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US4872046A Expired / Lapsed US ⏱️ 0.0 years remaining

Heterojunction semiconductor device with <001> tilt

Assignee: University of Illinois at Urbana-Champaign
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Filing: 1987-09-01
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Granted: 1989-10-03
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Expires: 2007-09-01
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Abstract

Abstract A method is disclosed of epitaxially depositing a semiconductor material on a substrate of different material while accommodating lattice mismatch in a manner that results in improved epitaxially deposited material. In a disclosed embodiment GaAs is epitaxially deposited by molecular beam epitaxy on a silicon substrate having a {100} crystallographic surface tilted in the <001> direction. Improved semiconductor devices, made using the disclosed technique, are also set forth.

Inventors

  • 👤 Hadis Morkoc
  • 👤 Russ Fischer

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 11:29
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/40; H10D62/405; H10P; H10P14/00; H10P14/20; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/2926; H10P14/32; H10P14/3202; H10P14/3214; H10P14/3221; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3421

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 53 words
A semiconductor device, comprising: a single crystalline substrate selected from the group consisting of silicon and germanium having a {100} crystallographic surface tilted in the <001>direction; at least one layer of III-V semiconductor material disposed over said surface; and a transistor device formed in said at least one layer of III-V semiconductor material.
Claim 2
Dependent Claim 53 words
A semiconductor device, comprising: a single crystalline substrate selected from the group consisting of silicon and germanium having a {100} crystallographic surface tilted in the <001>direction; at least one layer of III-V semiconductor material disposed over said surface; and a transistor device formed in said at least one layer of III-V semiconductor material.
Claim 3
Dependent Claim 29 words
The semiconductor device as defined by claim 1, wherein said substrate is silicon and said at least one layer of III-V semiconductor material includes a layer of gallium arsenide.
Claim 4
Dependent Claim 19 words
The semiconductor device as defined by claim 2, wherein the angle of the tilt is at least 2.29 degrees.
Claim 5
Dependent Claim 16 words
The semiconductor device as defined by claim 1, wherein said transistor device is a field-effect transistor.
Claim 6
Dependent Claim 16 words
The semiconductor device as defined by claim 2, wherein said transistor device is a field-effect transistor.
Claim 7
Dependent Claim 16 words
The semiconductor device as defined by claim 3, wherein said transistor device is a field-effect transistor.
Claim 8
Dependent Claim 16 words
The semiconductor device as defined by claim 1, wherein said transistor device is a bipolar transistor.
Claim 9
Dependent Claim 16 words
The semiconductor device as defined by claim 2, wherein said transistor device is a bipolar transistor.
Claim 10
Dependent Claim 16 words
The semiconductor device as defined by claim 3, wherein said transistor device is a bipolar transistor.
Claim 11
Dependent Claim 53 words
A semiconductor device, comprising: a single crystalline substrate selected from the group consisting of silicon and germanium having a crystallographic surface tilted in the <001> direction; at least one layer of III-V semiconductor material disposed over said surface; and a light-emitting device formed in said at least one layer of III-V semiconductor material.
Claim 12
Dependent Claim 53 words
A semiconductor device, comprising: a single crystalline substrate selected from the group consisting of silicon and germanium having a crystallographic surface tilted in the <001> direction; at least one layer of III-V semiconductor material disposed over said surface; and a light-emitting device formed in said at least one layer of III-V semiconductor material.
Claim 13
Dependent Claim 29 words
The semiconductor device as defined by claim 10, wherein said substrate is silicon and said at least one layer of III-V semiconductor material includes a layer of gallium arsenide.
Claim 14
Dependent Claim 19 words
The semiconductor device as defined by claim 11, wherein the angle of the tilt is at least 2.29 degrees.

References Cited (Backward Citations)

US3476592A Cited
US3920492A Cited
JPS5922320A Cited
JPS5922319A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-10-02 1993-04-03 1993-10-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-10-02 1997-04-03 1997-10-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-10-02 2001-04-03 2001-10-03 $7700.00 Window Closed / Lapsed

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