US3731191A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Micro-miniature probe assembly
Assignee: International Business Machines Corp
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Filing: 1969-12-22
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Granted: 1973-05-01
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Expires: 1989-12-22
Abstract
Abstract This invention is directed to a multi-probe test circuit assembly particularly adapted for producing low resistance electrical connections to a semi-conductor component of which the electrical parameters are to be evaluated.
Inventors
- 👤 R Bullard
- 👤 D Wheeler
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 20:10
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07357; G01R1/07314; G01R1/07342
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
212 words
An electrical test probe assembly comprising, a support housing, at least one conductive guide cylinder fixedly supported by said housing, a flexible conductive probe wire, or the like, within and in electrical contact with said guide cylinder, said probe wire having a portion protruding a predetermined length beyond one end of said guide cylinder for contacting an electrical device to be tested, said probe wire being bendable within said cylinder to make contact with the interior of said guide cylinder in a region proximate said protruding portion of said wire when subjected to a longitudinal compression force, a pressure plate mounted on said housing in abutting relation with a second end of said probe wire remote from said protruding portion for holding said probe wire against longitudinal displacement within said guide cylinder upon application of a longitudinal compression force to the protruding end of said wire whereby said probe wire is caused to make contact with said guide cylinder in a region proximate said one end of said guide cylinder proximate said protruding portion of said probe wire, and a circuit board mounted on said housing intermediate the ends of said guide cylinders, said connector means further including means for making individual electrical connections with said guide cylinders to said external circuits.
Claim 2
Dependent Claim
212 words
An electrical test probe assembly comprising, a support housing, at least one conductive guide cylinder fixedly supported by said housing, a flexible conductive probe wire, or the like, within and in electrical contact with said guide cylinder, said probe wire having a portion protruding a predetermined length beyond one end of said guide cylinder for contacting an electrical device to be tested, said probe wire being bendable within said cylinder to make contact with the interior of said guide cylinder in a region proximate said protruding portion of said wire when subjected to a longitudinal compression force, a pressure plate mounted on said housing in abutting relation with a second end of said probe wire remote from said protruding portion for holding said probe wire against longitudinal displacement within said guide cylinder upon application of a longitudinal compression force to the protruding end of said wire whereby said probe wire is caused to make contact with said guide cylinder in a region proximate said one end of said guide cylinder proximate said protruding portion of said probe wire, and a circuit board mounted on said housing intermediate the ends of said guide cylinders, said connector means further including means for making individual electrical connections with said guide cylinders to said external circuits.
References Cited (Backward Citations)
US2954521A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1976-04-30 | 1976-10-30 | 1977-05-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1980-04-30 | 1980-10-30 | 1981-05-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1984-04-30 | 1984-10-30 | 1985-05-01 | $7700.00 | Window Closed / Lapsed |