US4839306A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of manufacturing a trench filled with an insulating material in a semiconductor substrate
Assignee: Oki Electric Industry Co Ltd
•
Filing: 1988-03-23
•
Granted: 1989-06-13
•
Expires: 2008-03-23
Abstract
Abstract A method of manufacturing a trench filled with an insulation material in a semiconductor substrate which includes the steps of forming a trench in the substrate, subjecting the substrate to an RF bias sputtering to form an oxide layer on the substrate, form a slope at an upper corner of the trench and produce a roundness at a lower corner of the trench, and filling the trench with the insulation material.
Inventors
- 👤 Hidetoshi Wakamatsu
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 23:03
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/24; H10P50/242; H10W; H10W10/00; H10W10/10; H10W10/17; H10W10/01; H10W10/011; H10W10/014; H10W10/0145; H10W10/041; H10W10/40; Y; Y10; Y10S; Y10S148/00; Y10S148/05; Y10S148/158; Y10S438/00; Y10S438/978
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
75 words
A method of manufacturing a trench filled with an insulation material in a semiconductor substrate including the steps of: forming a trench in the substrate; subjecting the substrate to an RF bias sputtering to form an oxide layer on the substrate, form a slope at an upper corner of the trench and to produce a roundness at a lower corner of the trench; removing said oxide layer; and filling the trench with the insulating material.
Claim 2
Independent Claim
75 words
A method of manufacturing a trench filled with an insulation material in a semiconductor substrate including the steps of: forming a trench in the substrate; subjecting the substrate to an RF bias sputtering to form an oxide layer on the substrate, form a slope at an upper corner of the trench and to produce a roundness at a lower corner of the trench; removing said oxide layer; and filling the trench with the insulating material.
Claim 3
Dependent Claim
24 words
A method as claimed in claim 1, wherein said substrate is a P-type silicon substrate and said oxide layer is a silicon oxide layer.
Claim 4
Dependent Claim
14 words
A method as claimed in claim 1, wherein said insulating material is silicon oxide.
Claim 5
Dependent Claim
17 words
A method as claimed in claim 1, wherein said insulating material is formed by chemical vapor deposition.
Claim 6
Independent Claim
135 words
A method of manufacturing a trench filled with an insulating material in a semiconductor substrate including the steps of: forming a trench in the substrate; subjecting the structure obtained by said step to an RF bias sputtering to form an oxide layer on the substrate, form a slope at an upper corner of the trench and to produce a roundness in a lower corner of the trench; removing said oxide layer; subjecting the structure obtained by said steps to a high temperature oxidization treatment to remove etching damages caused by forming the trench, the slope and the roundness, so as to round the slope and maintain the roundness and to keep an inner wall of the trench smooth; removing a silicon oxide layer formed by said oxidization; and filling the trench with the insulation material.
Claim 7
Independent Claim
135 words
A method of manufacturing a trench filled with an insulating material in a semiconductor substrate including the steps of: forming a trench in the substrate; subjecting the structure obtained by said step to an RF bias sputtering to form an oxide layer on the substrate, form a slope at an upper corner of the trench and to produce a roundness in a lower corner of the trench; removing said oxide layer; subjecting the structure obtained by said steps to a high temperature oxidization treatment to remove etching damages caused by forming the trench, the slope and the roundness, so as to round the slope and maintain the roundness and to keep an inner wall of the trench smooth; removing a silicon oxide layer formed by said oxidization; and filling the trench with the insulation material.
Claim 8
Dependent Claim
52 words
A method as claimed in claim 5, wherein said step of forming the trench includes the steps of; forming a silicon oxide layer on the substrate; selectively forming a resist film on the silicon oxide layer; subjecting the structure obtained by said steps to a reactive ion etching to form a trench.
Claim 9
Dependent Claim
20 words
A method as claimed in claim 5, said silicon oxide layer is formed by a normal pressure clemical vapor deposition.
Claim 10
Dependent Claim
50 words
A method as claimed in claim 5, wherein said filling step comprises the steps of: subjecting the substrate to a high temperature oxidization treatment to form a silicon oxide layer on the substrate; and depositing silicon oxide by a chemical vapor deposition to fill the trench with the silicon oxide.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-06-12 | 1992-12-12 | 1993-06-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-06-12 | 1996-12-12 | 1997-06-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-06-12 | 2000-12-12 | 2001-06-13 | $7700.00 | Window Closed / Lapsed |