US4807229A
Expired / Lapsed
US
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Semiconductor device tester
Assignee: Mitsubishi Electric Corp
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Filing: 1987-05-18
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Granted: 1989-02-21
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Expires: 2007-05-18
Abstract
Abstract A semiconductor device tester comprises a random data generator, an algorithmic data generator, and a serial data generator. The test data pattern of the data generators are selected and combined to produce test pattern data actually applied to a device under test. At least part of the test data pattern from the algorithmic data generator are applied to one of the random data generator and the serial data generator, which, responsive thereto, produces the random test pattern data or the serial test pattern data.
Inventors
- 👤 Tetsuo Tada
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 20:56
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/319; G01R31/31917; G01R31/31919; G01R31/31921
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
139 words
A semiconductor device tester comprising a first data generator for generating first test pattern data varying randomly, a second data generator for generating second test pattern data defined algorithmically, a third data generator for generating third test pattern data being serial, and means for selecting and combining the test pattern data of the first, second and third data generators to output a fourth test pattern data, said selecting and combining means appying at least part of the test pattern data from the second data generator to one of the first data generator and the third data generator, said one of the first data generator and the third data generator being responsive to said at least some of the test pattern data from the second data generator for producing the first test pattern data or the third test pattern data.
Claim 2
Dependent Claim
139 words
A semiconductor device tester comprising a first data generator for generating first test pattern data varying randomly, a second data generator for generating second test pattern data defined algorithmically, a third data generator for generating third test pattern data being serial, and means for selecting and combining the test pattern data of the first, second and third data generators to output a fourth test pattern data, said selecting and combining means appying at least part of the test pattern data from the second data generator to one of the first data generator and the third data generator, said one of the first data generator and the third data generator being responsive to said at least some of the test pattern data from the second data generator for producing the first test pattern data or the third test pattern data.
Claim 3
Dependent Claim
81 words
A tester according to claim 1 wherein said selecting and combining means comprises a first switch unit receiving the test pattern data from the second data generator and selectively producing said at least some of said test pattern data from the second data generator, and said one of the first data generator and the third data generator means is connected to the first switch unit to receive said at least some of said test pattern data from the second data generator.
Claim 4
Dependent Claim
38 words
A tester according to claim 1 wherein said selecting and combining means comprises switch means receiving the test pattern data from the first, second and third data generators and selectively outputting the test pattern data which it receives.
Claim 5
Dependent Claim
85 words
A tester according to claim 3 wherein said switch means comprises a first switch unit receiving the test pattern data from the second data generator and the test pattern data from said one of the first and third data generators, and selectively outputting the test pattern data which it receives, and a second switch unit receiving the test pattern data from the first switch unit and the test pattern data from the second data generator and selectively outputting the test pattern data which it receives.
Claim 6
Dependent Claim
60 words
A tester according to claim 1 wherein said some of the test data pattern from the second data generator are parallel data and said one of the first and third data generators is the third data generator which comprises means for converting the parallel data into the serial data, which forms at least part of said serial test pattern data.
Claim 7
Dependent Claim
14 words
A tester according to claim 1 wherein said parallel data are counter increment data.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-02-21 | 1992-08-22 | 1993-02-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-02-21 | 1996-08-22 | 1997-02-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-02-21 | 2000-08-22 | 2001-02-21 | $7700.00 | Window Closed / Lapsed |