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US4755747A Expired / Lapsed US ⏱️ 0.0 years remaining

Wafer prober and a probe card to be used therewith

Assignee: Canon Inc
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Filing: 1985-06-12
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Granted: 1988-07-05
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Expires: 2005-06-12
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Abstract

Abstract A probing apparatus for use in examination of a chip formed on a wafer, the probing apparatus including a holder for holding the wafer, a support for supporting a sheet-like member having a probe to be contacted to the chip on the wafer, a driving unit for displacing the wafer relative to the sheet-like member, and a detecting system for reading a record carried on the sheet-like member. In another aspect of the invention, there is provided a probe card for use in examination of a tip formed on a wafer, the probe card including a flat plate member having an aperture, a plurality of fine conductive members each extending from a peripheral portion of the flat plate member around the aperture toward a central portion of the aperture, each of the fine conductive members having a free end extending beyond one of the surfaces of the flat plate member, and a record carried on the flat plate member and capable of being sensed from a sensor disposed opposed to the one surface.

Inventors

  • 👤 Mitsuya Sato

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 23:10
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/04; G01R31/00; G01R31/28; G01R31/2851; G01R31/2886

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 176 words
A probing apparatus for use in the probing of chips formed on a wafer, said apparatus comprising: a movable stage for holding the wafer; means for holding a sheet-like member having a probe adapted, as said sheet-like member is held by said stage, to contact a chip on the wafer when said chip is placed at a probing position, wherein said sheet-like member includes a portion bearing information recorded thereon and related to the probing of said chips on the wafer; driving means for moving said movable stage so that said chips on the wafer held by said movable stage are moved in sequence to said probing position; reading means provided on said movable stage and movable with said movable stage, for reading said information recorded on said sheet-like member; and control means operable to control said driving means to cause said driving means to move said movable stage so that said reading means is moved to a position where said reading means reads said information recorded on said sheet-like member held by said movable stage.
Claim 2
Dependent Claim 176 words
A probing apparatus for use in the probing of chips formed on a wafer, said apparatus comprising: a movable stage for holding the wafer; means for holding a sheet-like member having a probe adapted, as said sheet-like member is held by said stage, to contact a chip on the wafer when said chip is placed at a probing position, wherein said sheet-like member includes a portion bearing information recorded thereon and related to the probing of said chips on the wafer; driving means for moving said movable stage so that said chips on the wafer held by said movable stage are moved in sequence to said probing position; reading means provided on said movable stage and movable with said movable stage, for reading said information recorded on said sheet-like member; and control means operable to control said driving means to cause said driving means to move said movable stage so that said reading means is moved to a position where said reading means reads said information recorded on said sheet-like member held by said movable stage.
Claim 3
Dependent Claim 35 words
An apparatus according to claim 1, wherein the recorded information on the sheet-like member includes a bar code sign and wherein said reading means includes an optical sensor capable of reading the bar code sign.
Claim 4
Dependent Claim 56 words
An apparatus according to claim 1, wherein said sheet-like member further comprises a magnetic portion, wherein the recorded information on the sheet-like member is contained in said magnetic portion of the sheet-like member and wherein said reading means includes a magnetic head for reading the recorded information contained in the magnetic portion of said sheet-like member.
Claim 5
Dependent Claim 54 words
An apparatus according to claim 1, wherein said recorded information relates to information for positioning said sheet-like member, wherein said information recorded on the sheet-like member includes an alignment mark and wherein said reading means includes an optical sensor for reading the alignment mark, whereby said sensor detects positional information on the sheet-like member.
Claim 6
Dependent Claim 37 words
An apparatus according to claim 4, wherein said recorded information on the sheet-like member includes a bar code sign and wherein said optical sensor of said reading means is also adapted to read the bar code sign.
Claim 7
Dependent Claim 38 words
An apparatus according to claim 1, wherein said control means is operable to control said driving means to move said movable stage so that said reading means scans and thereby reads said recorded information on said sheet-like member.

References Cited (Backward Citations)

US3405361A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-07-05 1992-01-04 1992-07-05 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-07-05 1996-01-04 1996-07-05 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-07-05 2000-01-04 2000-07-05 $7700.00 Window Closed / Lapsed

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