Patent US4889609A successfully refreshed from Google Patents.
US4889609A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Continuous dry etching system
Assignee: OIS Optical Imaging Systems Inc
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Filing: 1988-09-06
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Granted: 1989-12-26
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Expires: 2008-09-06
Abstract
Abstract A system and method for dry etching an etchable material from a substrate, are disclosed. The system includes an etching chamber including means for establishing a dry etching process therein, a substrate chamber for storing the substrate, and transport means for advancing the substrate from the substrate chamber to the etching chamber. First coupling means couple the interior of the substrate chamber to the interior of the etching chamber to provide an opened passageway therebetween during the etching process. The transport means preferably continuously advances the substrate from the substrate chamber to the etching chamber. Also disclosed are means for maintaining unidirectional gas flow from the substrate chamber to the etching chamber to isolate the etching process from the substrate chamber.
Inventors
- 👤 Vincent D. Cannella
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 08:52
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/30; H10P72/34; H10P72/3411; H10P72/04; H10P72/0402; H10P72/0418; H10P72/0421
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
147 words
A system for dry etching an etchable material from a substrate, said system comprising: an etching chamber including means for establishing a dry etching process therein from a first etching process gas for dry etching said etchable material from said substrate; a substrate chamber including means for storing said substrate and means for receiving at least a second gas; first coupling means for coupling the interior of said substrate chamber with the interior of said etching chamber to provide a passageway therebetween for said substrate, said passageway being adopted to remain open during the dry etching of said etchable material from said substrate; transport means for advancing said substrate from said substrate chamber into said etching chamber through said first coupling means; and means for maintaining substantially unidirectional gas flow of said second gas through said first coupling means from said substrate chamber to said etching chamber.
Claim 2
Independent Claim
147 words
A system for dry etching an etchable material from a substrate, said system comprising: an etching chamber including means for establishing a dry etching process therein from a first etching process gas for dry etching said etchable material from said substrate; a substrate chamber including means for storing said substrate and means for receiving at least a second gas; first coupling means for coupling the interior of said substrate chamber with the interior of said etching chamber to provide a passageway therebetween for said substrate, said passageway being adopted to remain open during the dry etching of said etchable material from said substrate; transport means for advancing said substrate from said substrate chamber into said etching chamber through said first coupling means; and means for maintaining substantially unidirectional gas flow of said second gas through said first coupling means from said substrate chamber to said etching chamber.
Claim 3
Dependent Claim
102 words
A system as defined in claim 1 wherein said substrate chamber is a substrate load chamber; said system further comprises a substrate unload chamber including means for receiving at least a third gas, second coupling means for coupling said unload chamber to said etching chamber, and means for maintaining unidirectional gas flow through said coupling means of said third gas from said unload chamber to said etching chamber; and said transport means further being adapted for advancing said substrate through said second coupling means from said etching chamber to said unload chamber after said etchable material has been etched from said substrate.
Claim 4
Dependent Claim
54 words
A system as defined in claim 2 wherein said means for maintaining unidirectional gas flow include means for maintaining unidirectional flow of said second and third gases at a flow rate to provide a concentration ratio of said etching species from said etching chamber to said load and unload chambers of at least 100.
Claim 5
Dependent Claim
20 words
A system as defined in claim 2 wherein one of said second or third gas is an etching process gas.
Claim 6
Dependent Claim
42 words
A system as defined in claim 2 wherein said means for maintaining unidirectional gas flow include pressure control means for maintaining said etching chamber at a lower internal pressure than the internal pressure of said load chamber and of said unload chamber.
Claim 7
Dependent Claim
23 words
A system as defined in claim 5 wherein said pressure control means comprises a separate pressure control pump coupled to said etching chamber.
Claim 8
Dependent Claim
45 words
A system as defined in claim 2 wherein said load chamber includes means for storing a plurality of said substrates and wherein said transport means are arranged for feeding said substrates into said etching chamber one at a time in succession from said load chamber.
Claim 9
Dependent Claim
23 words
A system as defined in claim 7 wherein said unload chamber includes substrate collecting means for receiving said substrates from said etching chamber.
Claim 10
Dependent Claim
35 words
A system as defined in claim 1 wherein said transport means are adapted to remove said substrate from said etching chamber after said etchable material has been etched from said substrate in said etching chamber.
Claim 11
Dependent Claim
21 words
A system as defined in claim 9 wherein said transport means are adapted to return said substrate to said substrate chamber.
Claim 12
Dependent Claim
120 words
A system as defined in claim 1 wherein said substrate chamber is a substrate load chamber, and said system further comprises a substrate unload chamber, and second coupling means for coupling said substrate unload chamber to said etching chamber to provide a passageway therebetween for said substrate, said passageway being adapted to remain open during the dry etching of said etchable material from said substrate, and wherein said transport means being adapted for continuously advancing said substrate from said load chamber into said etching chamber to permit said dry etching process to etch said etchable material and for continuously advancing said substrate from said etching chamber to said unload chamber after said etchable material has been etched from said substrate.
Claim 13
Dependent Claim
36 words
A system as defined in claim 1 wherein said etching chamber includes means for establishing a glow discharge based dry etching process selected from the group consisting of plasma etching, reactive ion etching, and sputter etching.
Claim 14
Dependent Claim
16 words
A system as defined in claim 12 wherein said dry etching process is reactive ion etching.
Claim 15
Dependent Claim
38 words
A system as defined in claim 1 wherein said etching chamber includes means for establishing an ion-beam based dry etching process selected from the group consisting of ion milling, chemically assisted ion milling, and reactive ion beam etching.
Claim 16
Dependent Claim
29 words
A system as defined in claim 1 wherein said transport means are arranged for continuously advancing said substrate during the dry etching of said substrate in said etching chamber.
Claim 17
Dependent Claim
64 words
A system as defined in claim 1 wherein said means for establishing said dry etching process includes a main electrode adapted to receive radio frequency energy and a counter electrode spaced from said main electrode, and wherein said transport means are arranged to advance said substrate along a path immediately adjacent to said main electrode and between said main electrode and said counter electrode.
References Cited (Backward Citations)
US4587002A
Cited
US4816638A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-12-25 | 1993-06-26 | 1993-12-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-12-25 | 1997-06-26 | 1997-12-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-12-25 | 2001-06-26 | 2001-12-26 | $7700.00 | Window Closed / Lapsed |