Stroboscopic type potential measurement device

Claim 2

A stroboscopic type potential measurment device comprising: a charged particle beam projecting means for irradiating a sample with a charged particle pulsed beam synchronized with a periodically varying voltage in said sample; a phase shifter means for varying the phase of said charged particle pulsed beam with respect to said periodically varying voltage in said sample; and a potential measurement means for detecting secondary electrons emitted by said sample irradiated with said charged particle pulsed beam and for measuring a waveform of said periodically varying voltage at a location irradiated with said charged particle pulsed beam; whereby said potential measurement means regulates the phase of said charged particle pulsed beam with respect to the phase of said periodically varying voltage in said sample using said phase shifter means and effects at least two sorts of measurements having different phase division pitches, a measurement of siad potential being so effected that a measurement result is formed by correcting a measurement result obtained by using a fine phase division on the basis of a measurement obtained by using a coarse phase division.

Claim 3

A stroboscopic type potential measurement device according to claim 1, wherein said potential measurement means effects corrections of measurement results at certain points for the fine phase division, based on results at two points for said coarse phase division, which are adjacent to a relevant point for said fine phase division.

Claim 4

A stroboscopic type potential measurement device according to claim 1, wherein said potential measurement means effects corrections of measurement results at relevant points for said fine phase division based on a logarithmic approximation using measurement results for said coarse phase division.

Claim 5

A stroboscopic type potential measurement device comprising: a charged particle beam projecting means for irradiating a sample with a charged particle pulsed beam synchronized with a periodically varying voltage in said sample; a phase shifter means for varying the phase of said charged particle pulsed beam with respect to said periodically varying voltage in the sample; and a potential measurement means for detecting secondary electrons emitted by said sample irradiated with said charged particle pulsed beam and for measuring a waveform of said periodically varying voltage at a location irradiated with said charged particle pulsed beam; whereby said potential measurement means regulates the phase of said charged particle pulsed beam with respect to the phase of said periodically varying voltage in said sample using said phase shifter means and repeats a plurality of phase scannings, having a coarse phase division pitch, at different phases which are respectively shifted from a first phase scanning for interpolating an interval of said coarse phase division pitch of each of said phase scannings, a measurement being so effected that a measurement result is formed by combining measurement results of said phase scannings.

Claim 6

A stroboscopic type potential measurement device comprising: a charged particle beam projecting means for irradiating a sample with a charged particle pulsed beam synchronized with a periodically varying voltage in said sample; a phase shifter means for varying the phase of said charged particle pulsed beam with respect to said periodically varying voltage in the sample; and a potential measurement means for detecting secondary electrons emitted by said sample irradiated with said charged particle pulsed beam and for measuring a waveform of said periodically varying voltage at a location irradiated with said charged particle pulsed beam; whereby said potential measurement means regulates the phase of said charged particle pulsed beam with respect to the phase of said periodically varying voltage in said sample using said phase shifter means and repeats a plurality of phase scannings, having a coarse phase division pitch, at different phases which are respectively shifted from a first phase scanning for interpolating an interval of said coarse phase division pitch of each of said phase scannings, a measurement being so effected that a measurement result is formed by combining measurement results of said phase scannings.

Claim 7

A stroboscopic type potential measurement device according to claim 4, wherein said waveform of a periodically varying voltage is measured for a whole phase region by repeating said phase scanning having a coarse phase division pitch for every fine phase division pitch.