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US4746549A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for forming thin film of refractory material

Assignee: Toshiba Corp
•
Filing: 1987-01-15
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Granted: 1988-05-24
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Expires: 2007-01-15
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Abstract

Abstract In a method for forming a thin film of a refractory metal on a substrate having a silicon layer and an insulating layer on a surface thereof, a halogen compound of the refractory metal is mixed with hydrogen gas for providing a material gas, hydrogen halide gas or a halogen gas consisting of a second halogen less electronegative than the first halogen forming the halogen compound of the refractory metal is added to the material gas, and by use of the thus obtained mixed gas, vapor phase deposition refractory metal is effected selectively on the surface of the silicon layer of the substrate.

Inventors

  • 👤 Hitoshi Ito
  • 👤 Takahiko Moriya

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 03:25
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/40; H10P14/42; H10P14/43; H10P14/432; C; C23; C23C; C23C16/00; C23C16/04; C23C16/06; C23C16/08; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/056; H10W20/057

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 129 words
A method for selectively forming a thin film of a refractory metal on a silicon surface partially covered with an insulating layer having an opening, comprising the steps of: (a) depositing selectively a refractory metal layer on said silicon surface according to selective vapor phase deposition by using a mixed gas comprising: (i) a halogen compound of a refractory metal, (ii) a hydrogen gas, and (iii) one of a halide gas and a halogen gas, the halogen element constituting the halide gas (a)(iii) or the halogen gas (a)(iii) being less electro-negative than the halogen constituting said halogen compound (a)(i) of said refractory metal, and (b) selectively forming said thin film in said opening by a chemical reaction of the silicon surface with said halogen compound of said refractory metal.
Claim 2
Independent Claim 129 words
A method for selectively forming a thin film of a refractory metal on a silicon surface partially covered with an insulating layer having an opening, comprising the steps of: (a) depositing selectively a refractory metal layer on said silicon surface according to selective vapor phase deposition by using a mixed gas comprising: (i) a halogen compound of a refractory metal, (ii) a hydrogen gas, and (iii) one of a halide gas and a halogen gas, the halogen element constituting the halide gas (a)(iii) or the halogen gas (a)(iii) being less electro-negative than the halogen constituting said halogen compound (a)(i) of said refractory metal, and (b) selectively forming said thin film in said opening by a chemical reaction of the silicon surface with said halogen compound of said refractory metal.
Claim 3
Dependent Claim 50 words
A method according to claim 1 wherein said halogen compound of said refractory metal is tungsten hexafluoride, and said halogen gas or halide gas is either one of chlorine (Cl 2 ), bromine (Br 2 ), iodine (I 2 ), hydrogen chloride (HCl), hydrogen bromide (HBr) and hydrogen iodide (HI).
Claim 4
Dependent Claim 46 words
A method according to claim 1 wherein said halogen compound of said refractory metal is tungsten hexachloride (WCl 6 ) and said halogen gas or halide gas is either one of bromine (Br 2 ), iodine (I 2 ), hydrogen bromide (HBr) and hydrogen iodide (HI).
Claim 5
Dependent Claim 46 words
A method according to claim 1 wherein said halogen compound of said refractory metal is molybdenum pentachloride (MoCl 5 ), and said halogen gas or halide gas is either one of bromine (Br 2 ), iodine (I 2 ), hydrogen bromide (HBr) and hydrogen iodide (HI).

References Cited (Backward Citations)

US2885310A Cited
US3442690A Cited
US3543386A Cited
US3477872A Cited
US3565676A Cited
US3697343A Cited
US4357365A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-05-24 1991-11-23 1992-05-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-05-24 1995-11-23 1996-05-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-05-24 1999-11-23 2000-05-24 $7700.00 Window Closed / Lapsed

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