Non-destructive testing of SOS wafers using surface photovoltage measurements

Claim 1

A method for non-destructive testing of a silicon-on-sapphire wafer using surface photovoltage measurements in a pre-selection process for evaluating the region within about 100A of the silicon-sapphire interface, said method comprising: (i) providing a silicon-on-sapphire wafer for testing, said SOS wafer having a sapphire layer interfaced with a silicon layer; (ii) positioning said wafer so that said sapphire layer will be illuminated first by a predetermined wavelength of incident light from a light source; (iii) providing a light source for emitting a predetermined wavelength of incident light which is capable of being strongly absorbed by said silicon layer after said incident light is transmitted through said sapphire layer; (iv) positioning a first thin iridescent coated glass having a glass substrate with said thin irridescent coating which is a conductive layer comprised of tin oxide and indium tin oxide on one side of said glass substrate; (v) placing one end of a first electrical lead in electrical contact with said first thin irridescent coated glass and extending the other end of said electrical lead to a detection circuit; (vi) positioning a second thin irridescent coated glass having the structure set forth hereinabove so that the glass substrate side of said thin irridescent coated glass is on the silicon outer surface of said silicon-on-sapphire wafer and said conductive layer is faced outwardly from said silicon layer; (vii) placing one end of a second electrical lead in electrical contact with said second thin irridescent coated glass and extending the other end of said electrical lead to a calibration signal source; (viii) directing light from said light source so that said incident light illuminates said conductive layer of said first thin irridescent coated glass, said incident light illuminating said sapphire layer next, and subsequently impinging upon said silicon-sapphire interface wherein said silicon layer absorbs all of the predetermined wavelength within about 100A of said silicon layer as measured from said silicon-sapphire interface; and, (ix) making surface photovoltage measurements and interpreting said photovoltage measurements made in a preselection process for evaluating said silicon-on-sapphire wafer and said region within 100A of said silicon-sapphire interface while said incident light is impinging on said wafer.

Claim 2

A method for non-destructive testing of a silicon-on-sapphire wafer using surface photovoltage measurements in a pre-selection process for evaluating the region within about 100A of the silicon-sapphire interface, said method comprising: (i) providing a silicon-on-sapphire wafer for testing, said SOS wafer having a sapphire layer interfaced with a silicon layer; (ii) positioning said wafer so that said sapphire layer will be illuminated first by a predetermined wavelength of incident light from a light source; (iii) providing a light source for emitting a predetermined wavelength of incident light which is capable of being strongly absorbed by said silicon layer after said incident light is transmitted through said sapphire layer; (iv) positioning a first thin iridescent coated glass having a glass substrate with said thin irridescent coating which is a conductive layer comprised of tin oxide and indium tin oxide on one side of said glass substrate; (v) placing one end of a first electrical lead in electrical contact with said first thin irridescent coated glass and extending the other end of said electrical lead to a detection circuit; (vi) positioning a second thin irridescent coated glass having the structure set forth hereinabove so that the glass substrate side of said thin irridescent coated glass is on the silicon outer surface of said silicon-on-sapphire wafer and said conductive layer is faced outwardly from said silicon layer; (vii) placing one end of a second electrical lead in electrical contact with said second thin irridescent coated glass and extending the other end of said electrical lead to a calibration signal source; (viii) directing light from said light source so that said incident light illuminates said conductive layer of said first thin irridescent coated glass, said incident light illuminating said sapphire layer next, and subsequently impinging upon said silicon-sapphire interface wherein said silicon layer absorbs all of the predetermined wavelength within about 100A of said silicon layer as measured from said silicon-sapphire interface; and, (ix) making surface photovoltage measurements and interpreting said photovoltage measurements made in a preselection process for evaluating said silicon-on-sapphire wafer and said region within 100A of said silicon-sapphire interface while said incident light is impinging on said wafer.

Claim 3

A device for measuring photovoltage for use in a pre-selection process in the non-destructive testing of a silicon-on-sapphire wafer, said device comprising: (i) a light source for emitting a predetermined wavelength of incident light which is capable of being absorbed by the silicon layer within about 100A of the silicon-sapphire interface; (ii) a first thin irridescent coated glass positioned with the coated surface facing said light source, said coated surface being transparent to said predetermined wavelength and said coated surface being conductive; (iii) detection circuitry for measuring voltage indicative of optically stimulated current flow in said wafer, said first thin irridescent coated glass being coupled to said detection circuitry; (iv) a second thin irridescent coated glass and being spaced apart a predetermined distance from said first thin irridescent coated glass positioned with the coated surface of said second thin iridescent glass facing outward with respect to said first thin irridescent coated glass, said spaced apart predetermined distance being able to accommodating a tested silicon-on-sapphire wafer between said thin irridescent coated glasses; and, (v) calibration circuitry for calibrating said device, said second thin irridescent coated glass being coupled to said calibration circuitry.

Claim 4

A device for measuring photovoltage for use in a pre-selection process in the non-destructive testing of a silicon-on-sapphire wafer, said device comprising: (i) a light source for emitting a predetermined wavelength of incident light which is capable of being absorbed by the silicon layer within about 100A of the silicon-sapphire interface; (ii) a first thin irridescent coated glass positioned with the coated surface facing said light source, said coated surface being transparent to said predetermined wavelength and said coated surface being conductive; (iii) detection circuitry for measuring voltage indicative of optically stimulated current flow in said wafer, said first thin irridescent coated glass being coupled to said detection circuitry; (iv) a second thin irridescent coated glass and being spaced apart a predetermined distance from said first thin irridescent coated glass positioned with the coated surface of said second thin iridescent glass facing outward with respect to said first thin irridescent coated glass, said spaced apart predetermined distance being able to accommodating a tested silicon-on-sapphire wafer between said thin irridescent coated glasses; and, (v) calibration circuitry for calibrating said device, said second thin irridescent coated glass being coupled to said calibration circuitry.