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US4836905A Expired / Lapsed US ⏱️ 0.0 years remaining

Processing apparatus

Assignee: Texas Instruments Inc
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Filing: 1987-07-16
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Granted: 1989-06-06
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Expires: 2007-07-16
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Abstract

Abstract A processing apparatus and method which permits sputter deposition and which is compatible with a vacuum processing system wherein the wafers are largely transferred and processed in the face down position. This includes an additional wafer movement, wherein, after a wafer has been emplaced face down, in a position where it can be clamped against the susceptor, the susceptor is rotated from its approximately horizontal position up to a more nearly vertical position. While the wafer is in the more nearly vertical position, sputter deposition may be performed. In situ or remote plasma capability is usefully provided in the bottom part of the chamber, so that a dry deglaze or cleanup step can be performed while the wafer is in its substantially horizontal position, followed by a sputter deposition after the wafer has been moved to its more nearly vertical position.

Inventors

  • 👤 Cecil J. Davis
  • 👤 Joseph V. Abernathy
  • 👤 Robert T. Matthews
  • 👤 Randall C. Hildenbrand
  • 👤 Bruce Simpson
  • 👤 James G. Bohlman
  • 👤 Lee M. Loewenstein
  • 👤 John I. Jones

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 19:56
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/30; H10P72/33; H10P72/3306; C; C23; C23C; C23C14/00; C23C14/22; C23C14/50; C23C14/56; C23C14/568; C23F; C23F4/00; H10P72/04; H10P72/0431; H10P72/0436; H10P72/3308; Y; Y10; Y10S; Y10S414/00; Y10S414/135; Y10S414/136; Y10S414/137

Claims Analysis

Total Claims: 15
Claim 1
Independent Claim 133 words
An apparatus for processing of wafers, comprising: (a) a vacuum processing chamber having a top processing chamber having means for performing a first processing step and an upper processing space having means for performing a second processing step within said vacuum processing chamber; (b) a wafer support within said vacuum processing chamber, said wafer support being capable of supporting a wafer in a substantially face down position with substantially no damage to structures on the face of said wafer in the top processing chamber while a first processing step is being performed; and (c) said wafer support being movable to rotate said wafer from said substantially face down position in said top process chamber into a more nearly vertical position in said upper processing space where a second processing step can be performed.
Claim 2
Independent Claim 133 words
An apparatus for processing of wafers, comprising: (a) a vacuum processing chamber having a top processing chamber having means for performing a first processing step and an upper processing space having means for performing a second processing step within said vacuum processing chamber; (b) a wafer support within said vacuum processing chamber, said wafer support being capable of supporting a wafer in a substantially face down position with substantially no damage to structures on the face of said wafer in the top processing chamber while a first processing step is being performed; and (c) said wafer support being movable to rotate said wafer from said substantially face down position in said top process chamber into a more nearly vertical position in said upper processing space where a second processing step can be performed.
Claim 3
Dependent Claim 14 words
The apparatus of claim 1 wherein the first processing step is a cleanup step.
Claim 4
Dependent Claim 15 words
The apparatus of claim 1 wherein the second processing step is a sputter deposition step.
Claim 5
Dependent Claim 36 words
The apparatus of claim 1 further comprising a wafer transfer mechanism positioned to controllably transfer wafers through an openable port into said vacuum process chamber, said wafer transfer mechanism being capable of operation under high vacuum.
Claim 6
Independent Claim 141 words
An apparatus for processing of wafers, comprising: (a) a vacuum process chamber having a top processing chamber having means for performing a first processing step and an upper processing space having means for performing a second processing step in the processing chamber; (b) a wafer support within said vacuum process chamber, said wafer support being capable of supporting a wafer in a substantially face down position with substantially no damage to structures on the face of said wafer in a top processing chamber where a first processing step can be performed; and (c) said wafer support is openable and closeable and is also controllable independently thereof to move said wafer support from said substantially face down position in said top processing chamber into a more nearly vertical position in said upper processing space where a second processing step can be performed.
Claim 7
Independent Claim 141 words
An apparatus for processing of wafers, comprising: (a) a vacuum process chamber having a top processing chamber having means for performing a first processing step and an upper processing space having means for performing a second processing step in the processing chamber; (b) a wafer support within said vacuum process chamber, said wafer support being capable of supporting a wafer in a substantially face down position with substantially no damage to structures on the face of said wafer in a top processing chamber where a first processing step can be performed; and (c) said wafer support is openable and closeable and is also controllable independently thereof to move said wafer support from said substantially face down position in said top processing chamber into a more nearly vertical position in said upper processing space where a second processing step can be performed.
Claim 8
Dependent Claim 14 words
The apparatus of claim 5 wherein the first processing step is a cleanup step.
Claim 9
Dependent Claim 15 words
The apparatus of claim 5 wherein the second processing step is a sputter deposition step.
Claim 10
Dependent Claim 36 words
The apparatus of claim 5 further comprising a wafer transfer mechanism positioned to controllably transfer wafers through an openable port into said vacuum process chamber, said wafer transfer mechanism being capable of operation under high vacuum.
Claim 11
Independent Claim 117 words
An apparatus for processing of wafers, comprising: (a) a vacuum process chamber; (b) a wafer support within said vacuum process chamber, said wafer support being capable of supporting a wafer in a substantially face down position with substantially no damage to structures on the face of said wafer; (c) said wafer support is openable and closeable and is also controllable independently thereof to move said wafer support from said substantially face down position into a more nearly vertical position; (d) a first process station to effect predetermined operation on a wafer held in said more nearly vertical position; and (e) second process station to effect predetermined operation on a wafer held in said substantially face down position.
Claim 12
Independent Claim 117 words
An apparatus for processing of wafers, comprising: (a) a vacuum process chamber; (b) a wafer support within said vacuum process chamber, said wafer support being capable of supporting a wafer in a substantially face down position with substantially no damage to structures on the face of said wafer; (c) said wafer support is openable and closeable and is also controllable independently thereof to move said wafer support from said substantially face down position into a more nearly vertical position; (d) a first process station to effect predetermined operation on a wafer held in said more nearly vertical position; and (e) second process station to effect predetermined operation on a wafer held in said substantially face down position.
Claim 13
Dependent Claim 14 words
The apparatus of claim 3 wherein said first process station comprises a sputtering apparatus.
Claim 14
Dependent Claim 16 words
The apparatus of claim 9 wherein the cleanup step is performed at the second process station.
Claim 15
Dependent Claim 36 words
The apparatus of claim 9 further comprising a wafer transfer mechanism positioned to controllably transfer wafers through an openable port into said vacuum process chamber, said wafer transfer mechanism being capable of operation under high vacuum.

References Cited (Backward Citations)

US4268394A Cited
US4405435A Cited
US4340462A Cited
US4431473A Cited
US4473455A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-06-05 1992-12-05 1993-06-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-06-05 1996-12-05 1997-06-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-06-05 2000-12-05 2001-06-06 $7700.00 Window Closed / Lapsed

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