Patent US4794019A successfully refreshed from Google Patents.
← Back to Patent Explorer
US4794019A Expired / Lapsed US ⏱️ 0.0 years remaining

Refractory metal deposition process

Assignee: Applied Materials Inc
•
Filing: 1987-10-22
•
Granted: 1988-12-27
•
Expires: 2007-10-22
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract Process for depositing tungsten or other refractory metals on semiconductor devices by a reaction of a gas containing the metal in a vapor deposition reactor. The reaction occurs at relatively low temperature (240°-400° C.) and pressure (0.1-10 torr), and the resulting film adheres differently to different substrate materials. Patterned coatings can be made without the patterning steps which are required with prior art techniques.

Inventors

  • 👤 Nicholas E. Miller

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 22:27
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; C; C23; C23C; C23C16/00; C23C16/04; C23C16/06; C23C16/08; H10P; H10P14/00; H10P14/40; H10P14/42; H10P14/43

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 90 words
In a process for selectively forming a refractory metal coating on a pattern metal in the presence of another material as an oxide, nitride or oxynitride on a semiconductor substrate, exposing both the pattern metal and the other material to a gas containing a fluoride of the refractory metal and a reducing agent at a temperature on the order of 220°-400° C. and a pressure on the order of 0.1-1.0 torr to deposit an adherent coating of the refractory metal on the pattern metal but not on the other material.
Claim 2
Dependent Claim 90 words
In a process for selectively forming a refractory metal coating on a pattern metal in the presence of another material as an oxide, nitride or oxynitride on a semiconductor substrate, exposing both the pattern metal and the other material to a gas containing a fluoride of the refractory metal and a reducing agent at a temperature on the order of 220°-400° C. and a pressure on the order of 0.1-1.0 torr to deposit an adherent coating of the refractory metal on the pattern metal but not on the other material.
Claim 3
Dependent Claim 22 words
The process of claim 1 wherein the gas comprises one part of the refractory metal fluoride and at least one part hydrogen.
Claim 4
Dependent Claim 19 words
The process of claim 2 wherein the temperature is maintained at a level on the order of 270°-330° C.
Claim 5
Dependent Claim 19 words
The process of claim 1 wherein the pressure is maintained at a level on the order of 0.5 torr.
Claim 6
Dependent Claim 11 words
The process of claim 1 wherein the pattern metal is aluminum.
Claim 7
Dependent Claim 13 words
The process of claim 1 wherein the pattern metal is a refractory metal.
Claim 8
Dependent Claim 12 words
The process of claim 1 wherein the refractory metal coating is tungsten.
Claim 9
Dependent Claim 92 words
In a process for selectively forming a tungsten metal coating on a pattern metal in the presence of another material such as an oxide, nitride or oxynitride on a semiconductor substrate, exposing both the pattern metal and the other material to a gas containing at least one part WF 6 and at least one part H 2 at a temperature on the order of 270°-330° C. and a pressure on the order of 0.1-1.0 torr to deposit an adherent coating of tungsten on the pattern metal but not on the other material.
Claim 10
Dependent Claim 92 words
In a process for selectively forming a tungsten metal coating on a pattern metal in the presence of another material such as an oxide, nitride or oxynitride on a semiconductor substrate, exposing both the pattern metal and the other material to a gas containing at least one part WF 6 and at least one part H 2 at a temperature on the order of 270°-330° C. and a pressure on the order of 0.1-1.0 torr to deposit an adherent coating of tungsten on the pattern metal but not on the other material.

References Cited (Backward Citations)

US3373018A Cited
US3519479A Cited
GB1330720A Cited
DE2718518A1 Cited
US4517225A Cited
JPH114350A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-12-27 1992-06-27 1992-12-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-12-27 1996-06-27 1996-12-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-12-27 2000-06-27 2000-12-27 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag