US4841242A
Expired / Lapsed
US
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Method for testing conductor networks
Assignee: Siemens AG
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Filing: 1988-02-29
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Granted: 1989-06-20
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Expires: 2008-02-29
Abstract
Abstract A method of testing conductor networks on printed circuit boards and wiring modules comprising charging various points on the conductor network with one or more charging beams while simultaneously irridating the conductor network with a large area holding beam which compensates for charge losses during the charge detecting period which determines whether shorts or open circuits occur in the network.
Inventors
- 👤 Matthias Brunner
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 21:37
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/305; G01R31/306
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
106 words
A method for testing conductor networks comprising the steps of, changing the charge condition of a first point (1) of the conductor network by irridating with a first particle beam (PE), irridating with the first or a second particle beam (PE) a second point (2) of the conductor network, detecting the charge condition of the second point (2) by detecting the secondary particles triggered at said second point, and irridating said first and second points (1, 2) of the conductor network with a third particle beam (HS) which has a particle energy (E HS ) so as to compensate for losses occurring in the conductor network.
Claim 2
Independent Claim
106 words
A method for testing conductor networks comprising the steps of, changing the charge condition of a first point (1) of the conductor network by irridating with a first particle beam (PE), irridating with the first or a second particle beam (PE) a second point (2) of the conductor network, detecting the charge condition of the second point (2) by detecting the secondary particles triggered at said second point, and irridating said first and second points (1, 2) of the conductor network with a third particle beam (HS) which has a particle energy (E HS ) so as to compensate for losses occurring in the conductor network.
Claim 3
Dependent Claim
66 words
A method according to claim 1 wherein the particle energy (E PE ) of said first beam (PE) is selected such that said first and second points (1, 2) irridated with such beam (PE) are negatively charged; and the particle energy (E HS ) of said third beam (HS) is selected such that an uncharged point which is irridated by this beam (HS) is positively charged.
Claim 4
Dependent Claim
68 words
A method according to claim 1 wherein the particle energy (E PE ) of said first beam (E PE ) is selected such that said first and second points (1, 2) irridated with such beam (PE) are positively charged; and the particle energy (E HS ) of said third beam (HS) is selected such that an uncharged point which is irridated with such beam (HS) is negatively charged.
Claim 5
Dependent Claim
32 words
A method according to claim 1 or 2 or 3, wherein said third particle beam (HS) is always switched on when the first or the second particle beams (PE) are switched off.
Claim 6
Dependent Claim
40 words
A method according to claim 1 or 2 or 3, wherein the diameter of said third particle beam (HS) on said conductor network corresponds to about the dimensions of a sub-region of said conductor network which is to be tested.
Claim 7
Independent Claim
25 words
A method according to claims 1 or 2 or 3 wherein said third particle beam (HS) is deflected over said conductor network by line scanning.
Claim 8
Independent Claim
165 words
A method for testing conductor networks comprising the steps of, changing the charge condition of a first point (1) of the conductor network by irridating with a first particle beam (PE), irridating with the first or a second particle beam (PE) a second point (2) of the conductor network, detecting the charge condition of the second point (2) by detecting the secondary particles triggered at said second point, and irridating said first and second points (1, 2) of the conductor network with a third particle beam (HS) which has a particle energy (E HS ) so as to compensate for losses occurring in the conductor network, and wherein the particle energy (EPE) of said first beam (PE) is selected such that said first and second points (1, 2) irridated with such beam (PE) are negatively charged; and the particle energy (E HS ) of said third beam (HS) is selected such that an uncharged point which is irridated by this beam (HS) is positively charged.
Claim 9
Independent Claim
165 words
A method for testing conductor networks comprising the steps of, changing the charge condition of a first point (1) of the conductor network by irridating with a first particle beam (PE), irridating with the first or a second particle beam (PE) a second point (2) of the conductor network, detecting the charge condition of the second point (2) by detecting the secondary particles triggered at said second point, and irridating said first and second points (1, 2) of the conductor network with a third particle beam (HS) which has a particle energy (E HS ) so as to compensate for losses occurring in the conductor network, and wherein the particle energy (EPE) of said first beam (PE) is selected such that said first and second points (1, 2) irridated with such beam (PE) are negatively charged; and the particle energy (E HS ) of said third beam (HS) is selected such that an uncharged point which is irridated by this beam (HS) is positively charged.
Claim 10
Independent Claim
167 words
A method for testing conductor networks comprising the steps of, changing the charge condition of a first point (1) of the conductor network by irridating with a first particle beam (PE), irridating with the first or a second particle beam (PE) a second point (2) of the conductor network, detecting the charge condition of the second point (2) by detecting the secondary particles triggered at said second point, and irridating said first and second points (1, 2) of the conductor network with a third particle beam (HS) which has a particle energy (E HS ) so as to compensate for losses occurring in the conductor network, and wherein the particle energy (EPE) of said first beam (E PE ) is selected such that said first and second points (1, 2) irridated with such beam (PE) are positively charged; and the particle energy (E HS ) of said third beam (HS) is selected such that an uncharged point which is irridated with such beam (HS) is negatively charged.
Claim 11
Independent Claim
167 words
A method for testing conductor networks comprising the steps of, changing the charge condition of a first point (1) of the conductor network by irridating with a first particle beam (PE), irridating with the first or a second particle beam (PE) a second point (2) of the conductor network, detecting the charge condition of the second point (2) by detecting the secondary particles triggered at said second point, and irridating said first and second points (1, 2) of the conductor network with a third particle beam (HS) which has a particle energy (E HS ) so as to compensate for losses occurring in the conductor network, and wherein the particle energy (EPE) of said first beam (E PE ) is selected such that said first and second points (1, 2) irridated with such beam (PE) are positively charged; and the particle energy (E HS ) of said third beam (HS) is selected such that an uncharged point which is irridated with such beam (HS) is negatively charged.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-06-19 | 1992-12-19 | 1993-06-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-06-19 | 1996-12-19 | 1997-06-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-06-19 | 2000-12-19 | 2001-06-20 | $7700.00 | Window Closed / Lapsed |