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US4842800A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of encapsulating electronic devices

Assignee: General Electric Co
•
Filing: 1987-10-01
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Granted: 1989-06-27
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Expires: 2007-10-01
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Abstract

Abstract A method for encapsulating microelectronic devices is provided using a heat curable epoxy composition having a monomeric or polymeric diaryliodonium hexafluoroantimonate salt. Curable compositions are also provided as well as encapsulated microelectronic devices.

Inventors

  • 👤 Erik W. Walles
  • 👤 James V. Crivello
  • 👤 John H. Lupinski

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 15:56
CPC Classifications
H; H10; H10W; H10W74/00; H10W74/40; H10W74/47; H10W74/473; C; C08; C08G; C08G59/00; C08G59/18; C08G59/68; C08K; C08K3/00; C08K3/34; C08K3/36; C08L; C08L63/00; H10W74/01

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 148 words
A method for making plastic encapsulated electronic devices capable of exceeding a 50% survival rate when subjected to a moisture-ladened environment at a temperature of about 130° C. for a period of at least 100 hours under highly accelerated stressed test conditions, which comprises encapsulating the electronic devices at a temperature of 120° to 230° C. at a pressure of 400 to 1500 psi, with a heat curable composition comprising by weight, (A) 100 parts of an epoxy resin having less than 100 ppm of hydrolyzable chloride, (B) 10 to 100 parts of fused silica filler, (C) an amount of a compatible monomeric or polymeric onium salt catalyst as the diaryliodonium hexafluoroantimonate salt, which is sufficient to provide from about 0.01 to 100 mg. of antimony, per gram of epoxy and (D) up to 100 mg. of copper as a compound cocatalyst for (C), per gram of antimony.
Claim 2
Independent Claim 148 words
A method for making plastic encapsulated electronic devices capable of exceeding a 50% survival rate when subjected to a moisture-ladened environment at a temperature of about 130° C. for a period of at least 100 hours under highly accelerated stressed test conditions, which comprises encapsulating the electronic devices at a temperature of 120° to 230° C. at a pressure of 400 to 1500 psi, with a heat curable composition comprising by weight, (A) 100 parts of an epoxy resin having less than 100 ppm of hydrolyzable chloride, (B) 10 to 100 parts of fused silica filler, (C) an amount of a compatible monomeric or polymeric onium salt catalyst as the diaryliodonium hexafluoroantimonate salt, which is sufficient to provide from about 0.01 to 100 mg. of antimony, per gram of epoxy and (D) up to 100 mg. of copper as a compound cocatalyst for (C), per gram of antimony.
Claim 3
Dependent Claim 17 words
A method in accordance with claim 1, where there is utilized a monomeric diaryl iodonium hexafluoroantimonate salt.
Claim 4
Dependent Claim 17 words
A method in accordance with claim 1, where there is utilized a polymeric diaryl hexafluoroantimonate iodonium salt.
Claim 5
Dependent Claim 22 words
A method in accordance with claim 1, where there is used a copper chelate as the cocatalyst for the diaryliodonium hexafluoroantimonate salt.
Claim 6
Dependent Claim 16 words
A method in accordance with claim 1, where (methoxyphenyl)phenyl iodonium hexafluoroantimonate is used as the catalyst.
Claim 7
Dependent Claim 15 words
A method in accordance with claim 1, where copper acetylacetonate is used as the cocatalyst.
Claim 8
Dependent Claim 19 words
A method in accordance with claim 1, wherein a polymeric iodonium hexafluoroantimonate novolak resin is used as the catalyst.

References Cited (Backward Citations)

US4173551A Cited
US4388450A Cited
US4358552A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-06-26 1992-12-26 1993-06-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-06-26 1996-12-26 1997-06-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-06-26 2000-12-26 2001-06-27 $7700.00 Window Closed / Lapsed

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