Patent US4902131A successfully refreshed from Google Patents.
US4902131A
Expired / Lapsed
US
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Surface inspection method and apparatus therefor
Assignee: Toshiba Corp
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Filing: 1986-03-27
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Granted: 1990-02-20
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Expires: 2006-03-27
Abstract
Abstract A novel technique suitable for inspection or examination of the surface condition of a substrate such as a semiconductor wafer. First is one irradiates a light e.g. a laser beam on a substrate surface to focus a scattered light therefrom. Next detects the scattered light focused e.g. with a photomultiplier tube, thus to inspect the substrate surface. When the detection of the scattered light is thus carried out, correction means e.g. a circuit for controlling a voltage applied to the photomultiplier tube, a filter having a variable light-screening factor, a movable iris or an amplification factor adjustment circuit etc. is used to correct the detection sensitivity in accordance with the reflectivity of the substrate surface. Practically, such a corrective operation is carried out on the basis of the intensity of a scattered light or a regularly reflected light from the substrate surface. Further, it may be possible to obtain a signal for control of the corrective operation by averaging signals detected when the substrate surface is subject to scanning of an irradiating light. Thus, this surface inspection technique can detect particles attached on the substrate surface always utilizing the same slice level and the same sensitivity even when substrates having different indices of reflection are employed.
Inventors
- 👤 Yuichiro Yamazaki
- 👤 Motosuke Miyoshi
- 👤 Shigeru Ogawa
- 👤 Katsuya Okumura
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 19:35
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/17; G01N21/47; G01N21/4738; G01N21/84; G01N21/88; G01N21/94; G01N21/95; G01N21/9501
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
101 words
A method of inspecting a substrate surface having a known reflectivity to detect the diameters of particles on the substrate surface, comprising the steps of: irradiating light on said substrate surface, collecting scattered light from said particles, detecting said scattered light collected, and compensating for detection sensitivity of said scattered light in accordance with a compensation control signal on the basis of intensity of said scattered light from said particles corresponding to reflectivity of said substrate surface so that the particle diameters on the substrates can be detected correctly even when the reflectivities of the substrate surface differ from a standard.
Claim 2
Independent Claim
101 words
A method of inspecting a substrate surface having a known reflectivity to detect the diameters of particles on the substrate surface, comprising the steps of: irradiating light on said substrate surface, collecting scattered light from said particles, detecting said scattered light collected, and compensating for detection sensitivity of said scattered light in accordance with a compensation control signal on the basis of intensity of said scattered light from said particles corresponding to reflectivity of said substrate surface so that the particle diameters on the substrates can be detected correctly even when the reflectivities of the substrate surface differ from a standard.
Claim 3
Dependent Claim
29 words
A method according to claim 1, wherein said correction control signal is obtained by averaging signals detected when said substrate surface is subject to scanning of said irradiating light.
Claim 4
Independent Claim
103 words
A method of inspecting a substrate surface having a known reflectivity to detect the diameters of particles on the substrate surface, comprising the steps of: irradiating light on said substrate surface; collecting scattered light from said substrate surface, detecting said scattered light collected, and compensating for detection sensitivity of said scattered light in accordance with a compensation control signal on the basis of intensity of regularly reflected light from said substrate surface corresponding to reflectivity of said substrate surface so that the particle diameters on the substrates can be detected correctly even when the reflectivities of the substrate surface differ from each other.
Claim 5
Independent Claim
103 words
A method of inspecting a substrate surface having a known reflectivity to detect the diameters of particles on the substrate surface, comprising the steps of: irradiating light on said substrate surface; collecting scattered light from said substrate surface, detecting said scattered light collected, and compensating for detection sensitivity of said scattered light in accordance with a compensation control signal on the basis of intensity of regularly reflected light from said substrate surface corresponding to reflectivity of said substrate surface so that the particle diameters on the substrates can be detected correctly even when the reflectivities of the substrate surface differ from each other.
Claim 6
Dependent Claim
29 words
A method according to claim 3, wherein said compensation control signal is obtained by averaging signals detected when said substrate surface is subject to scanning of said irradiating light.
Claim 7
Independent Claim
134 words
An apparatus for inspecting a substrate surface, having a known reflectivity to detect the diameters of particles on the substrate surface, comprising: a light source irradiating light on said substrate surface, means for collecting scattered light from said particles, a photomultiplier tube for detecting said scattered light collected by said collecting means, a detector circuit for detecting an amplitude of said scattered light, means for outputting a compensation control signal corresponding to said reflectivity of said substrate surface on the basis of intensity of said scattered light from said substrate surface, and means for compensating for detection sensitivity of said photomultiplier tube in accordance with reflectivity of said substrate surface, so that the particle diameters on the substrates can be detected correctly even when the reflectivities of the substrate surfaces differ from each other.
