Circuit testing method and apparatus

Claim 3

The method according to claim 1 further including reading other portions of said circuit device by means of a reading beam of electrons to ascertain the potential of said other portions to determine whether said other portions are conductively connected to the first mentioned portion of said circuit device by said first circuit path.

Claim 4

The method according to claim 2 further including testing separate circuit paths by repeating the foregoing procedure for said separate circuit paths while maintaining already tested circuit paths at said second stable potential.

Claim 5

The method according to claim 2 including storing an intended schedule of connections for said first circuit path and comparing the said reading of said other portions of said circuit device with said schedule to determine whether said circuit path is continuous and to determine whether unintended connections exist.

Claim 6

The method according to claim 1 including disabling said flood beam of electrons while said writing beam initially changes the potential of said portion, and then re-enabling said flood beam of electrons.

Claim 7

The method according to claim 1 including capacitively coupling a preparation potential to said circuit device prior to directing said writing beam of electrons toward said selected portion wherein said preparation potential is commensurate with said first stable potential level.

Claim 8

The method according to claim 6 wherein said preparation potential is above said first crossover in said secondary emission characteristic and wherein said selected portion is written and stored to said second stable potential level which is below said first crossover.

Claim 9

The method according to claim 6 wherein said preparation potential is below said first crossover in said secondary emission characteristic and wherein said selected portion is written and stored to said second stable potential level which is above said first crossover.

Claim 10

The method according to claim 1 further including reading other portions of said circuit device as are expected to be a part of said first circuit path by means of a reading beam of electrons to ascertain the potential of said other portions to determine whether said other portions are conductively connected to the first mentioned portion of said circuit device by said first circuit path, reading third portions of said circuit device as are expected to be part of a different circuit path of said circuit device by means of a reading beam of electrons to ascertain the potential of said third portions to determine whether said third portions are disconnected from said first circuit path, directing a writing beam of electrons toward one of said third portions of said different circuit path of said circuit device for changing the potential thereof such that said flood beam of electrons maintains said one of said third portions at a stable potential level on the opposite side of the first crossover in the secondary emission characteristic for said one of said third portions, and reading other third portions of said circuit device as are expected to be part of said different circuit path of said circuit device by means of a reading beam of electrons to ascertain the potential of said other third portions and determine whether said other third portions are conductively connected to the said one of said third portions of said circuit device by said different circuit path.

Claim 11

The method according to claim 9 further including reading another of said circuit paths and continuing with the above procedure for other circuit paths to test said circuit device.

Claim 14

The apparatus according to claim 11 further including means for disabling said first source of flood electrons while electrons from said second electron source are at least initially directed toward said selected portion.

Claim 15

The apparatus according to claim 11 further including processor means for operating said means for applying said preparation potential and for then operating said means for directing said beam of electrons from said second source to store the potential of said selected portion at said second stable state, and memory means operatively connected to said processor means for storing a list of connections intended for said given circuit path, said processor being further operative to cause said beam of electrons from said second electron source to read said circuit device while comparing the potential of portions of said circuit device with said selected portion to determine the continuity of said given circuit path.

Claim 16

The apparatus according to claim 13 including connection means coupled to said target electrode for reading out the potential levels of portions scanned by said second electron source.

Claim 17

The apparatus according to claim 11 further including means for evacuating said chamber and means for transporting said circuit device into said chamber prior to evacuation.

Claim 18

The apparatus according to claim 11 further including additional first and second electron sources and additional directing means on the opposite side of said circuit device from said first mentioned first and second electron sources, and second directing means for testing a circuit path accessible from said opposite side of said circuit device.