US4786614A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of fabricating a high voltage semiconductor device having a pair of V-shaped isolation grooves
Assignee: Vishay Siliconix Inc
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Filing: 1987-02-26
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Granted: 1988-11-22
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Expires: 2007-02-26
Abstract
Abstract A method of fabricating a semiconductor device capable of handling high voltages includes forming a relatively thick epitaxial layer the top surface of which defines a plurality of generally V-shaped grooves, a pair of the grooves having formed therebetween active device regions, such pair of grooves acting as isolation regions including impurity regions extending on both sides of the groove through the epitaxial layer to a lower layer. A pair of grooves formed inward of the first-mentioned grooves contact active regions of the device into which the V-shaped portions extend, again with each such V-shaped portion having impurity regions extending on both sides thereof. The impurity regions associated with the V-shaped grooves are formed simultaneously with other active regions of the device.
Inventors
- 👤 Adrian I. Cogan
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 18:39
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/20; H10W; H10W10/00; H10W10/01; H10W10/031; H10W10/30
Claims Analysis
Total Claims: 3
Claim 1
Independent Claim
249 words
A method of making a semiconductor device comprising: providing a first layer of semiconductor material of a first conductivity tape and having a planar surface; providing a second layer of a semiconductor material of a second conductivity type opposite the first conductivity type, and one which the first layer is disposed; providing a layer of oxide having a planar surface over said first layer of semiconductor material; forming first and second generally V-shaped grooves in said first layer through said planar oxide surface; masking a portion of the first layer including only one of the first and second generally V-shaped grooves; introducing an impurity into the first layer simultaneously at the unmasked generally V-shaped groove and at least one remaining unmasked portion of the surface of the first layer, the impurity being of the second conductivity type and extending to the second layer; removing said masking; masking a portion of the surface of the first layer including only the other of the generally V-shaped grooves; and introducing an impurity of said first conductivity type simultaneously into the first layer at the unmasked generally V-shaped groove and at least one remaining unmasked portion of the surface of the first layer, the masking being configured so that the impurities of said first and second conductivity types introduced into said remaining unmasked portions of the surface of the first layer define additional regions so that one additional region of first conductivity type is contained within another additional region of second conductivity type.
Claim 2
Independent Claim
249 words
A method of making a semiconductor device comprising: providing a first layer of semiconductor material of a first conductivity tape and having a planar surface; providing a second layer of a semiconductor material of a second conductivity type opposite the first conductivity type, and one which the first layer is disposed; providing a layer of oxide having a planar surface over said first layer of semiconductor material; forming first and second generally V-shaped grooves in said first layer through said planar oxide surface; masking a portion of the first layer including only one of the first and second generally V-shaped grooves; introducing an impurity into the first layer simultaneously at the unmasked generally V-shaped groove and at least one remaining unmasked portion of the surface of the first layer, the impurity being of the second conductivity type and extending to the second layer; removing said masking; masking a portion of the surface of the first layer including only the other of the generally V-shaped grooves; and introducing an impurity of said first conductivity type simultaneously into the first layer at the unmasked generally V-shaped groove and at least one remaining unmasked portion of the surface of the first layer, the masking being configured so that the impurities of said first and second conductivity types introduced into said remaining unmasked portions of the surface of the first layer define additional regions so that one additional region of first conductivity type is contained within another additional region of second conductivity type.
Claim 3
Dependent Claim
51 words
The method of claim 1 wherein the step of introducing impurity into the first layer at the unmasked generally V-shaped groove and at least one remaining unmasked portion of the first layer provides that the introduced impurity at the unmasked generally V-shaped groove is in spaced relation to the second layer.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-11-22 | 1992-05-23 | 1992-11-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-11-22 | 1996-05-23 | 1996-11-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-11-22 | 2000-05-23 | 2000-11-22 | $7700.00 | Window Closed / Lapsed |