Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
208 words
Apparatus for evaluating performance characteristics of phased array antennas comprising: a planar antenna array having a plurality of bays arranged in a rectangular matrix, each bay including a plurality of subarray modules, each module having a plurality of pairs of dipole radiators and a plurality of diode phase shifters applying phase shifts of predetermined angular sizes to respective pairs of dipoles, said subarray modules being assigned a predetermined weight factor dependent upon location in said matrix for a particular antenna performance characteristic; a beam steering computer scanning said phase shifters and dipoles in a predetermined sequence, said beam steering computer including a plurality of drivers applying bias voltages to said phase shifters in accordance with said angular sizes and sequence; and test means for extracting data related to current failures for said plurality of diode phase shifters and for measuring said antenna performance characteristics including field distribution amplitudes for sum beam gain and elevation and azimuth difference pattern null depths, said beam steering computer processing said data from relationships including factors representing number and size and weighted location of said failed phase shifters for each of said performance characteristics, said test means indicating an antenna fault upon exceeding a performance degradation of a predetermined threshold for each characteristic.
Claim 2
Dependent Claim
208 words
Apparatus for evaluating performance characteristics of phased array antennas comprising: a planar antenna array having a plurality of bays arranged in a rectangular matrix, each bay including a plurality of subarray modules, each module having a plurality of pairs of dipole radiators and a plurality of diode phase shifters applying phase shifts of predetermined angular sizes to respective pairs of dipoles, said subarray modules being assigned a predetermined weight factor dependent upon location in said matrix for a particular antenna performance characteristic; a beam steering computer scanning said phase shifters and dipoles in a predetermined sequence, said beam steering computer including a plurality of drivers applying bias voltages to said phase shifters in accordance with said angular sizes and sequence; and test means for extracting data related to current failures for said plurality of diode phase shifters and for measuring said antenna performance characteristics including field distribution amplitudes for sum beam gain and elevation and azimuth difference pattern null depths, said beam steering computer processing said data from relationships including factors representing number and size and weighted location of said failed phase shifters for each of said performance characteristics, said test means indicating an antenna fault upon exceeding a performance degradation of a predetermined threshold for each characteristic.
Claim 3
Dependent Claim
52 words
The apparatus of claim 1 wherein said dipole radiators and diode phase shifters include a main array providing large beam scanning angles and a subarray providing a smaller elevation scanning angle, said main array having corresponding larger angular size diode phase shifters and said subarray having smaller angular size diode phase shifters.
Claim 4
Dependent Claim
43 words
The apparatus of claim 2 wherein said main array dipoles are controlled by four-bit phase shifters applying phase bit angles of 22.5°, 45°, 90°, and 180°, and said subarray dipoles are controlled by phase shifters applying phase bit angles of 24.8° and 49.6°.
Claim 5
Dependent Claim
93 words
The apparatus of claim 3 wherein size factors for each phase bit failure are a function of bit size, size factors for main array bits being given by: S.sub.i.sbsb.[Main] =(1-Cos Ψ.sub.i) where Ψ is the appropriate bit size (180°, 90°, 45°, 22.5°) for failure of a specificed single bit in a phase shifter; and size factors for subarray bits being given by: ##EQU9## Φ i is the appropriate bit size (24.8°, 49.6°) for failure of a specified single bit in a phase shifter, and q is the number of modules per subarray driver.
Claim 6
Dependent Claim
104 words
The apparatus of claim 4 wherein performance degradation of sum beam gain from failed phase bits is given by: ##EQU10## where F 1 =Gain degradation factor F 0 =Undegraded sum beam gain N=Number of subarray modules i=Location of failed bit K=0.5, weighting factor A i =Location weight for failed bits A j =Location weight of total number of bits S i =Size factor of failed main and subarray phase bits M=Number of failed bits (current faults) ##EQU11## F S (Sum beam gain degradation in dB)=|10 log 10 F 1 |, wherein if F S is greater than a predetermined threshold a fault is declared.
Claim 7
Dependent Claim
132 words
The apparatus of claim 5 wherein performance degradation of elevation null depth from failed phase bits is indicated by the difference in elevation pattern null depth degradation between the upper and lower halves of the antenna array and is given by: ##EQU12## where: F 2 =Elevation null depth N=Number of subarray modules K=0.5, weighting factor i=Location of failed bit M U =Number of failed bits in upper half of array M L =Number of failed bits in lower half of array A i =Location weight of failed bits A j =Location weight of all bits S i =Size factor of failed main and subarray phase bits ##EQU13## F (elevation null depth in dB)=|20 log 10 F 2 | wherein if F E is less than a predetermined threshold 2 fault is declared.
Claim 8
Dependent Claim
134 words
The apparatus of claim 6 wherein performance degradation of azimuth null depth from failed phase bits is indicted by the difference in azimuth pattern null depth degradation between the left and right halves of the antenna array and is given by: ##EQU14## where F 3 =Azimuth null depth N=Number of subarray modules K=0.5, weighting factor i=Location of failed bit M rt =Number of failed bits in right half of array M lt =Number of failed bits in left half of array A i =Location weight of failed bits A j =Location weight of all bits S i =Size factor of failed main and subarray phase bits ##EQU15## F A (azimuth null depth in dB)=|20 log 10 F 3 | wherein if F A is less than 23 a predetermined threshold a fault is declared.