Patent US4744662A successfully refreshed from Google Patents.
US4744662A
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Apparatus for measuring dimensions of micropattern
Assignee: Nikon Corp
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Filing: 1986-07-02
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Granted: 1988-05-17
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Expires: 2006-07-02
Abstract
Abstract An apparatus for measuring dimensions of a micropattern has a photoelectric sensor for scanning an enlarged image of a pattern and detects the positions of the leading and trailing edges by use of a predetermined slice level from a photoelectric signal which is derived by this sensor, thereby detecting the interval between those edges. The slice level is corrected in accordance with the interval between the edges to be measured. An amount of correction is stored as a predetermined table. A determination is made by an interval discriminating section to see if the correction needs to be performed or not.
Inventors
- 👤 Takeshi Suto
- 👤 Masato Kumazawa
- 👤 Tatsumi Ishizeki
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 16:22
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/70; G03F7/70483; G01; G01B; G01B11/00; G01B11/02
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
94 words
An apparatus for measuring size of a microelement constituting a pattern comprising: means for irradiating energy to said pattern to form an energy intensity distribution corresponding to said pattern; means for generating a photoelectric signal corresponding to said energy intensity distribution in such a direction as to cross at least two edges of said microelement; means for comparing the level of said photoelectric signal with a predetermined slice level to determine a distance between said two edges; and means for changing said predetermined slice level when said distance is smaller than a predetermined value.
Claim 2
Independent Claim
94 words
An apparatus for measuring size of a microelement constituting a pattern comprising: means for irradiating energy to said pattern to form an energy intensity distribution corresponding to said pattern; means for generating a photoelectric signal corresponding to said energy intensity distribution in such a direction as to cross at least two edges of said microelement; means for comparing the level of said photoelectric signal with a predetermined slice level to determine a distance between said two edges; and means for changing said predetermined slice level when said distance is smaller than a predetermined value.
Claim 3
Dependent Claim
35 words
A measuring apparatus according to claim 1, wherein said changing means includes means for deciding the necessity of correction of said predetermined slice level on the basis of said determined distance between said two edges.
Claim 4
Dependent Claim
56 words
A measuring apparatus according to claim 1, wherein said changing means includes: means for setting another slice level which is determined on the basis of the distance between said two edges; and means for comparing the level of said photoelectric signal with said another slice level and thereby determining a corrected distance between said two edges.
Claim 5
Dependent Claim
44 words
A measuring apparatus according to claim 3, wherein said changing means further includes means for discriminating whether the difference between the distance determined due to the comparison with said predetermined slice level and said corrected distance lies within a predetermined allowable range or not.
Claim 6
Dependent Claim
35 words
A measuring apparatus according to claim 1, wherein said comparing means compares the level of said photoelectric signal with the slice level changed by said changing means to re-determine the distance between said two edges.
Claim 7
Dependent Claim
35 words
A measuring apparatus according to claim 1, wherein said irradiating means includes means for supplying a light beam to irradiate said pattern and an image forming optical system to form an image of said pattern.
Claim 8
Dependent Claim
30 words
A measuring apparatus according to claim 6, wherein said photoelectric signal generating means includes means for photoelectrically scanning the image of said pattern and thereby generating a time-sequential photoelectric output.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-05-17 | 1991-11-16 | 1992-05-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-05-17 | 1995-11-16 | 1996-05-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-05-17 | 1999-11-16 | 2000-05-17 | $7700.00 | Window Closed / Lapsed |