Vertical double diffused metal oxide semiconductor (VDMOS) device including high voltage junction exhibiting increased safe operating area

Claim 2

A semiconductor field effect device comprising: a body of semiconductor material having a major surface; and an insulated gate electrode grid disposed on said major surface, said grid comprising: as plurality of spaced apart first gate segments, each of said first segments being substantially circular, and a plurality of second gate segments, each of said second segments extending between, and interconnecting, two adjacent one s of said first segments.

Claim 3

The semiconductor field effect device recited in claim 1 wherein: said first gate segments each have a radius R, and said second gate segments have a minimum width W 1 , wherein R is greater than W 1 .

Claim 4

The semiconductor field effect device effect device recited in claim 2 wherein R is greater than 2W 1 .

Claim 5

A semiconductor device comprising a body of semiconductor material having: a first major surface; a first region of one type conductivity extending to said first major surface; a second region of opposite type conductivity extending into said first region from said first surface and forming a PN junction with said first region; and an insulated gate electrode grid disposed on said first major surface, said grid comprising: a plurality of spaced apart first gate segments, and a plurality of second gate segments, each of said second gate segments extending between and interconnecting, two of said first gate segments, said second region being more heavily doped than said first region and having a plurality of spaced apart openings therein at which said PN junction and said first region extend to said first surface, each of s° i openings being substantially aligned with a different said first gate segments, and at each of said openings, the intersection of said PN junction with said first major surface being a closed plane geometric figure having a maximum width of less than 4 DB wherein DB is the break voltage depletion width for a parallel plane PN junction between said first and second regions.

Claim 6

A semiconductor device comprising a body of semiconductor material having: a first major surface; a first region of one type conductivity extending to said first major surface; a second region of opposite type conductivity extending into said first region from said first surface and forming a PN junction with said first region; and an insulated gate electrode grid disposed on said first major surface, said grid comprising: a plurality of spaced apart first gate segments, and a plurality of second gate segments, each of said second gate segments extending between and interconnecting, two of said first gate segments, said second region being more heavily doped than said first region and having a plurality of spaced apart openings therein at which said PN junction and said first region extend to said first surface, each of s° i openings being substantially aligned with a different said first gate segments, and at each of said openings, the intersection of said PN junction with said first major surface being a closed plane geometric figure having a maximum width of less than 4 DB wherein DB is the break voltage depletion width for a parallel plane PN junction between said first and second regions.

Claim 7

The semiconductor device recited in claim 4 wherein said geometric figure is everywhere convex.

Claim 8

The semiconductor device recited in claim 5 wherein said maximum width is less than 2D B .

Claim 9

The semiconductor device recited in claim 5 wherein said maximum width is less than D B .

Claim 10

The semiconductor device recited in claim 5 wherein said maximum width is less than 1/2D B .

Claim 11

The semiconductor device recited in claim 5 wherein said geometric figure is an ellipse.

Claim 12

The semiconductor device recited in claim 5 wherein said geometric figure is a circle.

Claim 13

The semiconductor device of claim 5 wherein said PN junction is remote from said first surface except in the vicinity of said openings, wherein said PN junction extends upward toward said first surface.

Claim 14

The semiconductor device recited in claim 11 wherein at each of said openings said PN junction curves upward toward said first surface, with each of said openings being narrower at said first surface than at a location remote from said first surface.

Claim 15

The semiconductor device recited in claim 11 further comprising: a plurality of third regions of said one type conductivity each disposed in said second region in the vicinity of one of said openings, extending to said first surface and spaced from said first region by a portion of said second region; and wherein: each of said first gate segments overlies a portion of one of said openings, a portion of one of said third regions in the vicinity of said one opening and the portion of said second region which spaces said one of said third regions from said first region.

Claim 16

The semiconductor device recited in claim 13 wherein said first region includes a first portion and a second portion, said second portion being substantially more heavily doped than said first portion, said first portion spacing said second portion from said second region; said device further comprising: a first power electrode contacting said second and third regions, and a second power electrode contacting said second portion of said first region.

Claim 17

The semiconductor device recited in claim 13 further comprising: a fourth region of said opposite type conductivity disposed adjacent said first region and spaced from said second region by said first region; a first power electrode contacting said second and third regions; and a second power electrodes contacting said fourth region.

Claim 18

The semiconductor device recited in claim 1 wherein each of said second gate segments extend over said second region between said two of said first gate segments it interconnects.

Claim 19

The semiconductor device of claim 16 wherein said second region extends a distance D under said first gate segment and said second gate segments have a minimum width W 1 wherein 2D>W 1 .

Claim 20

The semiconductor device recited in claim 4 wherein: said openings are substantially circular; and said first gate segment are substantially circular.

Claim 21

The semiconductor device of claim 4 further comprising: a plurality of third regions of said one type conductivity each extending into said second region in the vicinity of one of said openings and spaced form said first region by a portion of said second region; and the one of said first gate segments which is aligned with said one of said openings also being aligned with a portion of each of said third regions and the portions of said second region which space said third regions from said first region.

Claim 22

The semiconductor device recited in claim 19 wherein said first region includes a first portion and a second portion, said second portion being substantially more heavily doped than said first portion, said first portion spacing said second portion from said second region; said device further comprising: a first power electrode contacting said second and third regions and a second power electrode contacting said second portion of said first region.

Claim 23

The semiconductor device of claim 19 further comprising: a fourth region of said opposite type conductivity disposed adjacent said first region and spaced from said second region by said first region; a first power electrode contacting said second and third regions; and a second power electrode contacting said fourth region.

