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US4752709A Expired / Lapsed US ⏱️ 0.0 years remaining

Surface acoustic wave device

Assignee: Murata Manufacturing Co Ltd
•
Filing: 1987-01-29
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Granted: 1988-06-21
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Expires: 2007-01-29
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Abstract

Abstract A surface acoustic wave device comprising a surface acoustic wave substrate member composed by forming an aluminum oxide film and a thin zinc oxide film successively on a glass substrate. The thickness h 1 of the aluminum oxide film and the thickness h 2 of the zinc oxide film are set within ranges of 0.1≦h 1 /λ≦10 and 0.05≦h 2 /λ≦0.35 (where λ is representative of wavelength of Sezawa wave) respectively, thereby to utilize Sezawa wave or a similar mode wave transmitted on the surface acoustic wave substrate member in multi-layer structure.

Inventors

  • 👤 Satoru Fujishima
  • 👤 Hideharu Ieki

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 09:22
CPC Classifications
H; H03; H03H; H03H9/00; H03H9/02; H03H9/02535; H03H9/02543; H03H9/02574; H03H9/125; H03H9/145; H03H9/14517; H03H9/1452

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 145 words
A surface acoustic wave device comprising: a glass substrate; an oxide film formed on said substrate; and a piezoelectric thin film formed on the oxide film; a thickness h 1 of said oxide film and thickness h 2 of said piezoelectric thin film being set within ranges of 0.1≦h 1 /λ≦10 and 0.05≦h 2 /λ≦0.35 respectively, thereby to utilize Sezawa wave transmitted on said surface acoustic wave device in said multi-layer structure, wherein λ is representative of wavelength of said Sezawa wave; and further comprising at least one interdigital transducer formed on a surface of said piezoelectric film, for receiving a signal and generating a surface acoustic wave in said device in response to said signal; wherein said oxide film comprises a thin film of aluminum oxide (Al 2 O 3 ), and said piezoelectric thin film comprises a thin film of zinc oxide (ZnO).
Claim 2
Dependent Claim 145 words
A surface acoustic wave device comprising: a glass substrate; an oxide film formed on said substrate; and a piezoelectric thin film formed on the oxide film; a thickness h 1 of said oxide film and thickness h 2 of said piezoelectric thin film being set within ranges of 0.1≦h 1 /λ≦10 and 0.05≦h 2 /λ≦0.35 respectively, thereby to utilize Sezawa wave transmitted on said surface acoustic wave device in said multi-layer structure, wherein λ is representative of wavelength of said Sezawa wave; and further comprising at least one interdigital transducer formed on a surface of said piezoelectric film, for receiving a signal and generating a surface acoustic wave in said device in response to said signal; wherein said oxide film comprises a thin film of aluminum oxide (Al 2 O 3 ), and said piezoelectric thin film comprises a thin film of zinc oxide (ZnO).

References Cited (Backward Citations)

US3559115A Cited
US3550045A Cited
US4025954A Cited
US4037176A Cited
US4322651A Cited
US4193045A Cited
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US4354130A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-06-21 1991-12-21 1992-06-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-06-21 1995-12-21 1996-06-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-06-21 1999-12-21 2000-06-21 $7700.00 Window Closed / Lapsed

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