at least one composite fused quartz member having a fused quartz matrix having occluded bubbles which contains a disperse phase of from about 25 ppm up to about 2000 ppm by weight of fine size spherically-shaped silicon metal crystals uniformly distributed throughout the fused quartz matrix in at least a portion of said composite fused quartz member so as to reduce infrared optical transmission through said portion to a room-temperature value no greater than about 30% at a 3 mm sample thickness, said composite fused quartz member being further characterized by a total content of other metal impurities not exceeding 100 ppm by weight wherein that portion of said fused quartz vessel which contains said disperse phase serves to control temperature distribution in the semiconductor material being treated.
Claim 8
Dependent Claim 166 words
A composite fused quartz member employed in the formation of a semiconductor element by doping semiconductor grade single-crystal silicon material at elevated temperatures with a gaseous atmosphere containing the doping element which comprises a closed vessel that includes at least one composite fused quartz member having a fused quartz matrix having occluded bubbles which contains a disperse phase of from about 25 ppm up to about 2000 ppm by weight of fine size spherically-shaped silicon metal crystals uniformly distributed throughout the fused quartz matrix in at least a portion of said composite fused quartz member so as to reduce infrared optical transmission through said portion to a room-temperature value no greater than about 30% at a 3 mm sample thickness, said composite fused quartz member being further characterized by a total content of other metal impurities not exceeding 100 ppm by weight wherein that portion of said fused quartz vessel which contains said disperse phase serves to control temperature distribution in the semiconductor material being treated.
Claim 9
Dependent Claim 16 words
A fused quartz vessel as in claim 6 in the shape of a closed-end hollow cylinder.
Claim 10
Dependent Claim 28 words
A fused quartz vessel as in claim 6 wherein that portion or portions of said fused quartz vessel which contain said disperse phase are limited to the closed-ends.
Claim 11
Dependent Claim 22 words
A fused quartz vessel as in claim 7 wherein the central portion of said closed-end cylinder further includes optically clear fused quartz.

References Cited (Backward Citations)

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US4055391A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-03-26 1993-09-25 1994-03-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-03-26 1997-09-25 1998-03-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-03-26 2001-09-25 2002-03-27 $7700.00 Window Closed / Lapsed

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