US4863562A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for forming a non-planar structure on the surface of a semiconductor substrate
Assignee: STMicroelectronics lnc USA
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Filing: 1988-02-11
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Granted: 1989-09-05
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Expires: 2008-02-11
Abstract
Abstract A method for increasing the width of a transistor includes first forming a nitride cap (14) over the substrate (10) and then forming trenches (24) and (26) on either side of the cap (14) and having tapered sidewalls (28) and (30). A conformal layer of nitride (32) is formed over the substrate and then anisotropically etched to form sidewall layers (34) and (36). Field oxide is grown in the trenches with birds beaks (42) and (44) extending upward under the sidewall layers (34) and (36). A portion of the sidewalls (28) and (30) of the trenches remain such that the overall surface area between the edges of the birds beaks (42) and (44) is increased. A layer of strip oxide is then grown on the substrate to provide rounded edges (47) and (49). The strip oxide is then removed by a fifty percent over etch to cause the birds beaks (42) and (44) to recede, thus further increasing the surface area. The gate electrode of a transistor (54) can then be disposed thereacross, thus increasing the width of the transistor for a given silicon surface area in the initial material.
Inventors
- 👤 Frank R. Bryant
- 👤 Fu-Tai Liou
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 23:18
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/61; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/024; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/012; H10W10/10; H10W10/13
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
354 words
A method for increasing the surface area of an active region on a semiconductor substrate, comprising: forming a protective cap that is resistant to oxidation over a select area on the substrate to define a first two-dimensional boundary, the protective cap having a predetermined thickness; forming trenches in the surface of the substrate having a bottom surface and sidewalls that extend downward from the periphery of the first two-dimensional boundary to the bottom surface; forming a protective layer of silicon nitride on the sidewalls of the trenches; thermally growing a layer of thermal oxide in the trenches from the bottom surface upwards such that a birds beak is formed on each of the sidewalls extending upward from the bottom of the associated trench along the sidewall between the sidewall and the protective nitride capping layer such that the birds beak on each of the sidewalls extends only a portion of the way up the sidewall with the outermost edge of the birds beak defining a second boundary below the first two dimensional boundary wherein the surface area of the active region comprises the surface area within the first two-dimensional boundary and the surface area of the portion of the sidewalls not covered by the layer of thermal oxide; removing the silicon nitride layer on the sidewalls and the protective cap; thermally growing a layer of strip oxide over the upper surface of the active region and the exposed semiconductor material on the sidewalls such that semiconductor material is consumed to form the strip oxide layer, the consumption of semiconductor material occurring at a faster rate at the junction between the upper surface of the active region and the sidewalls to provide a rounding of the edge; and removing the strip oxide layer with a wet etch such that the wet etch continues for a period of time exceeding the time to remove the thickness of the strip oxide layer wherein a portion of the birds beak is removed such that the birds beak recedes downward along the sidewalls away from the upper surface of the active region to effectively increase the surface area thereof.
Claim 2
Independent Claim
354 words
A method for increasing the surface area of an active region on a semiconductor substrate, comprising: forming a protective cap that is resistant to oxidation over a select area on the substrate to define a first two-dimensional boundary, the protective cap having a predetermined thickness; forming trenches in the surface of the substrate having a bottom surface and sidewalls that extend downward from the periphery of the first two-dimensional boundary to the bottom surface; forming a protective layer of silicon nitride on the sidewalls of the trenches; thermally growing a layer of thermal oxide in the trenches from the bottom surface upwards such that a birds beak is formed on each of the sidewalls extending upward from the bottom of the associated trench along the sidewall between the sidewall and the protective nitride capping layer such that the birds beak on each of the sidewalls extends only a portion of the way up the sidewall with the outermost edge of the birds beak defining a second boundary below the first two dimensional boundary wherein the surface area of the active region comprises the surface area within the first two-dimensional boundary and the surface area of the portion of the sidewalls not covered by the layer of thermal oxide; removing the silicon nitride layer on the sidewalls and the protective cap; thermally growing a layer of strip oxide over the upper surface of the active region and the exposed semiconductor material on the sidewalls such that semiconductor material is consumed to form the strip oxide layer, the consumption of semiconductor material occurring at a faster rate at the junction between the upper surface of the active region and the sidewalls to provide a rounding of the edge; and removing the strip oxide layer with a wet etch such that the wet etch continues for a period of time exceeding the time to remove the thickness of the strip oxide layer wherein a portion of the birds beak is removed such that the birds beak recedes downward along the sidewalls away from the upper surface of the active region to effectively increase the surface area thereof.
Claim 3
Dependent Claim
20 words
The method of claim 1 wherein the semiconductor material is silicon and the layer of strip oxide is silicon oxide.
Claim 4
Dependent Claim
26 words
The method of claim 1 wherein the wet etch is performed for a duration of time to over-etch the strip oxide layer by approximately fifty percent.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-09-04 | 1993-03-06 | 1993-09-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-09-04 | 1997-03-06 | 1997-09-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-09-04 | 2001-03-06 | 2001-09-05 | $7700.00 | Window Closed / Lapsed |