US4750183A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor laser device
Assignee: Sharp Corp
•
Filing: 1987-02-18
•
Granted: 1988-06-07
•
Expires: 2007-02-18
Abstract
Abstract An active layer for laser oscillation and optical guiding layers for guiding laser light sandwiching the active layer therebetween are included in the device. At least one of the optical guiding layers is formed by a superlattice, the optical refractive index of which is lower than that of the active layer. Further, the optical refractive index is gradually decreased in the direction from the portion of the optical guiding layer adjacent to the active layer, to the outside of the optical guiding layer.
Inventors
- 👤 Kohsei Takahashi
- 👤 Toshiro Hayakawa
- 👤 Takahiro Suyama
- 👤 Masafumi Kondo
- 👤 Saburo Yamamoto
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 10:33
CPC Classifications
H; H01; H01S; H01S5/00; H01S5/30; H01S5/34; H01S5/343; H01S5/34313; B; B82; B82Y; B82Y20/00; H01S5/20; H01S5/2004; H01S5/22; H01S5/3409; H01S5/3432
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
250 words
In a semiconductor laser device comprising an active layer for laser oscillation and optical guiding layers for guiding laser light sandwiching said active layer therebetween, at least one of said optical guiding layers being formed by a superlattice, the optical refractive index of which is lower than that of the active layer and is gradually decreased in the direction from the portion of said optical guiding layer adjacent to the active layer to the outside of said optical guiding layer, said superlatticed optical guiding layer being composed of alternate layers consisting of a plurality of Al x Ga 1-x As layers, the thickness of each of which is L B , and a plurality of Al y Ga 1-y As layers (1≧x>y≧0), the thickness of each of which is L z , the layer thicknesses L B and L Z , respectively, are equal to or less than the mean free-path of the carrier, and said optical refractive index of the superlatticed optical guiding layer being determined depending upon the average AlAs mole fraction x eff in the Al x Ga 1-x As and Al.sub. y Ga 1-y As mixed crystals of each of the alternate layers constituting the superlatticed optical guiding layer that is represented by the formula: x eff =(L B 'x+L Z 'y)/(L B +L Z ), whereby said gradual decrease in the optical refractive index of the superlatticed optical guiding layer is achieved by gradual changes in the layer thicknesses L B and L Z .
Claim 2
Dependent Claim
250 words
In a semiconductor laser device comprising an active layer for laser oscillation and optical guiding layers for guiding laser light sandwiching said active layer therebetween, at least one of said optical guiding layers being formed by a superlattice, the optical refractive index of which is lower than that of the active layer and is gradually decreased in the direction from the portion of said optical guiding layer adjacent to the active layer to the outside of said optical guiding layer, said superlatticed optical guiding layer being composed of alternate layers consisting of a plurality of Al x Ga 1-x As layers, the thickness of each of which is L B , and a plurality of Al y Ga 1-y As layers (1≧x>y≧0), the thickness of each of which is L z , the layer thicknesses L B and L Z , respectively, are equal to or less than the mean free-path of the carrier, and said optical refractive index of the superlatticed optical guiding layer being determined depending upon the average AlAs mole fraction x eff in the Al x Ga 1-x As and Al.sub. y Ga 1-y As mixed crystals of each of the alternate layers constituting the superlatticed optical guiding layer that is represented by the formula: x eff =(L B 'x+L Z 'y)/(L B +L Z ), whereby said gradual decrease in the optical refractive index of the superlatticed optical guiding layer is achieved by gradual changes in the layer thicknesses L B and L Z .
Claim 3
Dependent Claim
168 words
A semiconductor laser device according to claim 1, wherein said superlatticed optical guiding layer comprises the portion having the value of x eff which is equal to the AlAs mole fraction in an AlGaAs mixed crystal in the indirect transition region where the band energy at the X point of the conduction-band of the AlGaAs mixed crystal is lower than that at the Γ point of the conduction-band of the AlGaAs mixed crystal, and moreover the layer thickness L B of the portion of the superlatticed optical guiding layer having a greater value of x eff is smaller than that of the portion of the superlatticed optical guiding layer having a smaller value of x eff , whereby the quantum level at the X point of the lower edge of the conduction-band of said portion having the greater value of x eff becomes higher than that at the X point of the lower edge of the conduction-band of said portion having the smaller value of x eff .
Claim 4
Dependent Claim
57 words
A semiconductor laser device according to claim 2, wherein the quantum level at the X point of the lower edge of the conduction-band of at least the portion of said superlatticed optical guiding layer having the greatest value of x eff is lower than that at the Γ point of the lower edge of the conduction-band thereof.
References Cited (Backward Citations)
US4328469A
Cited
GB2131610A
Cited
JPS60145686A
Cited
JPS60145687A
Cited
GB2170044A
Cited
GB2182492A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-06-07 | 1991-12-07 | 1992-06-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-06-07 | 1995-12-07 | 1996-06-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-06-07 | 1999-12-07 | 2000-06-07 | $7700.00 | Window Closed / Lapsed |