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US4743951A Expired / Lapsed US ⏱️ 0.0 years remaining

Field effect transistor

Assignee: International Business Machines Corp
•
Filing: 1982-03-08
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Granted: 1988-05-10
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Expires: 2002-03-08
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Abstract

Abstract The mobility of carriers in the channel region of a field effect transistor can be increased by providing a layered structure wherein electrons are separated from impurities. The channel is made up of external layers of wide bandgap material and internal layers with a narrower bandgap where the bottom of the conduction band of one layer is below the top of the valence band of the adjacent layer. A structure is shown with a layered channel having AlSb external layers and at least one or both of InAs and GaSb internal layers.

Inventors

  • 👤 Chin-An Chang
  • 👤 Leroy L. Chang
  • 👤 Leo Esaki
  • 👤 Emilio E. Mendez

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 00:51
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/40; H10D30/47; H10D30/471; H10D30/473; H10D30/4732

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 77 words
In a field effect transistor of the type wherein current in a channel is influenced by a signal applied to a gate eletrode positioned on each side of said channel, the improvement comprising a multilayer epitaxial channel region between said gate electrodes wherein the layer adjacent said gate electrodes is of the material AlSb and the central conductive portion of said channel being of a material taken from the group of InAs and GaSb and their alloys.
Claim 2
Dependent Claim 77 words
In a field effect transistor of the type wherein current in a channel is influenced by a signal applied to a gate eletrode positioned on each side of said channel, the improvement comprising a multilayer epitaxial channel region between said gate electrodes wherein the layer adjacent said gate electrodes is of the material AlSb and the central conductive portion of said channel being of a material taken from the group of InAs and GaSb and their alloys.
Claim 3
Dependent Claim 78 words
A field effect transistor having a source and a drain electrode separated by a monocrystalline channel region, said channel region having first and second external layers of AlSb material extending from said source to said drain, first and second gate electrodes each essentially covering the exposed surface of said first and second external layers respectively, said channel region having a conductive region of one material taken from the group of InAs and GaSb epitaxial with said external regions.
Claim 4
Dependent Claim 78 words
A field effect transistor having a source and a drain electrode separated by a monocrystalline channel region, said channel region having first and second external layers of AlSb material extending from said source to said drain, first and second gate electrodes each essentially covering the exposed surface of said first and second external layers respectively, said channel region having a conductive region of one material taken from the group of InAs and GaSb epitaxial with said external regions.

References Cited (Backward Citations)

US4173763A Cited
US4163237A Cited
US4236165A Cited
US4250515A Cited
US4236166A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-05-10 1991-11-09 1992-05-10 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-05-10 1995-11-09 1996-05-10 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-05-10 1999-11-09 2000-05-10 $7700.00 Window Closed / Lapsed

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