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US4813129A Expired / Lapsed US ⏱️ 0.0 years remaining

Interconnect structure for PC boards and integrated circuits

Assignee: HP Inc
•
Filing: 1987-06-19
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Granted: 1989-03-21
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Expires: 2007-06-19
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Abstract

Abstract An interconnect structure for electrically coupling conductive paths on two adjacent, rigid substrates, such as PC boards or IC chips. The interconnect structure includes a number of buttons formed on a first substrate, and a number of contacts formed on a second substrate. The buttons are elastically deformable, and include a resilient core made from an organic material such as polyimide, and a metallic coating formed over the core. The two substrates are compressed between mounting plates such that the buttons are pressed against the contracts to make electrical contact.

Inventors

  • 👤 Marcos Karnezos

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 13:26
CPC Classifications
H; H01; H01R; H01R13/00; H01R13/02; H01R13/22; H01R13/24; H01R13/2464; H01R12/00; H01R12/70; H01R12/71; H01R12/712; H01R12/714; H05; H05K; H05K3/00; H05K3/30; H05K3/32; H05K3/325; H05K3/40; H05K3/4007; H10; H10W; H10W72/00; H10W72/01; H10W72/012; H10W72/071; H10W72/072; H05K1/00; H05K1/02; H05K1/11; H05K1/111; H05K1/112; H05K1/113; H05K2201/00; H05K2201/03; H05K2201/0302; H05K2201/0314; H05K2201/0332; H05K2201/0364; H05K2201/0367; H05K2201/09; H05K2201/09209; H05K2201/09372; H05K2201/09472; H05K2201/095; H05K2201/09509; H05K2201/09654; H05K2201/09745; H05K2201/09818; H05K2201/09909; H05K2201/10; H05K2201/10613; H05K2201/10621; H05K2201/10719; H10W72/20; H10W72/251; H10W72/90; H10W72/921; H10W72/923; H10W72/941; H10W72/944; H10W72/9445; H10W72/951; H10W72/952; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/4913

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 123 words
A method for making an interconnect structure between a first conductive path on a first substrate and a second conductive path on a second substrate comprising the steps of: forming a protuberance on a surface of said first substrate which includes a resilient core made from an organic material, and a conductive coating formed on an external surface of said core and coupled to aid fist conductive path, by applying a layer of said organic material to said first substrate and removing portions of said layer of organic material from said substrate to leave said protuberance; and forming contact means on a surface of said second substrate adapted to contact said protuberance, said contact means being electrically coupled to said second conductive path.
Claim 2
Independent Claim 123 words
A method for making an interconnect structure between a first conductive path on a first substrate and a second conductive path on a second substrate comprising the steps of: forming a protuberance on a surface of said first substrate which includes a resilient core made from an organic material, and a conductive coating formed on an external surface of said core and coupled to aid fist conductive path, by applying a layer of said organic material to said first substrate and removing portions of said layer of organic material from said substrate to leave said protuberance; and forming contact means on a surface of said second substrate adapted to contact said protuberance, said contact means being electrically coupled to said second conductive path.
Claim 3
Dependent Claim 73 words
A method for making an interconnect structure as recited in claim 1 wherein said step or removing portions of said layer of organic material includes the steps of: applying a resist over said layer of organic material; exposing said resist to an energy pattern; developing said resist to form a mask; etching said layer of organic material through said mask remove said portions of said layer of organic material; and removing said mask.
Claim 4
Dependent Claim 56 words
A method for making an interconnect structure as recited in claim 2 wherein said step of removing portions of said layer of organic material further includes the step of: applying a layer of aluminum to said layer of organic material prior to the application of said resist, said layer of aluminum forming part of said mask.

References Cited (Backward Citations)

US3880486A Cited
US3986255A Cited
US4125310A Cited
US4403272A Cited
US4581679A Cited
US4548451A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-03-20 1992-09-19 1993-03-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-03-20 1996-09-19 1997-03-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-03-20 2000-09-19 2001-03-21 $7700.00 Window Closed / Lapsed

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