Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
91 words
In a compound semiconductor metal oxide field effect type transistor device having source and drain high conductivity electrodes separated by a channel with a metal over oxide type gate in current influencing proximity to said channel and wherein the anionic ingredient of said compound semiconductor is arsenic, the improvement comprising: said channel being of compound semiconductor material, and said oxide being a water and light generated binary cationic ingredient oxide of said compound semiconductor material sufficiently free of anionic species to permit unpinning of the Fermi level of said compound semiconductor.
Claim 2
Dependent Claim
91 words
In a compound semiconductor metal oxide field effect type transistor device having source and drain high conductivity electrodes separated by a channel with a metal over oxide type gate in current influencing proximity to said channel and wherein the anionic ingredient of said compound semiconductor is arsenic, the improvement comprising: said channel being of compound semiconductor material, and said oxide being a water and light generated binary cationic ingredient oxide of said compound semiconductor material sufficiently free of anionic species to permit unpinning of the Fermi level of said compound semiconductor.
Claim 3
Dependent Claim
11 words
The transistor of claim 1 where said compound semiconductor is GaAs.
Claim 4
Dependent Claim
14 words
The transistor of claim 2 wherein said gate oxide is approximately 1000 Å thick.
Claim 5
Dependent Claim
138 words
In a compound seimconductor metal semiconductor field effect type transistor having in one surface of a compound semiconductor member source and rain high conductivity electrodes separated by a channel, the improvement comprising: said channel being of a layer of n conductivity type compound semiconductor material wherein the anionic ingredient of said layer is arsenic, an area of a water and light generated binary cationic ingredient oxide of said compound semiconductor sufficiently free of anion species to permit unpinning of the Fermi level of said layer of quantum mechanical tunneling thickness positioned between each high conductivity electrode and said compound semiconductor surface, and an area of a binary cationic ingredient oxide of said compound semiconductor containing anionic species positioned between said gate metal electrode and said compound semiconductor which permits sufficient band bending to provide a rectifying gate contact.
Claim 6
Dependent Claim
138 words
In a compound seimconductor metal semiconductor field effect type transistor having in one surface of a compound semiconductor member source and rain high conductivity electrodes separated by a channel, the improvement comprising: said channel being of a layer of n conductivity type compound semiconductor material wherein the anionic ingredient of said layer is arsenic, an area of a water and light generated binary cationic ingredient oxide of said compound semiconductor sufficiently free of anion species to permit unpinning of the Fermi level of said layer of quantum mechanical tunneling thickness positioned between each high conductivity electrode and said compound semiconductor surface, and an area of a binary cationic ingredient oxide of said compound semiconductor containing anionic species positioned between said gate metal electrode and said compound semiconductor which permits sufficient band bending to provide a rectifying gate contact.
Claim 7
Dependent Claim
10 words
The transistor of claim 4 where said semiconductor is GaAs.
Claim 8
Dependent Claim
13 words
The transistor of claim 5 where said tunneling thickness is approximately 50 Å.
Claim 9
Dependent Claim
174 words
In a Compound semiconductor field effect type transistor having source and drain high conductivity electrodes separated by a channel with a gate electrode in current influencing proximity to said channel, the improvement comprising: said transistor being in a layer of n conductivity type compound semiconductor material, said source and drain high conductivity electrodes being of a metal with a low work function separated from said n conductivity type layer by a layer of a water and light generated binary cationic ingredient oxide of said compound semiconductor sufficiently free of anion species to permit unpinning of the Fermi level of said layer of semiconductor material having a thickness compatible with quantum mechanical tunneling, and said gate metal electrode being of a high work function metal separated from said n conductivity type layer by a layer of a water and light generated binary cationic ingredient oxide of said compound semiconductor sufficiently free of anion species to permit unpinning of the Fermi level of said layer of semiconductor material having a thickness compatible with quantum mechanical tunneling.
Claim 10
Dependent Claim
174 words
In a Compound semiconductor field effect type transistor having source and drain high conductivity electrodes separated by a channel with a gate electrode in current influencing proximity to said channel, the improvement comprising: said transistor being in a layer of n conductivity type compound semiconductor material, said source and drain high conductivity electrodes being of a metal with a low work function separated from said n conductivity type layer by a layer of a water and light generated binary cationic ingredient oxide of said compound semiconductor sufficiently free of anion species to permit unpinning of the Fermi level of said layer of semiconductor material having a thickness compatible with quantum mechanical tunneling, and said gate metal electrode being of a high work function metal separated from said n conductivity type layer by a layer of a water and light generated binary cationic ingredient oxide of said compound semiconductor sufficiently free of anion species to permit unpinning of the Fermi level of said layer of semiconductor material having a thickness compatible with quantum mechanical tunneling.
Claim 11
Dependent Claim
11 words
The transistor of claim 7 where said compound semiconductor is GaAs.
Claim 12
Dependent Claim
21 words
The transistor of claim 8 where the thickness of said cationic ingredient oxide of said compound semiconductor is approximately 50 Å.
Claim 13
Dependent Claim
21 words
The transistor of claim 9 where said low work function metal is Al and said high work function metal is Au.
Claim 14
Dependent Claim
89 words
A compound semiconductor monocrystalline member of gallium arsenide having at least one exposed surface region and having on at least a portion of said surface region a layer of a water and light generated binary cationic ingredient oxide that is sufficiently free of anionic species to permit unpinning of the Fermi level of said semiconductor and at least one localized region disposed in said binary cationic ingredient oxide layer containing a quantity of anion species in a concentration greater than that present in said binary cationic ingredient oxide layer.
Claim 15
Dependent Claim
89 words
A compound semiconductor monocrystalline member of gallium arsenide having at least one exposed surface region and having on at least a portion of said surface region a layer of a water and light generated binary cationic ingredient oxide that is sufficiently free of anionic species to permit unpinning of the Fermi level of said semiconductor and at least one localized region disposed in said binary cationic ingredient oxide layer containing a quantity of anion species in a concentration greater than that present in said binary cationic ingredient oxide layer.