US4827324A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Implantation of ions into an insulating layer to increase planar pn junction breakdown voltage
Assignee: Vishay Siliconix Inc
•
Filing: 1986-11-06
•
Granted: 1989-05-02
•
Expires: 2006-11-06
Abstract
Abstract A method for forming a PN junction having an enhanced breakdown voltage includes the step of forming a silicon dioxide or other insulating layer over the PN junction of the diode. The silicon dioxide layer is then implanted with ions. Depending on the species implanted into the silicon dioxide layer, the silicon dioxide layer becomes resistive. The metallization contacting the anode of the diode and the cathode of the diode also contacts the doped silicon dioxide layer. Of importance, electrical fields caused by current flowing through the doped silicon dioxide layer alter the radius of curvature of the depletion region between the anode and cathode, thereby enhancing the diode breakdown voltage.
Inventors
- 👤 Richard A. Blanchard
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 10:44
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/111; H10D64/115; H10P; H10P30/00; H10P30/40; Y; Y10; Y10S; Y10S438/00; Y10S438/91
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
122 words
A method for forming a PN junction comprising the steps of: providing a first semiconductor region of a first conductivity type; forming a second semiconductor region of a second conductivity type adjacent to said first semiconductor region, thereby forming a PN junction between said first and second semiconductor regions; forming an insulating layer over said PN junction; introducing an impurity into said insulating layer, thereby causing said insulating layer to become a resistive layer; providing a first structure for electrically contacting a first portion of said resistive layer over said first semiconductor region; and providing a second structure for electrically contacting a second portion of said resistive layer over said second semiconductor region, thereby enhancing the breakdown voltage of said PN junction.
Claim 2
Independent Claim
122 words
A method for forming a PN junction comprising the steps of: providing a first semiconductor region of a first conductivity type; forming a second semiconductor region of a second conductivity type adjacent to said first semiconductor region, thereby forming a PN junction between said first and second semiconductor regions; forming an insulating layer over said PN junction; introducing an impurity into said insulating layer, thereby causing said insulating layer to become a resistive layer; providing a first structure for electrically contacting a first portion of said resistive layer over said first semiconductor region; and providing a second structure for electrically contacting a second portion of said resistive layer over said second semiconductor region, thereby enhancing the breakdown voltage of said PN junction.
Claim 3
Dependent Claim
22 words
The method of claim 1 wherein said step of introducing an impurity comprises the step of implanting ions into said insulating layer.
Claim 4
Dependent Claim
15 words
The method of claim 2 wherein the ion implanted into said insulating layer is cesium.
Claim 5
Dependent Claim
21 words
The method of claim 1 wherein said first and second semiconductor regions comprise silicon and said insulating material is silicon dioxide.
Claim 6
Dependent Claim
42 words
The method of claim 1 further comprising the steps of: forming an electrical contact for contacting said first semiconductor region; and forming an electrical contact for contacting said second semiconductor region, said resistive layer extending between said first and second electrical contacts.
Claim 7
Dependent Claim
17 words
The method of claim 1 wherein said second semiconductor region is formed within said first semiconductor region.
Claim 8
Dependent Claim
74 words
The method of claim 1 wherein said step of providing a first structure comprises the step of forming a first region of electrically conductive material electrically contacting said first semiconductor region and said first portion of said resistive layer, and wherein said step of providing a second structure comprises the step of forming a second region of electrically conductive material electrically contacting said second semiconductor region and said second portion of said resistive layer.
Claim 9
Dependent Claim
135 words
A structure comprising: a first semiconductor region of a first conductivity type; a second semiconductor region of a second conductivity type adjacent to said first semiconductor region so that a PN junction forms between said first and second semiconductor regions; a resistive layer of material formed over said PN junction between said first and second semiconductor regions, said layer of material being doped with ions, said layer of material being of a type such that said layer of material would be insulating if not implanted with ions; a first structure electrically contacting a first portion of said resistive layer over said first semiconductor region; and a second structure electrically contacting a second portion of said resistive layer over said second semiconductor region, said resistive layer of material enhancing the breakdown voltage of said PN junction.
Claim 10
Dependent Claim
135 words
A structure comprising: a first semiconductor region of a first conductivity type; a second semiconductor region of a second conductivity type adjacent to said first semiconductor region so that a PN junction forms between said first and second semiconductor regions; a resistive layer of material formed over said PN junction between said first and second semiconductor regions, said layer of material being doped with ions, said layer of material being of a type such that said layer of material would be insulating if not implanted with ions; a first structure electrically contacting a first portion of said resistive layer over said first semiconductor region; and a second structure electrically contacting a second portion of said resistive layer over said second semiconductor region, said resistive layer of material enhancing the breakdown voltage of said PN junction.
Claim 11
Dependent Claim
11 words
The structure of claim 8 wherein said material comprises silicon dioxide.
Claim 12
Dependent Claim
14 words
The structure of claim 8 wherein said layer of material is doped with cesium.
Claim 13
Dependent Claim
52 words
Structure of claim 8 wherein said first structure comprises electrically conductive material contacting said first semiconductor region and said first portion of said resistive layer of material, and wherein said second structure comprises electrically conductive material electrically contacting said second semiconductor region and said second portion of said resistive layer of material.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-05-01 | 1992-10-31 | 1993-05-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-05-01 | 1996-10-31 | 1997-05-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-05-01 | 2000-10-31 | 2001-05-02 | $7700.00 | Window Closed / Lapsed |