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US4792928A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor memory circuit with control of bit line voltage balancing

Assignee: Mitsubishi Electric Corp
•
Filing: 1987-02-25
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Granted: 1988-12-20
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Expires: 2007-02-25
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Abstract

Abstract A semiconductor memory circuit includes: a plurality of memory cell columns each comprising a plurality of memory cells connected to a bit line, at least a dummy cell connected to a bit line constituting a bit line pair with said bit line, a sense amplifier connected between said two bit lines, and at least a FET for balancing the voltages of said two bit lines; and a balance control circuit for detecting the termination of selection of a dummy word line which is provided for the control of the dummy cell and thereafter operating the FET.

Inventors

  • 👤 Youichi Tobita

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 08:36
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/34; G11C11/40; G11C11/401; G11C11/4063; G11C11/407; G11C11/409; G11C11/4099; G11C11/4076; G11C11/4094

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 263 words
A semiconductor memory circuit comprising: a plurality of bit lines extending in a first direction; a plurality of word lines extending in a second direction perpendicular to said first direction, said plurality of bit lines being arranged in pairs with each pair of bit lines forming a memory column of a first bit line and a second bit line, said plurality of bit line pairs forming a plurality of memory columns; a plurality of memory cells connected to either a first bit line or a second bit line of said memory columns, each of said plurality of word lines being connected to a first bit line memory cell or a second bit line memory cell in each of said plurality of memory columns; a plurality of dummy cells each connected to a first or second bit line of said memory columns; a first dummy word line connected to each first bit line dummy cell; a second dummy word line connected to each second bit line dummy cell; sense amplifier means, connected between each first bit line and second bit line, for sensing a voltage difference therebetween; FET means, connected between each first bit line and second bit line, for balancing voltages appearing thereon; selection means for selecting either said first or said second dummy word line for control of a specified dummy cell in each memory column; and balancing control means, operatively interconnected with said dummy word lines and said FET means, for detecting the termination of dummy word line selection by said selection means and activating said FET means in response thereto.
Claim 2
Dependent Claim 263 words
A semiconductor memory circuit comprising: a plurality of bit lines extending in a first direction; a plurality of word lines extending in a second direction perpendicular to said first direction, said plurality of bit lines being arranged in pairs with each pair of bit lines forming a memory column of a first bit line and a second bit line, said plurality of bit line pairs forming a plurality of memory columns; a plurality of memory cells connected to either a first bit line or a second bit line of said memory columns, each of said plurality of word lines being connected to a first bit line memory cell or a second bit line memory cell in each of said plurality of memory columns; a plurality of dummy cells each connected to a first or second bit line of said memory columns; a first dummy word line connected to each first bit line dummy cell; a second dummy word line connected to each second bit line dummy cell; sense amplifier means, connected between each first bit line and second bit line, for sensing a voltage difference therebetween; FET means, connected between each first bit line and second bit line, for balancing voltages appearing thereon; selection means for selecting either said first or said second dummy word line for control of a specified dummy cell in each memory column; and balancing control means, operatively interconnected with said dummy word lines and said FET means, for detecting the termination of dummy word line selection by said selection means and activating said FET means in response thereto.
Claim 3
Dependent Claim 88 words
A semiconductor memory circuit as defined in claim 1, wherein said balance control means comprises a first control circuit for detecting that a voltage at an end of a previously selected dummy word line is equal to a predetermined voltage and outputting a detection signal indicative thereof, a second control circuit for generating a control signal to halt the sensing operation of said sense amplifier means in response to said detection signal, and a third control circuit for operating said FET after said sensing operation has been halted.

References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-12-20 1992-06-20 1992-12-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-12-20 1996-06-20 1996-12-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-12-20 2000-06-20 2000-12-20 $7700.00 Window Closed / Lapsed

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