Patent US4803356A successfully refreshed from Google Patents.
US4803356A
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US
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Method and apparatus for measuring degree of vacuum in an electron microscope
Assignee: Hitachi Ltd
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Filing: 1987-07-07
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Granted: 1989-02-07
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Expires: 2007-07-07
Abstract
Abstract The present invention comprises disposing an electrode group consisting of an anode and cathodes provided on both sides of the anode at a portion where the degree of vacuum in an electron microscope is to be measured closing in thermal electrons between the electrode group and a magnetic field forming lens systems such as objective lens system, condenser lens system and the like of the electron microscope, collecting a gas ionized by the thermal electrons closed therebetween to measure an ionic current, thereby realizing measurement of a degree of vacuum on a sample specimen part or thereabout without deteriorating a performance of the electrons microscope. For generating the thermal electron, for example, an observing electron beam of the electron microscope is collided with cathodes of the electrode group. For measuring the degree of vacuum on the sample specimen part of thereabout, the anode is disposed between an objective lens pole piece and a sample specimen holder stage and the objective lens pole piece and the sample specimen holder stage are used as cathodes so that the degree of vacuum can simply be measured thereby.
Inventors
- 👤 Hiroki Kumahora
- 👤 Tsuneyuki Hashimoto
- 👤 Eiichi Nishimura
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 18:47
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/18
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
105 words
A measuring method for degree of vacuum in an electron microscope, wherein an electrode group consisting of an anode and cathodes provided on both sides of the anode is disposed at a portion where the degree of vacuum in the electron microscope is to be measured, comprising the steps of generating thermal electrons by colliding an electron beam with said cathodes, closing in the thermal electrons between said electrode group utilizing a magnetic field forming a lens system of said electron microscope, collecting a gas ionized by the thermal electrons closed therebetween and measuring an ionic current so as to obtain the degree of vacuum.
Claim 2
Dependent Claim
105 words
A measuring method for degree of vacuum in an electron microscope, wherein an electrode group consisting of an anode and cathodes provided on both sides of the anode is disposed at a portion where the degree of vacuum in the electron microscope is to be measured, comprising the steps of generating thermal electrons by colliding an electron beam with said cathodes, closing in the thermal electrons between said electrode group utilizing a magnetic field forming a lens system of said electron microscope, collecting a gas ionized by the thermal electrons closed therebetween and measuring an ionic current so as to obtain the degree of vacuum.
Claim 3
Dependent Claim
29 words
The measuring method for degree of vacuum in an electron microscope as defined in claim 1, wherein said electron beam is an observing electron beam of the electron microscope.
Claim 4
Dependent Claim
55 words
The measuring method for degree of vacuum in an electron microscope as defined in claim 2, further comprising the steps of disposing the anode between an objective lens pole piece and a sample specimen holder stage, and using said objective lens pole piece and sample specimen holder stage as the cathodes of said electrode group.
Claim 5
Dependent Claim
76 words
A measuring apparatus for degree of vacuum in an electron microscope, comprising an anode disposed at a portion where the degree of vacuum in the electron microscope is to be measured and cathodes provided on both sides of the anode, and means for generating thermal electrons by colliding an electron beam with said cathodes, means for collecting a gas ionized by said thermal electrons present between said anode and cathodes and for measuring an ionic current.
Claim 6
Dependent Claim
76 words
A measuring apparatus for degree of vacuum in an electron microscope, comprising an anode disposed at a portion where the degree of vacuum in the electron microscope is to be measured and cathodes provided on both sides of the anode, and means for generating thermal electrons by colliding an electron beam with said cathodes, means for collecting a gas ionized by said thermal electrons present between said anode and cathodes and for measuring an ionic current.
Claim 7
Dependent Claim
28 words
The measuring apparatus for degree of vacuum in an electron microscope as defined in claim 4, said electron beam is an observing electron beam of the electron microscope.
Claim 8
Dependent Claim
39 words
The measuring apparatus for degree of vacuum in an electron microscope as defined in claim 5, wherein said electrode group is installed at plural positions along a course of the electron beam so as to monitor the electron beam.
Claim 9
Dependent Claim
32 words
The measuring apparatus for degree of vacuum in an electron microscope as defined in claim 4, wherein said anode is structured cylindrically, said cathodes being installed at both ends of the cylinder.
Claim 10
Dependent Claim
70 words
An electron microscope comprising an electrode group of cathodes including an objective lens pole piece and a sample specimen holder stage of the electron microscope and an anode provided between said cathodes, and means for collecting a gas ionized by thermal electrons generated from colliding an observing electron beam of the electron microscope with said cathodes and thus present between said anode and cathodes and for measuring an ionic current.
Claim 11
Dependent Claim
70 words
An electron microscope comprising an electrode group of cathodes including an objective lens pole piece and a sample specimen holder stage of the electron microscope and an anode provided between said cathodes, and means for collecting a gas ionized by thermal electrons generated from colliding an observing electron beam of the electron microscope with said cathodes and thus present between said anode and cathodes and for measuring an ionic current.
Claim 12
Dependent Claim
22 words
The electron microscope as defined in claim 8, wherein the sample holder and the anode are unified in structure through an insulator.
Claim 13
Dependent Claim
24 words
The electron microscope as defined in claim 8, wherein said anode is structured cylindrically, said cathodes being installed at both ends of the cylinder.
References Cited (Backward Citations)
JPS60157149A
Cited
US4587433A
Cited
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1992-02-07 | 1992-08-08 | 1993-02-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-02-07 | 1996-08-08 | 1997-02-07 | $3760.00 | Window Closed / Lapsed |
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