Claim 24

The semiconductor de vice recited in claim 5 wherein said second region of opposite type conductivity includes separately doped portions having different concentrations of opposite conductivity type determining dopant.

Claim 25

A semiconductor field effect device comprising a body of semiconductor material having: first and second major surfaces; a first region of one type conductivity material extending to said first major surface; a second region of opposite type conductivity more heavily doped than said first surface and forming a first PN junction therewith, said second region having a plurality of openings therein at each of which said first region extends to said first surfaces; a third region of said one type conductivity extending into said second region form said first surface and spaced from said first region by said second region; and an insulated gate electrode having a plurality of spaced part first segments each overlying said first layer wherein it extends to said first surface at a different one of said openings, one of said first gate segments overlying the portion of said second region which spaces said third region from said first layer and a portion of said third region; said insulated gate electrode including a plurality of second segments each of which connects two of said first gate segments; said first PN junction intersecting said first major surface under said gate electrode layer at each of said openings, each of said intersections comprising a closed plane geometric figure whose center is within said first region and whose maximum width is less than 4 D B where D B is the breakdown voltage depletion width of a parallel plane PN junction between said first and second region.

Claim 26

A semiconductor field effect device comprising a body of semiconductor material having: first and second major surfaces; a first region of one type conductivity material extending to said first major surface; a second region of opposite type conductivity more heavily doped than said first surface and forming a first PN junction therewith, said second region having a plurality of openings therein at each of which said first region extends to said first surfaces; a third region of said one type conductivity extending into said second region form said first surface and spaced from said first region by said second region; and an insulated gate electrode having a plurality of spaced part first segments each overlying said first layer wherein it extends to said first surface at a different one of said openings, one of said first gate segments overlying the portion of said second region which spaces said third region from said first layer and a portion of said third region; said insulated gate electrode including a plurality of second segments each of which connects two of said first gate segments; said first PN junction intersecting said first major surface under said gate electrode layer at each of said openings, each of said intersections comprising a closed plane geometric figure whose center is within said first region and whose maximum width is less than 4 D B where D B is the breakdown voltage depletion width of a parallel plane PN junction between said first and second region.

Claim 27

The semiconductor device re cite in claim 23 wherein said first region includes a first portion and a second portion, said second portion being substantially more heavily dope d than said first portion, said first portion spacing said second portion form said second region; said device further comprising: a first power electrode contacting said second and third regions, and a second power electrode contacting said second portion of said first region.

Claim 28

The semiconductor field effect device recited in claim 23 further comprising: a fourth region of said opposite type conductivity adjacent said first region and spaced from second region by said first region; a first power electrode contacting said second and third regions; and a second power electrode contacting said fourth region.

Claim 29

A semiconductor device comprising a body of semiconductor material having: a first major surface; a first region of one type conductivity; a second region of opposite type conductivity extending into said first region form said first surface and forming a PN junction with said first region; said second region being more heavily dope than said first region and having a plurality of openings therein at which said PN junction and said first region extend to said first surface, each intersection of said PN junction with said first major surface being a closed plane geometric figure which is everywhere convex; and a plurality of third regions of said one type conductivity extending into said second region from said second surface and spaced from said first region by said second region; an insulated gate electrode grid disposed on said first major surface, said grid comprising: a plurality of spaced apart first gate segments, each of said first gate segments overlying a different one of said plurality of openings, extending across the portion of said second region which is disposed between said first region within said opening and one of said third regions which is disposed adjacent thereto and being spaced from the others of said openings, and a plurality of second gate segments extending between, and interconnecting two of said first gate segments.

Claim 30

A semiconductor device comprising a body of semiconductor material having: a first major surface; a first region of one type conductivity; a second region of opposite type conductivity extending into said first region form said first surface and forming a PN junction with said first region; said second region being more heavily dope than said first region and having a plurality of openings therein at which said PN junction and said first region extend to said first surface, each intersection of said PN junction with said first major surface being a closed plane geometric figure which is everywhere convex; and a plurality of third regions of said one type conductivity extending into said second region from said second surface and spaced from said first region by said second region; an insulated gate electrode grid disposed on said first major surface, said grid comprising: a plurality of spaced apart first gate segments, each of said first gate segments overlying a different one of said plurality of openings, extending across the portion of said second region which is disposed between said first region within said opening and one of said third regions which is disposed adjacent thereto and being spaced from the others of said openings, and a plurality of second gate segments extending between, and interconnecting two of said first gate segments.

Claim 31

The semiconductor device recited in claim 26 wherein said first region includes a first portion and a second portion, said second portion being substantially more heavily doped than said first portion, said first portion spacing said second portion form said first region; and said device further comprising: a first power electrode contacting said second and third regions, and a second power electrode contacting aid second portion of said first region.

Claim 32

The semiconductor device of claim 26 further comprising: a fourth region of said opposite type conductivity disposed adjacent said first region and spaced from said second region by said first region; a first power electrode contacting said second and third regions; and a second power electrode contacting said fourth region.

Claim 33

The semiconductor device recited in claim 13 wherein: the extension of said second and third regions under said first gate segments are self-aligned with respect to said first gate segments.

Claim 34

The semiconductor device recited in claim 17 wherein: said second region is self-aligned with respect to both said first gate segments and said second gate segments; and the extensions of said third regions under said first gate segments are self-aligned with respect to said first gate segments.

Claim 35

The semiconductor field effect device recited in claim 23 wherein: each of said second gate segments extends over said second region between the two of said first gate segments which it connects.

Claim 36

The semiconductor device recited in claim 26 wherein: each of said second segments extends over said second region between the two of said first segments which it interconnects.