Streak camera unit with elliptical deflection

Claim 2

A streak camera device for measuring a repetitive light beam comprising: a streak tube including photoelectron beam generating means responsive to the light beam, and first deflecting means for providing a first deflecting electric field in the direction of a first axis and second deflecting means for providing a second deflecting electric field in a second direction substantially perpendicular to said first axis and a photoelectron beam detecting means; DC voltage generating means for supplying operating voltages to said streak tube; trigger signal generating means for generating a trigger signal responsive to the light beam; and deflecting voltage generating means for applying to said first deflecting means and said second deflecting means in synchronization with said trigger signal, sine wave deflecting voltages whose frequencies are 1/n of the frequency of said trigger signal, where n is a positive integer, to cause an elliptical photoelectron beam sweep having a finite major axis extending in the direction of said first axis and a finite minor axis unequal in length to said major axis so that at least part of said photoelectron beam excites said detecting means.

Claim 3

The streak camera as claimed in claim 1, in which said streak tube comprises: a vaccum container; and a photocathode, a mesh electrode, a focus electrode, an anode having an opening, first and second deflection electrodes for sweeping said photoelectron beam respectively in directions which are perpendicular to each other, and a phosphor screen which are positioned in said vacuum container in the stated order.

Claim 4

The streak camera as claimed in claim 1, in which said deflecting voltage generating means includes means for applying sine wave voltages so that the length of said major axis is at least 1.5 times the effective length of said phosphor screen in the direction of said first axis.

Claim 5

The streak camera as claimed in claim 1, in which said deflecting voltage generating means comprises: a first deflecting voltage generating means for supplying a deflecting voltage to said first deflecting means and a second deflecting voltage generating means for supplying a deflecting voltage to said second deflecting means.

Claim 6

The streak camera as claimed in claim 4, in which said first deflecting voltage generating means comprises: a frequency divider for frequency-dividing an output signal of said trigger signal generating means, a delay circuit responsive to the output of said frequency divider, and sine wave generating means synchronous with the output of said delay circuit, the delay of said delay circuit being variable so that streak images corresponding to different parts of the light beam can be formed successively on said detecting means.

Claim 7

The streak camera as claimed in claim 4, in which said second deflecting voltage generating means comprises: means for generating a sine wave different in phase from the output voltage of said first deflecting voltage generating means in synchronization with the output voltage of said first deflecting voltage generating means; and a horizontal position adjusting circuit for superimposing a variable DC voltage on said sine wave.

Claim 8

The streak camera as claimed in claim 6, in which an output voltage of said horizontal position adjusting circuit causes one of the deflections by said first deflecting means to occur outside said phosphor screen.

Claim 9

A streak camera as claimed in claim 6, in which an output voltage of said horizontal position adjusting circuit is gradully increased so that, in response to repeated sweeps, streak images are formed at different positions on said detecting means.

Claim 10

A streak camera device for measuring a repetitive light beam comprising: a streak tube including a photocathode responsive to the light beam to produce a photoelectron beam, first deflection electrodes for providing a first deflecting electric field in the direction of a first axis and second deflection electrodes for providing a second deflecting electric field in a direction substantially perpendicular to said first axis, and a photoelectron beam detecting means; a spectroscope for dispersing the light beam in a direction perpendicular to said first axis as a function of wavelength so as to be applied to said photocathode of said streak tube; DC voltage generating means for supplying operating voltages to said streak tube; trigger signal generating means for generating a trigger signal responsive to the light beam; and deflecting voltage generating means for applying to said first deflection electrodes and said second deflection electrodes in synchronization with said trigger signal, sine wave deflecting voltages whose frequencies are 1/n of the frequency of said trigger signal, where n is a positive integer, to cause an elliptical photoelectron beam sweep having a finite major axis extending in the direction of a first axis and a finite minor axis unequal in length to said major axis so that at least part of said photoelectron beam directly excites said detecting means.

Claim 11

A streak camera device for measuring a repetitive light beam comprising: a streak tube including a photocathode responsive to the light beam to produce a photoelectron beam, first deflection electrodes for providing a first deflecting electric field in the direction of a first axis and second deflection electrodes for providing a second deflecting electric field in a direction substantially perpendicular to said first axis, and a photoelectron beam detecting means; a spectroscope for dispersing the light beam in a direction perpendicular to said first axis as a function of wavelength so as to be applied to said photocathode of said streak tube; DC voltage generating means for supplying operating voltages to said streak tube; trigger signal generating means for generating a trigger signal responsive to the light beam; and deflecting voltage generating means for applying to said first deflection electrodes and said second deflection electrodes in synchronization with said trigger signal, sine wave deflecting voltages whose frequencies are 1/n of the frequency of said trigger signal, where n is a positive integer, to cause an elliptical photoelectron beam sweep having a finite major axis extending in the direction of a first axis and a finite minor axis unequal in length to said major axis so that at least part of said photoelectron beam directly excites said detecting means.