US4904609A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of making symmetrical blocking high voltage breakdown semiconductor device
Assignee: Fairchild Semiconductor Corp
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Filing: 1988-05-06
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Granted: 1990-02-27
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Expires: 2008-05-06
Abstract
Abstract A symmetrical blocking high breakdown voltage semiconductor device in which the lower junction termination is brought to the upper surface is fabricated by diffusing first and second regions of a first conductivity type into an upper surface of an epitaxial layer of a second conductivity type disposed on a substrate, and forming a groove having sloped sidewalls in the upper surface such that the groove extends through the second diffused region, the epitaxial layer and into the substrate. A thin layer of impurities of the first conductivity type is implanted into the sidewalls, and the impurities are electrically activated to form a low resistivity path that connects the substrate to the second diffused region. Subsequently, the semiconductor device may be separated from the wafer by cutting the wafer at the groove. The manufacturing process enables substantially complete fabrication of a plurality of devices while still in wafer form, thereby avoiding the inconvenience of processing individual dice.
Inventors
- 👤 Victor A. K. Temple
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 15:31
CPC Classifications
H; H10; H10W; H10W74/00; H10W74/10; H10W74/131; H10W74/134; H10D; H10D62/00; H10D62/10; H10D62/102; H10D62/103; H10D62/105; H10D62/106; H10P; H10P54/00; Y; Y10; Y10S; Y10S148/00; Y10S148/126
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
150 words
A method of fabricating a symmetrical blocking high breakdown voltage semiconductor device comprising: providing a substrate of semiconductor material of a first conductivity type having thereon an epitaxial layer of a second conductivity type; forming first and second laterally spaced regions of the first conductivity type in an upper surface of the epitaxial layer, the first and second regions forming with the layer respective first and second PN junctions; forming a groove having a sloped sidewall in the second region, the groove extending from the upper surface through the second region and the epitaxial layer into the substrate; implanting impurities of the first conductivity type into the sidewall of the groove to form a thin implanted layer of the first conductivity type; and annealing the device sufficiently to activate the impurities in the implanted layer to form a low resistivity path that electrically connects the second region to the substrate.
Claim 2
Independent Claim
150 words
A method of fabricating a symmetrical blocking high breakdown voltage semiconductor device comprising: providing a substrate of semiconductor material of a first conductivity type having thereon an epitaxial layer of a second conductivity type; forming first and second laterally spaced regions of the first conductivity type in an upper surface of the epitaxial layer, the first and second regions forming with the layer respective first and second PN junctions; forming a groove having a sloped sidewall in the second region, the groove extending from the upper surface through the second region and the epitaxial layer into the substrate; implanting impurities of the first conductivity type into the sidewall of the groove to form a thin implanted layer of the first conductivity type; and annealing the device sufficiently to activate the impurities in the implanted layer to form a low resistivity path that electrically connects the second region to the substrate.
Claim 3
Dependent Claim
29 words
The method of claim 1 wherein said first and second regions are formed by diffusing impurities of the first conductivity type through the upper surface of the epitaxial layer.
Claim 4
Dependent Claim
52 words
The method of claim 1 wherein the step of implanting impurities of the first conductivity type into the sidewall of the groove comprises implanting a high concentration of said impurities in the sidewall, and the step of annealing the device comprises heating the device at a low temperature for a predetermined interval.
Claim 5
Dependent Claim
39 words
The method of claim 1 further comprising metalizing the upper surface of the epitaxial layer at said first diffused region to form a first electrical contact, and metalizing an underside of said substrate to form a second electrical contact.
Claim 6
Dependent Claim
29 words
The method of claim 1 wherein said substrate comprises a semiconductor wafer, said method further comprising the final step of separating said device from the wafer at said groove.
Claim 7
Dependent Claim
36 words
The method of claim 1 wherein the step of implanting impurities of the first conductivity type into the sidewall of the groove is performed to implant a charge in excess of 3×10 12 /cm 2 .
Claim 8
Dependent Claim
22 words
The method of claim 1 further comprising terminating the first and second PN junctions to achieve high voltage breakdown and symmetrical blocking.
Claim 9
Dependent Claim
38 words
The method of claim 7 wherein the step of terminating the first and second PN junctions comprises diffusing a plurality of field rings into the upper surface of the epitaxial layer to separate the first and second regions.
Claim 10
Dependent Claim
20 words
The method of claim 7 further comprising passivating the upper surface of the epitaxial layer prior to forming said groove.
Claim 11
Dependent Claim
49 words
The method of claim 9 wherein the step of forming said groove comprises forming a V-shaped groove through the upper surface of the epitaxial layer such that a tip of the groove extends into the substrate, and subjecting the groove to a chemical etch to restore sidewall surface quality.
Claim 12
Dependent Claim
33 words
The method of claim 7 wherein the step of terminating the first and second PN junctions comprises adding a junction termination extension at each side of each of said first and second regions.
Claim 13
Dependent Claim
30 words
The method of claim 11 wherein said junction termination extension comprises a diffusion of impurities of the first conductivity type having a lateral concentration gradient and a depth concentration gradient.
Claim 14
Dependent Claim
38 words
The method of claim 12 including the step of diffusing field stop impurities of the second conductivity type into said epitaxial layer between the junction termination extensions at each side of each of said first and second regions.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-02-26 | 1993-08-28 | 1994-02-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-02-26 | 1997-08-28 | 1998-02-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-02-26 | 2001-08-28 | 2002-02-27 | $7700.00 | Window Closed / Lapsed |