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Manufacturing method for integrated resonator

Assignee: Murata Manufacturing Co Ltd
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Filing: 1988-10-07
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Granted: 1990-01-02
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Expires: 2008-10-07
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Abstract

Abstract A manufacturing method for an integrated resonator is disclosed wherein a mass of O + ions are implanted into a silicon monocrystal substrate from one side thereof, a buried SiO 2 layer is formed by annealing the ion implanted substrate, an SiO 2 layer is formed on the surface of the substrate by oxidizing it, at least one slit is formed on the SiO 2 layer for etching a predetermined area of the silicon monocrystal layer sandwich between two SiO 2 layers to form a cavity and, a piezo-electric resonator is formed on an area of the surfacial SiO 2 layer corresponding to the cavity in the substrate.

Inventors

  • 👤 Susumu Fukuda
  • 👤 Hisashi Ariyoshi
  • 👤 Toru Kasanami

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 11:54
CPC Classifications
H; H03; H03H; H03H9/00; H03H9/15; H03H9/17; H03H9/171; H03H9/172; H03H9/173; H03H3/00; H03H3/007; H03H3/02; H03H2003/021; Y; Y10; Y10T; Y10T29/00; Y10T29/42

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 121 words
A manufacturing method for an integrated resonator comprising the following steps: (a) implanting O + ions into a silicon monocrystal substrate from one side thereof, (b) annealing the ion implanted substrate to form a buried SiO 2 layer therein, (c) oxidizing the surface of the substrate to form an SiO 2 layer thereon, (d) forming at least one slit on the SiO 2 layer formed by step (c), (e) etching an area of the silicon monocrystal layer defined between the SiO 2 layer and the buried SiO 2 layer through the at least one slit to form a cavity therein, and (f) forming a piezo-electric resonator on an area of the SiO 2 layer corresponding to the cavity formed by etching.
Claim 2
Dependent Claim 121 words
A manufacturing method for an integrated resonator comprising the following steps: (a) implanting O + ions into a silicon monocrystal substrate from one side thereof, (b) annealing the ion implanted substrate to form a buried SiO 2 layer therein, (c) oxidizing the surface of the substrate to form an SiO 2 layer thereon, (d) forming at least one slit on the SiO 2 layer formed by step (c), (e) etching an area of the silicon monocrystal layer defined between the SiO 2 layer and the buried SiO 2 layer through the at least one slit to form a cavity therein, and (f) forming a piezo-electric resonator on an area of the SiO 2 layer corresponding to the cavity formed by etching.

References Cited (Backward Citations)

US3912563A Cited
US4556812A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-01-01 1993-07-03 1994-01-02 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-01-01 1997-07-03 1998-01-02 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-01-01 2001-07-03 2002-01-02 $7700.00 Window Closed / Lapsed

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