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US4868494A
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Methods and apparatus for frequency response analysis
Assignee: Gemalto Terminals Ltd
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Filing: 1988-02-08
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Granted: 1989-09-19
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Expires: 2008-02-08
Abstract
Abstract In a frequency response analyser for operation at high frequencies a signal of frequency F for application to a system under test (15) is generated from a frequency synthesizer (11) capable of operation only at a relatively lower frequency F/K by generating a first signal (19) of frequency at the relatively lower frequency F/K by generating a second signal 104 at the relatively higher frequency (f+F) and generating a third signal (at 114) or F(1--1/K). The second signal is applied to the system under test and an output signal (at 16) derived therefrom. The output is multiplied by the third signal to provide a product signal, and the product signal is analyzed with respect to first signal by means of a correlator 14. The present invention overcomes the limitation in maximum testing frequency imposed by the frequency synthesizers of prior art frequency response analyzers.
Inventors
- 👤 Alan Ryder
- 👤 Brian Sayers
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 01:54
CPC Classifications
G; G01; G01R; G01R23/00; G01R23/16
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
177 words
A method for testing the response of a system under test at a test frequency F using a frequency response analyzer having a correlator having a signal input and a reference input and a frequency synthesizer capable of generating an analyzing signal at a frequency proportional in frequency to F/K, where F/K is lower in frequency than F, including the steps of: generating a first signal proportional in frequency to said lower frequency F/K by means of said synthesizer, deriving from said first signal a second signal at said test frequency F, deriving from said first signal a third signal at a frequency proportional to F(1-1/K), applying said second signal as an excitation signal to said system under test, deriving an output signal from said systems under test in response to said excitation signal, multiplying said output signal by said third signal to derive a product signal, and applying said product signal to said correlator signal input and applying said first signal of frequency proportional to F/K to said correlator reference input, to thereby test said response.
Claim 2
Independent Claim
177 words
A method for testing the response of a system under test at a test frequency F using a frequency response analyzer having a correlator having a signal input and a reference input and a frequency synthesizer capable of generating an analyzing signal at a frequency proportional in frequency to F/K, where F/K is lower in frequency than F, including the steps of: generating a first signal proportional in frequency to said lower frequency F/K by means of said synthesizer, deriving from said first signal a second signal at said test frequency F, deriving from said first signal a third signal at a frequency proportional to F(1-1/K), applying said second signal as an excitation signal to said system under test, deriving an output signal from said systems under test in response to said excitation signal, multiplying said output signal by said third signal to derive a product signal, and applying said product signal to said correlator signal input and applying said first signal of frequency proportional to F/K to said correlator reference input, to thereby test said response.
Claim 3
Dependent Claim
44 words
A method for testing the response of a system under test as claimed in claim 1 and including the steps of generating a fourth signal of frequency proportional to F/K, and multiplying the second and fourth signals together to thereby derive the third signal.
Claim 4
Dependent Claim
77 words
A method for testing the response of a system under test as claimed in claim 1 and wherein the second signal is derived by means of providing a first phase locked loop comprising a voltage controlled oscillator generating said second signal, a feedback divider having a division ratio of 1:1/K, and a phase sensitive detector for comparing the feedback divider signal with the synthesized signal and which generates an error signal to control the voltage controlled oscillator.
Claim 5
Dependent Claim
28 words
A method for testing the response of a system under test as claimed in claim 1 and wherein second and fourth signals are offset by a frequency f.
Claim 6
Dependent Claim
35 words
A method for testing the response of a system under test as claimed in claim 1 and wherein said signal of frequency proportional to F/K applied to said correlator reference input is said first signal.
Claim 7
Dependent Claim
180 words
Apparatus for testing the response of a system under test at a test frequency F including a frequency response analyzer having a correlator having a signal input and a reference input and a frequency synthesizer capable of generating an analyzing signal at a frequency proportional to F/K, where F/K is lower in frequency than F, said synthesizer generating a first signal proportional in frequency to said lower frequency F/K, further including: means for deriving from said first signal a second signal at said test frequency F, means for deriving from said first signal a third signal at a frequency proportional to F(1-1/K), means for applying said second signal as an excitation signal to said system under test, means for deriving an output signal from said system under test in response to said excitation, means for multiplying said output signal by said third signal to derive a product signal, and said correlator receiving said product signal at said signal input and a signal derived from said synthesizer of frequency proportional to F/K at said reference input, to thereby test said response.
Claim 8
Dependent Claim
180 words
Apparatus for testing the response of a system under test at a test frequency F including a frequency response analyzer having a correlator having a signal input and a reference input and a frequency synthesizer capable of generating an analyzing signal at a frequency proportional to F/K, where F/K is lower in frequency than F, said synthesizer generating a first signal proportional in frequency to said lower frequency F/K, further including: means for deriving from said first signal a second signal at said test frequency F, means for deriving from said first signal a third signal at a frequency proportional to F(1-1/K), means for applying said second signal as an excitation signal to said system under test, means for deriving an output signal from said system under test in response to said excitation, means for multiplying said output signal by said third signal to derive a product signal, and said correlator receiving said product signal at said signal input and a signal derived from said synthesizer of frequency proportional to F/K at said reference input, to thereby test said response.
Claim 9
Independent Claim
129 words
A method of testing the response of a system under test of a test frequency F, comprising the steps of: generating a first signal proportional to a frequency F/K that is lower than said test frequency F; deriving from said first signal a second signal at said test frequency F; deriving from said first signal a third signal at a frequency proportional to F(1-1/K), applying said second signal as an excitation signal to said system under test, deriving an output signal from said system under test in response to said excitation signal; and multiplying said output signal by said third signal to obtain a product signal, and correlating said product signal and said first signal to obtain an output signal indicative of said response of said system under test.
Claim 10
Independent Claim
129 words
A method of testing the response of a system under test of a test frequency F, comprising the steps of: generating a first signal proportional to a frequency F/K that is lower than said test frequency F; deriving from said first signal a second signal at said test frequency F; deriving from said first signal a third signal at a frequency proportional to F(1-1/K), applying said second signal as an excitation signal to said system under test, deriving an output signal from said system under test in response to said excitation signal; and multiplying said output signal by said third signal to obtain a product signal, and correlating said product signal and said first signal to obtain an output signal indicative of said response of said system under test.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-09-18 | 1993-03-20 | 1993-09-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-09-18 | 1997-03-20 | 1997-09-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-09-18 | 2001-03-20 | 2001-09-19 | $7700.00 | Window Closed / Lapsed |