Patent US3410984A successfully refreshed from Google Patents.
US4829243A
Expired / Lapsed
US
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Electron beam testing of electronic components
Assignee: Microelectronics and Computer Technology Corp
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Filing: 1988-02-19
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Granted: 1989-05-09
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Expires: 2008-02-19
Abstract
Abstract An electron beam testing apparatus for applying an electron beam to parts of an electronic component and measuring the secondary electrons released from the part including a secondary electron collector having a plurality of vertically extending screens with a detector positioned adjacent one of the screens. A different voltage is applied to each of the screens of the collector for collecting the secondary electrons over a large area. The apparatus may include a combination blanking and Faraday cup for metering the electron beam current when it is blanked. The apparatus may also be used to measure net work capacitance by measuring the time required to charge a network to a predetermined voltage.
Inventors
- 👤 Ollie C. Woodard, Sr.
- 👤 Andrew W. Ross
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 06:58
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/04; H01J37/045; G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/305; H01J2237/00; H01J2237/245; H01J2237/24507
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
128 words
An electron beam testing apparatus for applying an electron beam to parts of an electronic component and measuring the secondary electrons released from said part comprising: means for directing an electron beam onto parts of an electronic component, extraction means including an extraction grid positioned above the position of the electronic component, retarding means including a retarding grid positioned above the extraction grid, a secondary electron collector positioned above the retarding grid, said collector including a plurality of vertically extending screens and having a top screen providing an enclosure above the retarding means, secondary electron detection means positioned adjacent one of the vertically extending screens, and means for applying different voltages to each of the screens of the collector for collecting secondary electrons efficiently over a large area.
Claim 2
Dependent Claim
128 words
An electron beam testing apparatus for applying an electron beam to parts of an electronic component and measuring the secondary electrons released from said part comprising: means for directing an electron beam onto parts of an electronic component, extraction means including an extraction grid positioned above the position of the electronic component, retarding means including a retarding grid positioned above the extraction grid, a secondary electron collector positioned above the retarding grid, said collector including a plurality of vertically extending screens and having a top screen providing an enclosure above the retarding means, secondary electron detection means positioned adjacent one of the vertically extending screens, and means for applying different voltages to each of the screens of the collector for collecting secondary electrons efficiently over a large area.
Claim 3
Dependent Claim
15 words
The apparatus of claim 1 where the collector includes at least three vertically extending screens.
Claim 4
Dependent Claim
13 words
The apparatus of claim 1 wherein the collector includes six vertically extending screens.
Claim 5
Dependent Claim
23 words
The apparatus of claim 1 wherein the detection means is connected to the entire area of said one or more vertically extending screen.
Claim 6
Dependent Claim
89 words
The apparatus of claim 1 including a combination blanking and Faraday cup comprising, a set of blanking plates including a positive and a negative plate positioned on opposite sides of the electron beam, said positive plate having an opening for receiving the electron beam when the beam is blanked, a Faraday cup connected to the opening for receiving the electron beam when it is blanked and directed through the opening, and means connected to the Faraday cup for measuring the current of the electron beam in the Faraday cup.
Claim 7
Dependent Claim
39 words
The apparatus of claim 1 including means for measuring parameters of the capacitance of a network in electronic component including, means connected to the detection means for measuring the time required to charge a network to a predetermined voltage.
Claim 8
Dependent Claim
106 words
In an electron beam testing apparatus for applying an electron beam to parts of an electronic component and measuring the secondary electrons released from said part the improvement comprising, a set of blanking plates including a positive and a negative plate positioned on opposite sides of the electron beam, said positive plate having an opening for receiving the electron beam when the beam is blanked, a Faraday cup connected to the opening for receiving the electron beam when it is blanked by directing it through the opening, and means connected to the Faraday cup for measuring the current of the electron beam in the Faraday cup.
Claim 9
Dependent Claim
106 words
In an electron beam testing apparatus for applying an electron beam to parts of an electronic component and measuring the secondary electrons released from said part the improvement comprising, a set of blanking plates including a positive and a negative plate positioned on opposite sides of the electron beam, said positive plate having an opening for receiving the electron beam when the beam is blanked, a Faraday cup connected to the opening for receiving the electron beam when it is blanked by directing it through the opening, and means connected to the Faraday cup for measuring the current of the electron beam in the Faraday cup.
Claim 10
Dependent Claim
78 words
In an electron beam testing apparatus for applying an electron beam to part of an electronic component and measuring the secondary electrons released from said part by a detector, the improvement of means for measuring parameters of the capacitance of the part comprising: means connected to detector for measuring when a predetermined voltage charge has been applied to the part by the electron beam, and means measuring the time to charge said part to said predetermined voltage charge.
Claim 11
Dependent Claim
78 words
In an electron beam testing apparatus for applying an electron beam to part of an electronic component and measuring the secondary electrons released from said part by a detector, the improvement of means for measuring parameters of the capacitance of the part comprising: means connected to detector for measuring when a predetermined voltage charge has been applied to the part by the electron beam, and means measuring the time to charge said part to said predetermined voltage charge.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-05-08 | 1992-11-07 | 1993-05-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-05-08 | 1996-11-07 | 1997-05-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-05-08 | 2000-11-07 | 2001-05-09 | $7700.00 | Window Closed / Lapsed |