Patent US4758745B1 successfully refreshed from Google Patents.
US4758745B1
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User programmable integrated circuit interconnect architecture and test method
Assignee: Microsemi SoC Corp
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Filing: 1986-09-19
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Granted: 1994-11-15
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Expires: 2006-09-19
Abstract
No abstract record available.
Inventors
- 👤 Abbas Elgamal
- 👤 Khaled A El-Ayat
- 👤 Amr Mohsen
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 20:48
CPC Classifications
H; H03; H03K; H03K19/00; H03K19/02; H03K19/173; H03K19/177; H03K19/17748; G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3185; G01R31/318516; H03K19/17704; H03K19/17724; H03K19/17728; H03K19/17736; H03K19/1778; H03K19/17796
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-11-14 | 1998-05-16 | 1998-11-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-11-14 | 2002-05-16 | 2002-11-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-11-14 | 2006-05-16 | 2006-11-15 | $7700.00 | Window Closed / Lapsed |