US4844776A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for making folded extended window field effect transistor
Assignee: Nokia Bell Labs
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Filing: 1987-12-04
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Granted: 1989-07-04
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Expires: 2007-12-04
Abstract
Abstract A gate electrode having an insulating top layer as well as insulating sidewall spacers permits the source and drain regions to be electrically contacted through windows directly above the source and drain regions formed in a window pad layer. The window pad layer may also be used as a sublevel interconnect.
Inventors
- 👤 Kuo-Hua Lee
- 👤 Chih-Yuan Lu
- 👤 David S. Yaney
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 20:11
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/0223; H10D30/0227; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/0698
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
134 words
A method of fabricating an integrated circuit having a plurality of transistors comprising the steps of: forming a gate electrode structure comprising a gate oxide and an insulating top layer; fabricating insulating sidewall spacers on the sides of said gate electrode by etching a deposited material, said insulating material acting as an etch stop; forming source and drain regions; depositing and patterning a conductive window pad layer so that at least a portion of said window pad layer contacts at least portions of both said source and drain regions; depositing and patterning a dielectric layer to form windows in said layer, said windows being substantially directly above at least some of said source and drain regions and exposting at least portions of said window pad layer; and depositing a contact material in said windows.
Claim 2
Independent Claim
134 words
A method of fabricating an integrated circuit having a plurality of transistors comprising the steps of: forming a gate electrode structure comprising a gate oxide and an insulating top layer; fabricating insulating sidewall spacers on the sides of said gate electrode by etching a deposited material, said insulating material acting as an etch stop; forming source and drain regions; depositing and patterning a conductive window pad layer so that at least a portion of said window pad layer contacts at least portions of both said source and drain regions; depositing and patterning a dielectric layer to form windows in said layer, said windows being substantially directly above at least some of said source and drain regions and exposting at least portions of said window pad layer; and depositing a contact material in said windows.
Claim 3
Dependent Claim
26 words
A method as recited in claim 1 in which said window pad layer material is selected from the group consisting of TiN, silicides, polysilicon and polycides.
Claim 4
Dependent Claim
15 words
A method as recited in claim 1 in which said window pad layer comprises polysilicon.
Claim 5
Dependent Claim
25 words
A method as recited in claim 3 in which said source and drain regions are formed by thermal drive out of dopants from said polysilicon.
Claim 6
Dependent Claim
15 words
A method as recited in claim 2 in which said window pad layer comprises TiN.
Claim 7
Dependent Claim
15 words
A method as recited in claim 1 in which said sidewall spacer comprises an oxide.
Claim 8
Dependent Claim
15 words
A method as recited in claim 1 in which said forming step comprises ion implantation.
Claim 9
Dependent Claim
28 words
A method as recited in claim 1 in which said depositing and patterning produces a window pad layer contacting source and drain regions of at least two transistors.
Claim 10
Dependent Claim
30 words
A method as recited in claim 8 in which said window pad layer crosses the gate electrode structure of at least one transistor or the field oxide separating two transistors.
Claim 11
Dependent Claim
27 words
A method as recited in claim 1 in which the total number of said windows is less than the total number of said source and drain regions.
References Cited (Backward Citations)
US4324038A
Cited
US4453306A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-07-03 | 1993-01-02 | 1993-07-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-07-03 | 1997-01-02 | 1997-07-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-07-03 | 2001-01-02 | 2001-07-04 | $7700.00 | Window Closed / Lapsed |