Abstract A high frequency test fixture (40) comprises an array of Euler column probes (57,58,59) positioned between a circuit board or substrate under test (41) and a routing board or substrate (42) connected to an electronic tester. The Euler column probes are held in a compliant conducting medium (53) interposed between the circuit under test and the routing board. Electrical insulation (67,68) is placed around each alternate probe of the array of probes to isolate it from the compliant conducting medium. Such an alternate probe is to be used as a test signal driving probe. The probes adjacent to and surrounding a test signal driving probe are in electrical contact with the compliant medium and are to be used as ground probes. A high frequency test signal applied to the circuit under test via one of the alternate probes follows a return current path along the outside perimeter of the compliant medium thereby substantially reducing noise and effective lead inductance of the test fixture (FIG. 2).
A test fixture comprising: electrically conductive, elastomeric support body means for carrying electrical signals therethough; at least one first bendable Euler column held by said support body means so as to extend through and project in opposite directions beyond, said support body means, said first probe being electrically insulated from said support body means; and at least one second bendable Euler probe held by, and extending though, said support body means so as to project in opposite directions therebeyond, said second Euler probe being positioned adjacent to said first probe and being in electrical contact with said support body means so that a signal launched into said second Euler probe can pass therefrom into said support body means and travel therethrough before re-entering said second Euler probe.
Claim 2
Dependent Claim
127 words
A test fixture comprising: electrically conductive, elastomeric support body means for carrying electrical signals therethough; at least one first bendable Euler column held by said support body means so as to extend through and project in opposite directions beyond, said support body means, said first probe being electrically insulated from said support body means; and at least one second bendable Euler probe held by, and extending though, said support body means so as to project in opposite directions therebeyond, said second Euler probe being positioned adjacent to said first probe and being in electrical contact with said support body means so that a signal launched into said second Euler probe can pass therefrom into said support body means and travel therethrough before re-entering said second Euler probe.
Claim 3
Dependent Claim
75 words
A high frequency test fixture comprising: a slab of an electrically conductive elastomer having a uniformly high conductivity throughout its cross section; a double-ended bendable Euler column driving probe held by, and extending through the support body but electrically insulated therefrom; and a double-ended bendable Euler column ground probe held by, and extending through the support body so as to be in electrical contact therewith, said ground probe being positioned adjacent to said driving probe.
Claim 4
Dependent Claim
75 words
A high frequency test fixture comprising: a slab of an electrically conductive elastomer having a uniformly high conductivity throughout its cross section; a double-ended bendable Euler column driving probe held by, and extending through the support body but electrically insulated therefrom; and a double-ended bendable Euler column ground probe held by, and extending through the support body so as to be in electrical contact therewith, said ground probe being positioned adjacent to said driving probe.