Patent US3354047A successfully refreshed from Google Patents.
Patent US4870356A successfully refreshed from Google Patents.
US4870356A
Expired / Lapsed
US
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Multi-component test fixture
Assignee: Hewlett Packard Development Co LP
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Filing: 1989-03-08
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Granted: 1989-09-26
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Expires: 2009-03-08
Abstract
Abstract A universal test fixture for electrically connecting a plurality of component pins to compute test logic without the need for specialized sockets is described. The test fixture comprises a planar dielectric substrate having a multi-conductor pattern on the top surface comprising a plurality of equal width, spaced conductor bars, and including electrical conductors for connecting the spaced conductor bars to test logic. Also provided is a resiliently deformable member or material for compensating for varying planarity between the tips of the component pins to be tested.
Inventors
- 👤 Harvey C. Tingley
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 08:55
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/0735
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
154 words
An universal test fixture capable of testing components of different sizes having pins at various spacings and configurations by electrically connecting a plurality of component pins to test logic, comprising: (a) a substantially planar dielectric substrate having a multi-conductor pattern on the top surface thereof, said pattern defining a test area and comprising a plurality of spaced conductor bars having widths and spacings substantially less than the width and spacings of the component pins to be tested said conductor bars spanning a substantial portion of the test area; (b) positioning indicia means for repeatedly positioning a component over said pattern at a pre-established position; (c) means for connecting said spaced conductor bars to test logic which is precalibrated for each different component to be tested in accordance with its pre-established test position and the conductors contacted by the component leads; and (d) means for compensating for varying planarity between the tips of component pins.
Claim 2
Dependent Claim
154 words
An universal test fixture capable of testing components of different sizes having pins at various spacings and configurations by electrically connecting a plurality of component pins to test logic, comprising: (a) a substantially planar dielectric substrate having a multi-conductor pattern on the top surface thereof, said pattern defining a test area and comprising a plurality of spaced conductor bars having widths and spacings substantially less than the width and spacings of the component pins to be tested said conductor bars spanning a substantial portion of the test area; (b) positioning indicia means for repeatedly positioning a component over said pattern at a pre-established position; (c) means for connecting said spaced conductor bars to test logic which is precalibrated for each different component to be tested in accordance with its pre-established test position and the conductors contacted by the component leads; and (d) means for compensating for varying planarity between the tips of component pins.
Claim 3
Dependent Claim
47 words
A test fixture according to claim 1, wherein the means for compensating for varying planarity between the tips of component pins comprises a resiliently deformable material disposed over said pattern at least in part and in contact therewith, said deformable material being selectively electrically conductive upon compression.
Claim 4
Dependent Claim
21 words
A test fixture according to claim 1, wherein the compensating means comprises a resiliently flexible dielectric material underlying said multi-conductor pattern
Claim 5
Dependent Claim
37 words
A test fixture according to claim 1, wherein said pattern comprises a plurality of spaced cantilevered conductor bars, said cantilevered bars having adequate movement and deflection to compensate for varying planarity between the tips of component pins.
Claim 6
Dependent Claim
101 words
A test fixture according to claim 2, wherein: said multi-conductor pattern comprises first, second, third and fourth pluralities of said equal width, spaced conductor bars, said first, second, third and fourth pluralities each being configured as wedge shaped patterns disposed radially at 90° non-contacting orientations to one another with said conductor bars of said first and third pluralities parallel to one another and said conductor bars of said second and fourth pluralities parallel to one another whereby the tips of component pins lying substantially along lines forming a rectangle in a common plane can be electrically contacted with the test fixture.
Claim 7
Dependent Claim
16 words
A test fixture according to claim 2, wherein said resiliently deformable material comprises a metal-filled elastomer.
Claim 8
Dependent Claim
34 words
A test fixture according to claim 4, wherein said multi-conductor pattern is formed of a resiliently flexible spring metal and wherein said dielectric substrate is undercut in part under portions of said conductor bars.
Claim 9
Dependent Claim
19 words
A test fixture according to claim 4, wherein said dielectric substrate is sliced in part between adjacent conductor bars.
Claim 10
Dependent Claim
62 words
A test fixture according to claim 1, wherein: said multi-conductor pattern comprises a first plurality of said equal width, spaced conductor bars and a second plurality of said equal width, spaced conductor bars disposed side-by-side in non-contacting relationship whereby the tips of component pins lying substantially along two parallel lines in a common plane can be electrically contacted with the test fixture.
Claim 11
Dependent Claim
101 words
A test fixture according to claim 1, wherein: said multi-conductor pattern comprises first, second, third and fourth pluralities of said equal width, spaced conductor bars, said first, second, third and fourth pluralities each being configured as wedge shaped patterns disposed radially at 90° non-contacting orientations to one another with said conductor bars of said first and third pluralities parallel to one another and said conductor bars of said second and fourth pluralities parallel to one another whereby the tips of component pins lying substantially along lines forming a rectangle in a common plane can be electrically contacted with the test fixture.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-09-25 | 1993-03-27 | 1993-09-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-09-25 | 1997-03-27 | 1997-09-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-09-25 | 2001-03-27 | 2001-09-26 | $7700.00 | Window Closed / Lapsed |