Circuit configuration for monitoring a semiconductor structural element and providing a signal when the temperature exceeds a predetermined level
Abstract
Abstract A circuit for monitoring the temperature of a semiconductor structural component. The circuit includes a bipolar transistor (1) in thermal contact with a semiconductor structural element to be monitored, and a MOSFET (11) connected in series with a current source (12). The MOSFET (11) is maintained in a nonconducting state with two Zener diodes (13, 14) if the bipolar transistor (1) is the standard operating temperature of the semiconductor structural element. This circuit provides for a reduced zero current signal. The current flowing through the bipolar transistor (1) increases with temperature and the gate-source voltage of the MOSFET (11) is increases until it switches off. If the current flowing through the MOSFET (11) is greater than the impressed current of the current source (12) the potential across the current source takes a step increase a value near the supply voltage (V DD ). This voltage step can then be detected as an excess-temperature signal.
Inventors
- 👤 Ludwig Leipold
- 👤 Rainald Sander
- 👤 Jenoe Tihanyi
- 👤 Roland Weber
Bibliographic Details
Claims Analysis
Total Claims: 7References Cited (Backward Citations)
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