Fault detection and reset in surface reflectance meter

Claim 2

In a surface reflectance meter having a light source, a first optical system for directing light from the light source to a surface to be tested, a light detector means for detecting light intensity, a second optical system for directing light reflected from the surface to be tested to the light detector means, a light chopper means adapted to be interposed and then withdrawn from between the light source and the light detector means, and a flux rate detecting means connected to the light detector means for detecting a first intensity of reflected light and a second intensity of reflected light and measuring the interval therebetween so as to determine the rate of light intensity increase at the light detector means as the light chopper means is withdrawn from between the light source and the light detector means, the improvement comprising: a fault detection means connected to said flux rate detecting means for determining if the interval being measured by the flux rate detecting means exceeds a predetermined limit indicative of a fault in the flux rate detecting means that would prevent a proper measure of the rate of light intensity increase.

Claim 3

The surface reflectance meter as claimed in claim 1, further comprising: a reset means connected to the flux rate detecting means and said fault detection means for causing the surface reflectance meter to repeat a measurement by repeating detection of the rate of light intensity increase upon indication of a fault by said fault detection means.

Claim 4

The surface reflectance meter as claimed in claim 1, wherein: the flux rate detecting means detects the rate of light intensity increase by determining the length of time required for the light intensity detected by the light detector means to change from a first predetermined intensity level to a second predetermined intensity level higher than said first predetermined intensity level; and said fault detecting means detects and indicates a fault when said light intensity detected by said light detector means fails to reach said second predetermined intensity level in a predetermined period of time.

Claim 5

The surface reflectance meter as claimed in claim 1, further comprising: an interpretation means connected to said flux rate detecting means for converting said detected rate of light intensity increase into an indication of distinctness of image according to a predetermined distinctness of image scale.

Claim 6

A surface reflectance meter comprising: a light source; a first optical system for focusing said light source onto a surface to be tested; a light chopper means including at least one light chopper blade, said at least one light chopper blade periodically interposed and withdrawn from between said light source and the surface to be tested thereby causing a shadow of the edge of the blade to appear at the surface to be tested; a light detector means for detecting light intensity; a second optical system for directing light reflected from the surface to be tested to said light detector means, said second optical system including a narrow slot disposed between the surface to be tested and said light detector means, said narrow slot oriented in parallel with the shadow of the edge of the blade; a flux rate detecting means connected to said light detector means for detecting the length of time required for the light intensity detected by said light detecting means to change from a first predetermined intensity level to a second predetermined intensity level higher than said first predetermined intensity level as the shadow of the edge of the blade is withdrawn from said narrow slot; and a fault detection means connected to said flux rate detecting means for detecting and indicating a fault when said light intensity detected by said light detecting means fails to reach said second predetermined intensity level in a predetermined period of time.

Claim 7

A surface reflectance meter comprising: a light source; a first optical system for focusing said light source onto a surface to be tested; a light chopper means including at least one light chopper blade, said at least one light chopper blade periodically interposed and withdrawn from between said light source and the surface to be tested thereby causing a shadow of the edge of the blade to appear at the surface to be tested; a light detector means for detecting light intensity; a second optical system for directing light reflected from the surface to be tested to said light detector means, said second optical system including a narrow slot disposed between the surface to be tested and said light detector means, said narrow slot oriented in parallel with the shadow of the edge of the blade; a flux rate detecting means connected to said light detector means for detecting the length of time required for the light intensity detected by said light detecting means to change from a first predetermined intensity level to a second predetermined intensity level higher than said first predetermined intensity level as the shadow of the edge of the blade is withdrawn from said narrow slot; and a fault detection means connected to said flux rate detecting means for detecting and indicating a fault when said light intensity detected by said light detecting means fails to reach said second predetermined intensity level in a predetermined period of time.

Claim 8

The surface reflectance meter as claimed in claim 5, further comprising: a microprocessor system having a control program including a flux rate detecting program for detecting the length of time for the light intensity to change from said first predetermined intensity level to said second predetermined intensity level, whereby said flux rate detecting program as implemented by the microprocessor provides said flux rate detecting means.

Claim 9

The surface reflectance meter as claimed in claim 6, wherein: said microprocessor system further includes a lookup table relating the time for the light intensity to change from said first predetermined intensity level to said second predetermined intensity level to an indication of distinctness of image according to a predetermined distinctness of image scale; and said control program further includes an interpretation program for generating an indication of distinctness of image according to said predetermined scale by recalling the indication of distinctness of image corresponding to said detected time for the light intensity to change between said first predetermined intensity level to said second predetermined intensity level.

Claim 10

The surface reflectance meter as claimed in claim 7, wherein: said first predetermined intensity level is approximately one eigth of the expected maximum light intensity reflected from the surface; and said second predetermined intensity level is approximately seven eighths of the expected maximum light intensity reflected from the surface.

Claim 11

The surface reflectance meter as claimed in claim 6, wherein: said control program of said microprocessor system is further adapted to regularly signal a light source; and said fault detection means is connected to said microprocessor system and said light source so as to reset said microprocessor system if said microprocessor system fails to signal said light source after said predetermined period of time.

Claim 12

The surface reflectance meter as claimed in claim 6, wherein: said control program further includes a fault detection program whereby said fault detection program as implemented by the control program of the microprocessor provides said fault detection means and functions to restart a measurement of flux rate if said predetermined period of time has elapsed since said light intensity has passed said first predetermined intensity level without passing said second predetermined intensity level.