Claim 8
Independent Claim
134 words
An apparatus for inspecting a substrate surface, having a known reflectivity to detect the diameters of particles on the substrate surface, comprising: a light source irradiating light on said substrate surface, means for collecting scattered light from said particles, a photomultiplier tube for detecting said scattered light collected by said collecting means, a detector circuit for detecting an amplitude of said scattered light, means for outputting a compensation control signal corresponding to said reflectivity of said substrate surface on the basis of intensity of said scattered light from said substrate surface, and means for compensating for detection sensitivity of said photomultiplier tube in accordance with reflectivity of said substrate surface, so that the particle diameters on the substrates can be detected correctly even when the reflectivities of the substrate surfaces differ from each other.
Claim 9
Dependent Claim
30 words
An apparatus according to claim 5, wherein said compensation control signal outputting means is operative to output the compensation control signal obtained by averaging detection signals from said detector circuit.
Claim 10
Dependent Claim
26 words
An apparatus according to claim 5, wherein said compensating means is operative to compensate said detection sensitivity by adjusting an applied voltage to said photomultiplier tube.
Claim 11
Dependent Claim
27 words
An apparatus according to claim 5, wherein said compensating means is comprised of a filter having a variable light-screening factor provided in front of said photomultiplier tube.
Claim 12
Dependent Claim
22 words
An apparatus according to claim 5, wherein said compensating means is comprised of a movable iris provided in front of said photomultiplier.
Claim 13
Dependent Claim
22 words
An apparatus according to claim 5, wherein said compensating means is comprised of means for adjusting amplification factor of said detector circuit.
Claim 14
Independent Claim
146 words
An apparatus for inspecting a substrate surface having a known reflectivity to detect the diameters of particles on the substrate surface, comprising: a light source irradiating light on said substrate surface, means for collecting scattered light from said substrate surface, a photomultiplier tube for detecting said scattered light collected by said collecting means, and a detector circuit for detecting amplitude of said scattered light, means for outputting a compensation control signal corresponding to said reflectivity of said substrate surface on the basis of intensity of a regularly reflected light from said substrate surface, a detector circuit for detecting amplitude of said scattered light, means for compensating a detection sensitivity of said photomultiplier tube in accordance with a reflectivity of said substrate surface, so that the particle diameters on the substrates can be detected correctly even when the reflectivities of the substrate surfaces differ from each other.
Claim 15
Independent Claim
146 words
An apparatus for inspecting a substrate surface having a known reflectivity to detect the diameters of particles on the substrate surface, comprising: a light source irradiating light on said substrate surface, means for collecting scattered light from said substrate surface, a photomultiplier tube for detecting said scattered light collected by said collecting means, and a detector circuit for detecting amplitude of said scattered light, means for outputting a compensation control signal corresponding to said reflectivity of said substrate surface on the basis of intensity of a regularly reflected light from said substrate surface, a detector circuit for detecting amplitude of said scattered light, means for compensating a detection sensitivity of said photomultiplier tube in accordance with a reflectivity of said substrate surface, so that the particle diameters on the substrates can be detected correctly even when the reflectivities of the substrate surfaces differ from each other.
Claim 16
Dependent Claim
55 words
An apparatus according to claim 11, wherein said means for outputting a compensation control signal is provided with a second detector means for detecting a regularly reflected light from said substrate surface, said compensation control signal means being operative to output the compensation control signal obtained by averaging detection signals from said second detector means.
Claim 17
Dependent Claim
21 words
An apparatus according to claim 11, wherein said apparatus further comprises a second photomultiplier tube for detecting said regularly reflected light.
Claim 18
Dependent Claim
26 words
An apparatus according to claim 11, wherein said compensating means is operative to compensate said detection sensitivity by adjusting an applied voltage to said photomultiplier tube.
Claim 19
Dependent Claim
27 words
An apparatus according to claim 11, wherein said compensating means is comprised of a filter having a variable light-screening factor provided in front of said photomultiplier tube.
Claim 20
Dependent Claim
23 words
An apparatus according to claim 11, wherein said compensating means is comprised of a movable iris provided in front of said photomultiplier tube.
Claim 21
Dependent Claim
23 words
An apparatus according to claim 11, wherein said compensating means is comprised of means for adjusting the amplification factor of said detector circuit.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1993-02-19 | 1993-08-21 | 1994-02-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-02-19 | 1997-08-21 | 1998-02-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-02-19 | 2001-08-21 | 2002-02-20 | $7700.00 | Window Closed / Lapsed |